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Principles of Semiconductor Devices 2nd Revised edition [Kõva köide]

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The dimensions of modern semiconductor devices are reduced to the point where classical semiconductor theory, including the concepts of continuous particle concentration and continuous current, becomes questionable. Further questions relate to two-dimensional transport in the most important field-effect devices and one-dimensional transport in nanowires and carbon nanotubes. Designed for upper-level undergraduate and graduate courses, Principles of Semiconductor Devices, Second Edition, presents the semiconductor-physics and device principles in a way that upgrades classical semiconductor theory and enables proper interpretations of numerous quantum effects in modern devices. The semiconductor theory is directly linked to practical applications, including the links to the SPICE models and parameters that are commonly used during circuit design. The text is divided into three parts: Part I explains semiconductor physics; Part II presents the principles of operation and modeling of the fundamental junctions and transistors; and Part III provides supplementary topics, including a dedicated chapter on the physics of nanoscale devices, description of the SPICE models and equivalent circuits that are needed for circuit design, introductions to the most important specific devices (photonic devices, JFETs and MESFETs, negative-resistance diodes, and power devices), and an overview of integrated-circuit technologies. The chapters and the sections in each chapter are organized so as to enable instructors to select more rigorous and design-related topics as they see fit. New to this Edition * A new chapter on the physics of nanoscale devices * A revised chapter on the energy-band model and fully reworked and updated material on crystals to include graphene and carbon nanotubes * A revised P-N junction chapter to emphasize the current mechanisms that are relevant to modern devices * JFETs and MESFETs in a stand-alone chapter * Fifty-seven new problems and eleven new examples-- This dynamic text applies physics concepts and equations to practical, real-world applications of semiconductor device theory-- Provided by publisher. The dimensions of modern semiconductor devices are reduced to the point where the classical semiconductor theory, including the concepts of continuous particle concentration and continuous current, becomes questionable. Further questions relate to the two-dimensional transport in the most important field-effect devices and the one-dimensional transport in nanowires and carbon nanotubes.Designed for upper-level undergraduate and graduate courses, Principles of Semiconductor Devices, Second Edition, presents the semiconductor-physics and device principles in a way that upgrades the classical semiconductor theory and enables proper interpretations of numerous quantum effects in modern devices. The semiconductor theory is directly linked to practical applications, including the links to SPICE models and parameters that are commonly used during circuit design. The text is divided into three parts: Part I explains semiconductor physics; Part II presents the principles of operation and modeling of the fundamental junctions and transistors; and Part III provides supplementary topics, including a dedicated chapter on the physics of nanoscale devices, description of SPICE models and equivalent circuits that are needed for circuit design, introductions to most important specific devices (photonic devices, JFETs and MESFETs, negative-resistance diodes, and power devices), and an overview of integrated-circuit technologies. The chapters and the sections in each chapter are organized so to enable instructors to select more rigorous and design-related topics as they see fit.New to this Edition* A new chapter on the physics of nanoscale devices* A revised chapter on the energy-band model and fully reworked and updated material on crystals to include graphene and carbon nanotubes* A revised P-N junction chapter to emphasize the current mechanisms that are relevant to modern devices* JFETs and MESFETs in a stand-alone chapter* Fifty-seven new problems and eleven new examples

