Integrated computational materials engineering (ICME) is a specialty within material science and engineering, and the 15 papers here explore some of its constituent parts. The topics include the four foundational groups required for a successful ICME approach, developing and implementing ICME for aerospace applications, standards-compliant formats for materials test data, managing multi-scale material data for access within ICME environments, the multiscale modeling of aluminum oxynitride, a generalized framework for quantifying material structure-property relationship and uncertainties, and multiscale modeling applied to non-linear constitutive equations. Annotation ©2011 Book News, Inc., Portland, OR (booknews.com)
The sixth edition of this reference work on microelectronics failure analysis has been updated to reflect the changes of the work in the field as well as current opportunities and challenges. In its life cycle, the reference has been used variously as a textbook, workbook, and laboratory manual. The discussions are grouped by sections, which include an introduction, failure analysis process overviews, failure analysis topics, fault verification and classification, localization techniques, deprocessing and sample preparation, materials analysis, inspection, focused ion beam applications, and management and reference information. A CD-ROM is included. Editor is Ross (IBM Systems and Technology Group). Annotation ©2012 Book News, Inc., Portland, OR (booknews.com)
