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Nyquist AD Converters, Sensor Interfaces, and Robustness: Advances in Analog Circuit Design, 2012 2013 ed. [Pehme köide]

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  • Formaat: Paperback / softback, 294 pages, kõrgus x laius: 235x155 mm, kaal: 4628 g, X, 294 p., 1 Paperback / softback
  • Ilmumisaeg: 13-Dec-2014
  • Kirjastus: Springer-Verlag New York Inc.
  • ISBN-10: 1489997946
  • ISBN-13: 9781489997944
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Nyquist AD Converters, Sensor Interfaces, and Robustness: Advances in Analog Circuit Design, 2012 2013 ed.Suurem pilt
  • Formaat: Paperback / softback, 294 pages, kõrgus x laius: 235x155 mm, kaal: 4628 g, X, 294 p., 1 Paperback / softback
  • Ilmumisaeg: 13-Dec-2014
  • Kirjastus: Springer-Verlag New York Inc.
  • ISBN-10: 1489997946
  • ISBN-13: 9781489997944
Teised raamatud teemal:
Püsilink: https://www.kriso.ee/db/9781489997944.html
Märksõnad:
This book is based on the 18 presentations during the 21st workshop on Advances in Analog Circuit Design. Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity. This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. Written by experts in industry and academia, this collection of tutorials, originally presented to the 21st workshop on Advances in Analog Circuit Design, covers Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.

Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuits for MEMS Microphones.- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments.- Part III: Robustness.- How Can Chips Live Under Radiation?.- TDC and Rad Environments.- Matching and Resolution.- Matching in Polymer and Effect on Circuit Topologies.- Statistical Variability and Reliability in Nano-CMOS Transistors.