Conference Committee xiii Introduction xv SECTION A ABSORPTION AND REFLECTION METHODS Monitoring the aging of high-power laser diode arrays (Invited Paper) (3359-01) 2(12) J. W. Tomm A. Barwolff C. Lienau A. Richter A. Jaeger J. Donecker A. Gerhardt F. X. Daiminger S. Heinemann Femtosecond evolution of semiconductor microcavity modes (Invited Paper) (3359-02) 14(5) E. A. Vinogradov A. L. Dobryakov V. M. Farztdinov Yu. E. Lozovik S. A. Kovalenko Yu. A. Matveets Optical characterization of Fe- and Cu-doped SiO2 glasses prepared by the sol-gel method (3359-03) 19(8) J. F. Perez-Robles F. J. G. Rodriguez J. Gonzalez-Hernandez S. Jimenez-Sandoval Yu. V. Vorobiev A. Manzano-Ramirez M. Yanez-Limon R. V. Zakharchenko Laser radiation action on-c-Si with dislocations and their diagnostics (3359-04) 27(4) V. A. Makara L. P. Steblenko V. A. Pasechny V. S. Ovechko P. T. Petrosian A. M. Dmitruk Optical properties of thin Al films studied by ordinary and polariton spectroellipsometry (3359-05) 31(7) I. A. Shaikevich P. V. Kolesnik V. Pasko V. V. Prorok POSTERS ON ABSORPTION AND REFLECTION METHODS Fullerene-embedded Langmuir-Blodgett films probed by spectroscopic ellipsometry (3359-06) 38(7) E. G. Bortchagovsky I. A. Yurchenko Z. I. Kazantseva J. Humlicek J. Hora Optical properties and structure of porous silicon (3359-07) 45(4) V. S. Stashhuk V. B. Shevchenko Aging of elements of the integral optics and light guides (3359-08) 49(4) G. E. Chaika V. N. Malnev M. I. Panfilov D. E. Edgorbekov Influence of different types of surface treatment on photoelectric and optical properties of CdTe crystals (3359-09) 53(3) A. Baidullaeva P. E. Mozol A. I. Vlasenko Investigation by MAI ellipsometry of damage using surface metallic doping of near-surface layers in semiconductors (3359-10) 56(3) N. L. Dmitruk L. A. Zabashta O. I. Zabashta Structure and optical parameters of the system with porous silicon: ellipsometric study (3359-11) 59(6) V. A. Odarych O. I. Dacenko M. S. Boltovec O. V. Rudenko V. O. Pasichnyj Effect of lateral inhomogeneity of barrier height on the photoresponse characteristics of Schottky junctions (3359-12) 65(3) Zs. J. Horvath V. V. Tuyen Optical study on microstructure of laser-deposited Si-containing films (3359-13) 68(4) S. V. Svechnikov E. B. Kaganovich E. G. Manoilov A. A. Kudryavtsev I. Z. Indutnyi Absorption diagnostics of quantum size effect on the excited states of Sbl3 clusters in FAU zeolite (3359-14) 72(3) S. V. Virko F. V. Motsnyi G. M. Telbiz Infrared spectroscopy of luminescent porous silicon (3359-15) 75(4) V. A. Makara V. S. Stashhuk V. B. Shevchenko IR reflection spectra of the ZnO/Al2O3 structure (3359-16) 79(5) E. F. Venger A. V. Melnichuk Yu. A. Pasechnik E. I. Sukhenko Optical properties and electron zone structure of AnXO4 single crystals (3359-17) 84(6) Yu. A. Hizhnii S. G. Nedelko Mechansim of the ZnGa2S4 monolayer formation on an NaCl surface (3359-18) 90(5) N. Popovich V. Zhikharev N. Dovgoshey I. Kacher Optical and photoelectrical studies of strain fields in semiconductor crystals (3359-19) 95(6) B. K. Serdega V. G. Zykov G. N. Semenova L. V. Shekhovtsov Refractivity dispersion in glassy As2S5 for