Arvustused

"This book is better than other texts available on this topic because of its straightforward intuitive descriptions combined with the artfully presented, detailed, and quantitatively rendered illustrations."-- Matthew Grayson, Northeastern University "The author is eloquent and presents complex material in a logical sequence, which provides for comparatively easy reading. I find the many numerical examples (including the MatLab scripts) particularly useful from a pedagogical perspective since they invite students to become more actively engaged with the novel material and concepts. In addition, they provide visual support for some otherwise abstract mathematical relationships."--Godi Fischer, University of Rhode Island

Preface xvii
PART I INTRODUCTION TO SEMICONDUCTORS
1 Introduction to Crystals and Current Carriers in Semiconductors: The Atomic-Bond Model
1(36)
1.1 Introduction to Crystals
2(14)
1.1.1 Atomic Bonds
2(4)
1.1.2 Three-Dimensional Crystals
6(7)
1.1.3 Two-Dimensional Crystals: Graphene and Carbon Nanotubes
13(3)
1.2 Current Carriers
16(10)
1.2.1 Two Types of Current Carrier in Semiconductors
16(3)
1.2.2 N-Type and P-Type Doping
19(2)
1.2.3 Electroneutrality Equation
21(1)
1.2.4 Electron and Hole Generation and Recombination in Thermal Equilibrium
22(4)
1.3 Basics of Crystal Growth and Doping Techniques
26(11)
1.3.1 Crystal-Growth Techniques
26(2)
1.3.2 Doping Techniques
28(3)
Summary
31(2)
Problems
33(2)
Review Questions
35(2)
2 The Energy-Band Model
37(69)
2.1 Electrons as Waves
38(13)
2.1.1 De Broglie Relationship Between Particle and Wave Properties
38(1)
2.1.2 Wave Function and Wave Packet
39(5)
2.1.3 Schrodinger Equation
44(7)
2.2 Energy Levels in Atoms and Energy Bands in Crystals
51(9)
2.2.1 Atomic Structure
51(2)
2.2.2 Energy Bands in Metals
53(2)
2.2.3 Energy Gap and Energy Bands in Semiconductors and Insulators
55(5)
2.3 Electrons and Holes as Particles
60(12)
2.3.1 Effective Mass and Real E-k Diagrams
60(4)
2.3.2 The Question of Electron Size: The Uncertainty Principle
64(4)
2.3.3 Density of Electron States
68(4)
2.4 Population of Electron States: Concentrations of Electrons and Holes
72(34)
2.4.1 Fermi-Dirac Distribution
73(5)
2.4.2 Maxwell-Boltzmann Approximation and Effective Density of States
78(6)
2.4.3 Fermi Potential and Doping
84(9)
2.4.4 Nonequilibrium Carrier Concentrations and Quasi-Fermi Levels
93(1)
Summary
94(5)
Problems
99(4)
Review Questions
103(3)
3 Drift
106(34)
3.1 Energy Bands With Applied Electric Field
106(3)
3.1.1 Energy-Band Presentation of Drift Current
107(2)
3.1.2 Resistance and Power Dissipation Due to Carrier Scattering
109(1)
3.2 Ohm's Law, Sheet Resistance, and Conductivity
109(12)
3.2.1 Designing Integrated-Circuit Resistors
110(6)
3.2.2 Differential Form of Ohm's Law
116(3)
3.2.3 Conductivity Ingredients
119(2)
3.3 Carrier Mobility
121(19)
3.3.1 Thermal and Drift Velocities
121(3)
3.3.2 Mobility Definition
124(1)
3.3.3 Scattering Time and Scattering Cross Section
125(2)
3.3.4 Mathieson's Rule
127(5)
3.3.5 Hall Effect
132(2)
Summary
134(1)
Problems
135(3)
Review Questions
138(2)
4 Diffusion
140(18)
4.1 Diffusion-Current Equation
140(3)
4.2 Diffusion Coefficient
143(6)
4.2.1 Einstein Relationship
143(4)
4.2.2 Haynes-Shockley Experiment
147(1)
4.2.3 Arrhenius Equation
148(1)
4.3 Basic Continuity Equation
149(9)
Summary
154(1)
Problems
155(2)
Review Questions
157(1)
5 Generation and Recombination
158(36)
5.1 Generation and Recombination Mechanisms
158(3)
5.2 General Form of the Continuity Equation
161(6)
5.2.1 Recombination and Generation Rates
161(2)
5.2.2 Minority-Carrier Lifetime
163(3)
5.2.3 Diffusion Length
166(1)
5.3 Generation and Recombination Physics and Shockley-Read-Hall (Srh) Theory
