The proceedings of the July 2004 symposium include papers on timing and transient faults, self-testing and self-checking circuits, checker and voter design, concurrent error detection, microprocessor on-line testing and evaluation, error-correcting code-based fault tolerance, built-in self-test, safety and security, dependability evaluation, and reconfiguration, repair and reuse for fault tolerance. There is no subject index. Annotation ©2004 Book News, Inc., Portland, OR (booknews.com)