infrared optics (3359-20) 101(5) I. Rosola A. A. Kikineshi Optical methods of control and characterization of materials for infrared detectors (3359-21) 106(6) Yu. V. Vorobiev J. Gonzalez-Hernandez M. Yanez-Limon J. F. Perez-Robles F. J. Espinoza-Beltran R. Ramirez-Bon V. N. Zakharchenko R. V. Zakharchenko Ellipsometric probing of metallic mirrors with modified surfaces (3359-22) 112(6) L. V. Poperenko V. S. Voitsenya M. V. Vinnichenko SECTION B INTERFEROMETRY AND NONLINEAR OPTICS METHODS Nonlinear-carrier-transport-governed nonresonant optical nonlinearity in A3B5 crystals (Invited Paper) (3359-23) 118(14) K. Jarasiunas L. Subacius Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry (Invited Paper) (3359-24) 132(8) Zs. Bor A. P. Kovacs K. Osvay R. Szipocs POSTERS ON INTERFEROMETRY AND NONLINEAR OPTICS METHODS Random electric fields and coherent phonon excitation in C60 films by femtosecond laser pulses (3359-25) 140(10) V. M. Farztdinov S. A. Kovalenko A. L. Dobryakov Yu. E. Lozovik Yu. A. Matveets G. Marowsky Direct study of nonequilibrium carriers near Fermi level of Au film by optical reflection and transmission in femtosecond scale (3359-26) 150(7) A. L. Dobryakov Yu. E. Lozovik V. M. Farztdinov S. A. Kovalenko G. Marowsky Yu. A. Matveets S. P. Merkulova Adjustment of optical properties of nonlinear composites by an external electrical field (3359-27) 157(6) L. G. Grechko O. A. Davidova V. N. Malnev Role of growth defects on carrier dynamics: semi-insulating GaAs (3359-28) 163(9) V. Mizeikis K. Jarasiunas J. Storasta V. Gudelis L. Bastiene M. Sudzius SECTION C LUMINESCENT METHODS Visible Luminescent Si nanocrystals: optical characterization and application (Invited Paper) (3359-29) 172(10) S. V. Svechnikov E. B. Kaganovich Identification of electron-hole transitions in short-period GaAs/AIAs superlattices by time-resolved photoluminescence (Invited Paper) (3359-30) 182(5) V. G. Litovchenko D. V. Korbutyak S. G. Krylyuk H. T. Grahn R. Klann K. H. Ploog Basics of Luminescent diagnostics of the dislocation structure of SiC crystals (3359-31) 187(10) I. S. Gorban G. N. Mishinova Photoluminescence investigation of Dy incorporation into InP during liquid phase epitaxy (3359-32) 197(5) B. Podor E. F. Venger T. G. Kryshtab G. N. Semenova P. M. Lytvyn M. P. Semtsiv Metal-proximity-induced phosphorescence of C60 molecules (3359-33) 202(11) I. A. Yurchenko E. Burstein D.-H. Lee V. Krotov Effect of disorder on exciton dynamics in cation-substituted ZnxCd1-xS mixed crystals (3359-34) 213(9) S. G. Shevel V. L. Vozny M. I. Vytrykhivsky A. Euteneuer E. O. Gobel C. F. Klingshirn W. Petri POSTERS ON LUMINESCENT METHODS Luminescent purity diagnostics of ZnSe crystals (3359-35) 222(5) O. V. Vakulenko V. M. Kravchenko Z. Z. Janchuk Light-activated photoluminescence of porous silicon (3359-36) 227(5) M. S. Boltovec O. I. Dacenko S. M. Naumenko T. V. Ostapchuk O. V. Rudenko Acousto-stimulated change of the electrical and photoelectrical properties of CdxHg1-xTe (x = 0.2) crystals (3359-37) 232(4) Y. M. Olikh R. K. Savkina A. I. Vlasenko Electroluminescent control technique of dislocation density in GaP (3359-38) 236(8) O. M. Gontaruk