167(27)
5.3.1 Capture and Emission Rates in Thermal Equilibrium
168(3)
5.3.2 Steady-State Equation for the Effective Thermal Generation-Recombination Rate
171(6)
5.3.3 Special Cases
177(6)
5.3.4 Surface Generation and Recombination
183(5)
Summary
188(2)
Problems
190(2)
Review Questions
192(2)
PART II FUNDAMENTAL DEVICE STRUCTURES
6 P-N Junction
194(58)
6.1 P-N Junction Principles
194(13)
6.1.1 P-N Junction in Thermal Equilibrium
194(4)
6.1.2 Reverse-Biased P-N Junction
198(3)
6.1.3 Forward-Biased P-N Junction
201(2)
6.1.4 Breakdown Phenomena
203(4)
6.2 DC Model
207(14)
6.2.1 Basic Current-Voltage (I-V) Equation
207(9)
6.2.2 Important Second-Order Effects
216(4)
6.2.3 Temperature Effects
220(1)
6.3 Capacitance of Reverse-Biased P-N Junction
221(16)
6.3.1 C-V Dependence
222(1)
6.3.2 Depletion-Layer Width: Solving the Poisson Equation
223(13)
6.3.3 Spice Model for the Depletion-Layer Capacitance
236(1)
6.4 Stored-Charge Effects
237(15)
6.4.1 Stored Charge and Transit Time
237(1)
6.4.2 Relationship Between the Transit Time and the Minority-Carrier Lifetime
237(2)
6.4.3 Switching Characteristics: Reverse-Recovery Time
239(2)
Summary
241(3)
Problems
244(6)
Review Questions
250(2)
7 Metal-Semiconductor Contact and MOS Capacitor
252(44)
7.1 Metal-Semiconductor Contact
253(9)
7.1.1 Schottky Diode: Rectifying Metal-Semiconductor Contact
253(8)
7.1.2 Ohmic Metal-Semiconductor Contacts
261(1)
7.2 Mos Capacitor
262(34)
7.2.1 Properties of the Gate Oxide and the Oxide-Semiconductor Interface
263(4)
7.2.2 C-V Curve and the Surface-Potential Dependence on Gate Voltage
267(8)
7.2.3 Energy-Band Diagrams
275(11)
7.2.4 Flat-Band Capacitance and Debye Length
286(3)
Summary
289(2)
Problems
291(3)
Review Questions
294(2)
8 Mosfet
296(54)
8.1 Mosfet Principles
296(16)
8.1.1 Mosfet Structure
296(3)
8.1.2 Mosfet as a Voltage-Controlled Switch
299(5)
8.1.3 The Threshold Voltage and the Body Effect
304(4)
8.1.4 Mosfet as a Voltage-Controlled Current Source: Mechanisms of Current Saturation
308(4)
8.2 Principal Current-Voltage Characteristics and Equations
312(10)
8.2.1 Spice Level 1 Model
313(3)
8.2.2 Spice Level 2 Model
316(2)
8.2.3 Spice Level 3 Model: Principal Effects
318(4)
8.3 Second-Order Effects
322(9)
8.3.1 Mobility Reduction with Gate Voltage
322(1)
8.3.2 Velocity Saturation (Mobility Reduction with Drain Voltage)
323(1)
8.3.3 Finite Output Resistance
324(2)
8.3.4 Threshold-Voltage-Related Short-Channel Effects
326(2)
8.3.5 Threshold-Voltage-Related Narrow-Channel Effects
328(1)
8.3.6 Subthreshold Current
328(3)
8.4 Nanoscale Mosfets
331(8)
8.4.1 Downscaling Benefits and Rules
331(2)
8.4.2 Leakage Currents
333(2)
8.4.3 Advanced Mosfets
335(4)
8.5 Mos-Based Memory Devices
339(11)
8.5.1 1C1T Dram Cell
339(2)
8.5.2 Flash Memory Cell
341(2)
Summary
343(2)
Problems
345(4)
Review Questions
349(1)
9 BJT
350(47)
9.1 BJT Principles
350(21)
9.1.1 BJT as a Voltage-Controlled Current Source
351(3)
9.1.2 BJT Currents and Gain Definitions
354(5)
9.1.3 Dependence of α and β Current Gains on Technological Parameters
359(5)
9.1.4 The Four Modes of Operation: BJT as a Switch
364(5)
9.1.5 Complementary BJT
369(1)
9.1.6 BJT Versus Mosfet
369(2)
9.2 Principal Current-Voltage Characteristics: Ebers-Moll Model in Spice
371(8)
9.2.1 Injection Version
372(1)
9.2.2 Transport Version
373(1)
9.2.3 Spice Version
374(5)
9.3 Second-Order Effects
379(8)
9.3.1 Early Effect: Finite Dynamic Output Resistance
379(3)
9.3.2 Parasitic Resistances
382(1)
9.3.3 Dependence of Common-Emitter Current Gain on Transistor Current: Low-Current Effects
382(2)
9.3.4 Dependence of Common-Emitter Current Gain on Transistor Current: Gummel-Poon Model for High-Current Effects
384(3)
9.4 Heterojunction Bipolar Transistor
387(10)
Summary
389(3)
Problems
392(4)
Review Questions
396(1)
PART III SUPPLEMENTARY TOPICS
10 Physics of Nanoscale Devices
397(47)
10.1 Single-Carrier Events
398(19)
10.1.1 Beyond the Classical Principle of Continuity
398(4)
10.1.2 Current-Time Form of the Uncertainty Principle
402(3)
