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Mathematical Models for Systems Reliability [Kõva köide]

  • Formaat: Hardback, 268 pages, kõrgus x laius: 234x156 mm, kaal: 521 g
  • Ilmumisaeg: 09-May-2008
  • Kirjastus: Chapman & Hall/CRC
  • ISBN-10: 1420080822
  • ISBN-13: 9781420080827
  • Formaat: Hardback, 268 pages, kõrgus x laius: 234x156 mm, kaal: 521 g
  • Ilmumisaeg: 09-May-2008
  • Kirjastus: Chapman & Hall/CRC
  • ISBN-10: 1420080822
  • ISBN-13: 9781420080827
Evolved from the lectures of a recognized pioneer in developing the theory of reliability, Mathematical Models for Systems Reliability provides a rigorous treatment of the required probability background for understanding reliability theory.

This classroom-tested text begins by discussing the Poisson process and its associated probability laws. It then uses a number of stochastic models to provide a framework for life length distributions and presents formal rules for computing the reliability of nonrepairable systems that possess commonly occurring structures. The next two chapters explore the stochastic behavior over time of one- and two-unit repairable systems. After covering general continuous-time Markov chains, pure birth and death processes, and transitions and rates diagrams, the authors consider first passage-time problems in the context of systems reliability. The final chapters show how certain techniques can be applied to a variety of reliability problems.

Illustrating the models and methods with a host of examples, this book offers a sound introduction to mathematical probabilistic models and lucidly explores how they are used in systems reliability problems.

Arvustused

... The material presented in the book is classic material, but is also timeless because the basic theory, probability and statistical rigor and applications to system reliability are still relevant today and important for any student or practitioner of reliability theory. ... This book has a very good set of problems, exercises and comments on how to solve these problems for every chapter. These problems are excellent if one wants to use this book as a textbook. ... The rigor and mathematical development in the book is excellent. This book is also a good reference book in the field of reliability theory for researchers ... . -Journal of Quality Technology, Vol. 41, No. 2, April 2009

Preliminaries
1(38)
The Poisson process and distribution
1(5)
Waiting time distributions for a Poisson process
6(2)
Statistical estimation theory
8(10)
Basic ingredients
8(1)
Methods of estimation
9(2)
Consistency
11(1)
Sufficiency
12(1)
Rao-Blackwell improved estimator
13(1)
Complete statistic
14(1)
Confidence intervals
14(2)
Order statistics
16(2)
Generating a Poisson process
18(1)
Nonhomogeneous Poisson process
19(3)
Three important discrete distributions
22(2)
Problems and comments
24(15)
Statistical life length distributions
39(24)
Stochastic life length models
39(6)
Constant risk Parameters
39(2)
Time-dependent risk parameters
41(1)
Generalizations
42(3)
Models based on the hazard rate
45(5)
IFR and DFR
48(2)
General remarks on large systems
50(3)
Problems and comments
53(10)
Reliability of various arrangements of units
63(28)
Series and parallel arrangements
63(4)
Series systems
63(1)
Parallel systems
64(2)
The k out of n system
66(1)
Series-parallel and parallel-series systems
67(3)
Various arrangements of switches
70(6)
Series arrangement
71(1)
Parallel arrangement
72(1)
Series-parallel arrangement
72(1)
Parallel-series arrangement
72(1)
Simplifications
73(1)
Example
74(2)
Standby redundancy
76(1)
Problems and comments
77(14)
Reliability of a one-unit repairable system
91(10)
Exponential times to failure and repair
91(6)
Generalizations
97(1)
Problems and comments
98(3)
Reliability of a two-unit repairable system
101(16)
Steady-state analysis
101(4)
Time-dependent analysis via Laplace transform
105(8)
Laplace transform method
105(6)
A numerical example
111(2)
On Model 2(c)
113(1)
Problems and Comments
114(3)
Continuous-time Markov chains
117(26)
The general case
117(11)
Definition and notation
117(2)
The transition probabilities
119(1)
Computation of the matrix P(t)
120(2)
A numerical example (continued)
122(4)
Multiplicity of roots
126(1)
Steady-state analysis
127(1)
Reliability of three-unit repairable systems
128(2)
Steady-state analysis
128(2)
Steady-state results for the n-unit repairable system
130(3)
Example 1---Case 3(e)
131(1)
Example 2
131(1)
Example 3
131(1)
Example 4
132(1)
Pure birth and death processes
133(2)
Example 1
133(1)
Example 2
133(1)
Example 3
134(1)
Example 4
134(1)
Some statistical considerations
135(3)
Estimating the rates
136(1)
Estimation in a parametric structure
137(1)
Problems and comments
138(5)
First passage time for systems reliability
143(30)
Two-unit repairable systems
143(7)
Case 2(a) of Section 5.1
143(5)
Case 2(b) of Section 5.1
148(2)
Repairable systems with three (or more) units
150(10)
Three units
150(2)
Mean first passage times
152(2)
Other initial states
154(3)
Examples
157(3)
Repair time follows a general distribution
160(7)
First passage time
160(4)
Examples
164(1)
Steady-state probabilities
165(2)
Problems and comments
167(6)
Embedded Markov chains and systems reliability
173(34)
Computations of steady-state probabilities
173(21)
One-unit repairable system
174(1)
Two-unit repairable system
175(2)
n-unit repairable system
177(6)
One out of n repairable systems
183(1)
Periodic maintenance
184(5)
Section 7.3 revisited
189(3)
One-unit repairable system with prescribed on-off cycle
192(2)
Mean first passage times
194(6)
A two-unit repairable system
194(1)
General repair distribution
195(1)
Three-unit repairable system
195(2)
Computations based on Sjk
197(3)
Problems and comments
200(7)
Integral equations in reliability theory
207(40)
Introduction
207(1)
Renewal process
208(5)
Some basic facts
208(2)
Some asymptotic results
210(2)
More basic facts
212(1)
One-unit repairable system
213(2)
Preventive replacements or maintenance
215(3)
Two-unit repairable system
218(1)
One out of n repairable systems
219(1)
Section 7.3 revisited
220(3)
First passage time distribution
223(1)
Problems and comments
224(23)
References 247(4)
Index 251
Epstein, Benjamin; Weissman, Ishay