D. V. Korbutyak A. P. Kudin V. I. Kuts Y. M. Olikh V. P. Tartachnik I. I. Tychina Determination of the Concentration of shallow impurities in semi-insulating GaAs by lowtemperature (77 K) photoluminescence (3359-39) 244(6) K. D. Glinchuk N. M. Litovchenko A. V. Prokhorovich O. N. Strilchuk Luminescence method for the determination of the current injection component in red GaAs1-xPx light-emitting diodes (3359-40) 250(5) K. D. Glinchuk G. A. Sukach Single crystalline imaging plates based on epitaxial and diffusion structures of alkali halide compounds (3359-41) 255(6) I. V. Konstankevych Yu. V. Zorenko M. Batenchuk M. Pashkovsky R. Fasbender M. Thoms Single crystalline thin film screens for cathode ray tubes: possibilities of application, peculiarities, and light parameters (3359-42) 261(4) Yu. V. Zorenko M. Batenchuk M. Pashkovsky I. V. Konstankevych V. Gorbenko P. Yurchyshyn V. martynova T. Duzyj Photoluminescent investigations of SHF irradiation effect on defect states in GaAs:Sn(Te) and InP crystals (3359-43) 265(8) I. B. Ermolovich E. F. Venger R. V. Konakova V. V. Milenin S. V. Svechnikov M. V. Sheveljev Short-wave emission of Tb3+ as an optical indicator of TFELS matrix changes (3359-44) 273(6) V. S. Khomchenko V. E. Rodionov Yu. A. Tzirkunov Diagnostic of the energy level distribution of tetragonal cadmium and zinc diphosphides (3359-45) 279(5) I. V. Fekeshgazi G. Grischenko P. Romanyk I. Tychina A. Sheleg Optical diagnostics of light-emitting Si clusters in SiO2 formed by ion implantation (3359-46) 284(5) M. Ya. Valakh V. A. Yukhimchuk V. Ya. Bratus A. N. Nasarov P. L. F. Hemment T. Komoda Detection of deep boron-involved thermal donor formation in silicon by combined photoluminescent, Hall, and ESR techniques (3359-47) 289(4) V. M. Babich N. P. Baran V. L. Kiritsa G. Yu. Rudko Chlorine-related photoluminescence of CdTe gamma detector material (3359-48) 293(5) P. N. Tkachuk V. I. Tkachuk D. V. Korbutyak N. D. Raransky Luminescence of CdSiP2 crystals (3359-49) 298(4) T. A. Kryskov V. Golonzhka A. A. Gubanova R. Poveda A. Sodeika Luminescence of ZnSe(Te) crystals melt-grown from the charge and enriched in selenium (3359-50) 302(3) V. D. Ryzhikov L. P. Galchinetskii S. N. Galkin K. A. Katrunov E. K. Lisetskaya Luminescence of ZnS polycrystals prepared by SSHTS (3359-51) 305(5) Yu. F. Vaksman E. V. Stankova S. V. Zubritskiy Yu. N. Purtov SECTION D RAMAN SCATTERING Micro-Raman characterization of GaN epilayers (Invited Paper) (3359-52) 310(7) M. A. Renucci F. Demangeot J. Frandon Raman spectra and effects of electrical field and stress in DQW AIGaAs lasers (Invited Paper) (3359-53) 317(7) A. Je. Semjonow Optical characterization of carbon ion implantation into Si and SiGe alloys (Invited Paper) (3359-54) 324(10) A. Perez-Rodriguez A. Romano-Rodriguez C. Serre L. Calvo-Barrio O. Gonzalez-Varona J. R. Morante Thin films for nonlinear optics: sol-gel preparation, Raman and XAS characterization of α-Fe2O3 (3359-55) 334(5) P. P. Lottici C. Baratto D. Bersani G. Antonioli A. Montenero M. Guarneri G. Gnappi Diagnostics of nitrogen-implanted diamond-like carbon films by optical and microhardness measurements (3359-56) 