10.1.3 Carrier-Supply Limit to Diffusion Current
405(3)
10.1.4 Spatial Uncertainty
408(1)
10.1.5 Direct Nonequilibrium Modeling of Single-Carrier Events
409(8)
10.2 Two-Dimensional Transport in Mosfets and Hemts
417(12)
10.2.1 Quantum Confinement
418(5)
10.2.2 Hemt Structure and Characteristics
423(2)
10.2.3 Application of Classical Mosfet Equations to Two-Dimensional Transport in Mosfets and Hemts
425(4)
10.3 One-Dimensional Transport in Nanowires and Carbon Nanotubes
429(15)
10.3.1 Ohmic Transport in Nanowire and Carbon-Nanotube Fets
430(2)
10.3.2 One-Dimensional Ballistic Transport and the Quantum Conductance Limit
432(6)
Summary
438(3)
Problems
441(2)
Review Questions
443(1)
11 Device Electronics: Equivalent Circuits and Spice Parameters
444(53)
11.1 Diodes
445(12)
11.1.1 Static Model and Parameters in Spice
445(1)
11.1.2 Large-Signal Equivalent Circuit in Spice
446(2)
11.1.3 Parameter Measurement
448(6)
11.1.4 Small-Signal Equivalent Circuit
454(3)
11.2 Mosfet
457(23)
11.2.1 Static Model and Parameters: Level 3 in Spice
457(6)
11.2.2 Parameter Measurement
463(7)
11.2.3 Large-Signal Equivalent Circuit and Dynamic Parameters in Spice
470(2)
11.2.4 Simple Digital Model
472(6)
11.2.5 Small-Signal Equivalent Circuit
478(2)
11.3 BJT
480(17)
11.3.1 Static Model and Parameters: Ebers-Moll and Gummel-Poon Levels in Spice
480(1)
11.3.2 Parameter Measurement
481(6)
11.3.3 Large-Signal Equivalent Circuit and Dynamic Parameters in Spice
487(1)
11.3.4 Small-Signal Equivalent Circuit
488(3)
Summary
491(1)
Problems
492(3)
Review Questions
495(2)
12 Photonic Devices
497(21)
12.1 Light-Emitting Diodes (Led)
497(3)
12.2 Photodetectors and Solar Cells
500(10)
12.2.1 Biasing for Photodetector and Solar-Cell Applications
500(2)
12.2.2 Carrier Generation in Photodetectors and Solar Cells
502(2)
12.2.3 Photocurrent Equation
504(6)
12.3 Lasers
510(8)
12.3.1 Stimulated Emission, Inversion Population, and Other Fundamental Concepts
510(2)
12.3.2 A Typical Heterojunction Laser
512(2)
Summary
514(1)
Problems
515(2)
Review Questions
517(1)
13 Jfet and Mesfet
518(14)
13.1 Jfet
518(8)
13.1.1 Jfet Structure
518(2)
13.1.2 Jfet Characteristics
520(2)
13.1.3 Spice Model and Parameters
522(4)
13.2 Mesfet
526(6)
13.2.1 Mesfet Structure
526(1)
13.2.2 Mesfet Characteristics
526(1)
13.2.3 Spice Model and Parameters
527(3)
Summary
530(1)
Problems
530(1)
Review Questions
531(1)
14 Power Devices
532(17)
14.1 Power Diodes
533(5)
14.1.1 Drift Region in Power Devices
533(2)
14.1.2 Switching Characteristics
535(2)
14.1.3 Schottky Diode
537(1)
14.2 Power Mosfet
538(2)
14.3 IGBT
540(2)
14.4 Thyristor
542(7)
Summary
545(1)
Problems
546(1)
Review Questions
547(2)
15 Negative-Resistance Diodes
549(13)
15.1 Amplification and Oscillation by Negative Dynamic Resistance
549(5)
15.2 Gunn Diode
554(3)
15.3 Impatt Diode
557(2)
15.4 Tunnel Diode
559(3)
Summary
559(2)
Problems
561(1)
Review Questions
561(1)
16 Integrated-Circuit Technologies
562(47)
16.1 A Diode in IC Technology
562(10)
16.1.1 Basic Structure
562(1)
16.1.2 Lithography
563(2)
16.1.3 Process Sequence
565(2)
16.1.4 Diffusion Profiles
567(5)
16.2 Mosfet Technologies
572(18)
16.2.1 Local Oxidation of Silicon (Locos)
572(1)
16.2.2 NMOS Technology
573(8)
16.2.3 Basic Cmos Technology
581(8)
16.2.4 Silicon-on-Insulator (SOI) Technology
589(1)
16.3 Bipolar IC Technologies
590(19)
16.3.1 IC Structure of NPN BJT
590(2)
16.3.2 Standard Bipolar Technology Process
592(3)
16.3.3 Implementation of PNP BJTs, Resistors, Capacitors, and Diodes
595(5)
16.3.4 Layer Merging
600(3)
16.3.5 Bicmos Technology
603(1)
Summary
604(1)
Problems
605(3)
Review Questions
608(1)
Bibliography 609(1)
Answers to Selected Problems 610(2)
Index 612
Sima Dimitrijev is Professor at the Griffith School of Engineering and Deputy Director of Queensland Micro- and Nanotechnology Centre at Griffith University in Australia. He is the author of Understanding Semiconductor Devices (OUP, 2000) as well as numerous other publications in the areas of MOSFET technology, modeling, and applications.