339(7) V. V. Artamonov N. I. Klyui B. N. Romanyuk M. Ya. Valakh O. V. Vasylyk V. A. Semenovich A. Perez-Rodriguez J. R. Morante POSTERS ON RAMAN SCATTERING Interface roughness and confined LO phonon modes in (ZnSe)2 (ZnSe)11/GaAs(100) superlattices grown by PAVPE (3359-57) 346(5) V. V. Tishchenko Y. S. Raptis E. Anastassakis Raman diagnostics of new types of A3B2X9 layered crystals (3359-58) 351(4) O. V. Vakulenko V. O. Gubanov S. V. Kun F. V. Motsnyi E. Yu. Peresh V. A. Terekhov Photostructural transformatins in amorphous Ge-S thin films: a light-scattering study (3359-59) 355(4) N. V. Bondar N. A. Davydova V. V. Tischenko M. Vlcek Nanostructure of a-C:N films characterized by Raman spectroscopy (3359-60) 359(4) A. V. Vasin O. V. Vasylyk L. A. Matveeva Raman-scattering diagnostics of the structure of hydrogenated amorphous diamond-like carbon films (3359-61) 363(6) M. Ya. Valakh O. V. Vasylyk A. G. Gontar A. M. Kutsay Structural peculiarities and phonon spectra of A3B2C9 compounds: a Raman-scattering diagnostic (3359-62) 369(6) M. P. Lisitsa E. Yu. Peresh O. V. Trylis A. M. Yaremko Optical study of the influence of oxygen on the synthesis of SiC-buried layer in Cz-Si and Fz-Si (3359-63) 375(4) V. A. Yukhimchuk V. P. Melnik B. N. Romanjuk V. G. Popov N. I. Klyui Optical characterization of inorganic resist (3359-64) 379(4) A. V. Stronski M. Vlcek P. E. Shepeljavi A. I. Stetsun Use of Raman-scattering waves for the optical diagnostics of semiconductor materials for microelectronics (3359-65) 383(6) O. Yu. Semchuk L. G. Grechko V. M. Ogenko V. A. Shenderovskii V. N. Semioshko V. V. Kobrgytskii Diagnostics of noncrystalline films by using interference of Raman Signals in thin and superthin films (3359-66) 389(5) V. M. Mitsa SECTION E OPTICAL MATERIALS AND EQUIPMENT FOR NONDESTRUCTIVE TESTING Photoacoustic spectroscopy of semiconductor nanoclusters incorporated into various dielectric matrices (3359-67) 394(7) I. V. Blonskij V. A. Tkhoryk G. M. Telbiz R. V. Turchack V. O. Salnikov Cryogenic spectrometric ellipsometer for studying solid state optical properties (3359-68) 401(7) A. I. Belyaeva T. G. Grebennik New technique for investigation of solar cell sheet resistance distribution by laser beam scanning (3359-69) 408(8) V. O. Goncharov L. M. Ilchenko S. Kilchitskaya S. Litvinenko E. M. Smirnov X-ray introscopic digital systems of nondestructive testing based on SELDI detectors (3359-70) 416(4) V. D. Ryzhikov L. P. Galchinetskii A. D. Opolonin V. M. Svishch E. M. Selegenev Complete diagnostics of pyroactive structures for smart systems of optoelectronics (3359-71) 420(8) S. L. Bravina N. V. Morozovsky Optical disk mastering process control methods (3359-72) 428(10) A. A. Kryuchin V. V. Petrov S. M. Shanoylo V. G. Kravets POSTERS ON OPTICAL MATERIALS AND EQUIPMENT FOR NONDESTRUCTIVE TESTING Random error behavior for rotating-analyzer ellipsometers (3359-73) 438(11) E. G. Bortchagovsky Cd1-xMn2Te/CdyHg1-yTe heterostructures: structure and optical properties (3359-74) 449(5) A. I. Vlasenko V. N. Babentsov Z. K. Vlasenko V. V. Kremenitskiy A. V. Ponedilok I. A. Rudoy Oxygen concentration distribution determination in silicon wafers by semiconductor IR laser spectroscopy (3359-75) 454(4) S. D. Darchuk F. F. Sizov Polarimetry of inhomogeneous slab of anisotropic medium (3359-76) 458(9) B. M. Kolisnychenko V. N. Kurashov V. V. Marienko S. N. Savenkov Controlling of the state of CoSi2 thin film by laser radiation (3359-77) 467(4) M. Knite A. Medvid Vacuum-thermal-deposited films of organic dyes as sensitive materials in electrodigit visualization processes (3359-78) 471(8) J. A. Zhizhenko V. E. Agabekov Yu. K. Mikhailovskii E. V. Kotov Vacuum-deposited dye films and their optical properties (3359-79) 479(5) K. P. Gritsenko Yu. L. Slominsky K. V. Fedotov Characterization of layered structures by photoacoustic piezoelectric technique (3359-80) 484(6) M. L. Shendeleva Methods and devices for check-up of content of contamination in liquid media with low absorbability (3359-81) 490(4) O. I. Bilyi V. B. Getman Ya. P. Ferensovich T. V. Tetyuk A. K. Chkolnyi Temperature behavior and the optical damage threshold of holographic gratings based on photopolymerizable materials (3359-82) 494(7) O. V. Sakhno T. N. Smirnova E. A. Tikhonov Study of Optical properties of layered systems by multiangle ellipsometry (3359-83) 501(5) L. A. Zabashta Computer-aided mode diagnostics and parameter optimization of a picosecond laser setup based on a modified Sagnak interferometer (3359-84) 506(6) D. N. Boldovskii E. A. Tikhonov Use of Photodepolarization spectra for diagnostics and characterization of alternating current thin-film electroluminescent (ACTFEL) devices (3359-85) 512(7) N. A. Vlasenko A. I. Beletskii Z. L. Denisova Ya. F. Kononets L. I. Veligura Photoacoustic techniques for determination of thresholds of failure during laser processing of substrate materials for integrated electronics (3359-86) 519(4) S. M. Baschenko I. V. Blonskij V. M. Puzikov O. Ya. Danko A. G. Filin Radiation-stable infrared optical components (3359-87) 523(7) N. D. Savchenko T. Shchurova A. Kondrat N. Dovgoshey Effects of structure microdefects on scintillation and photostimulated properties of CdWO4 crystals (3359-88) 530(4) V. G. Bondar S. F. Burachas K. A. Katrunov V. P. Martynov V. D. Ryzhikov Measurement and spectrometry of fluxes of charged particles using a scintillator-photodiode-preamplifier (S-PD-PA) and new types of scintillators based on semiconductor AIIBVI compounds (3359-89) 534(6) V. D. Ryzhikov V. V. Chernikov L. P. Galchinetskii S. N. Galkin E. A. Danshin A. E. Filimonov E. K. Lisetskaya V. G. Volkov Laser damage threshold and microfaultness of large KDP crystals (3359-90) 540(9) V. I. Salo V. F. Tkachenko M. A. Rom V. M. Puzikov M. I. Kolybayeva Effect of impurities on the value of the bulk laser damage threshold of KDP single crystals (3359-91) 549(4) V. I. Salo M. I. Kolybayeva V. M. Puzikov I. M. Pritula V. G. Vasilchuk Optical and photoelectric- and gas-sensitive properties of porous silicon (3359-92) 553(5) V. A. Smyntyna Yu. A. Vashpanov Optical inhomogeneity and defect formation in Mg-Doped lithium niobate single crystals (3359-93) 558(4) N. I. Deryugina K. Polgar V. M. Gabu D. Yu. Sugak A. O. Matkovskii I. M. Zaritskii L. G. Rakitina Author Index 562
