ITC is the premier technical conference on electronic testing. The theme of ITC 94, the 25th International Test Conference, was Test: The Next 25 Years. This conference introduced a new format that incorporates both leading-edge and mainstream subjects. One such leading-edge topic, test synthesis, is accorded a panel discussion in these proceedings. Multi-chip module (MCM) testing is another emerging technology and is accorded two sessions and a panel discussion. Among the more traditional test topics represented with sessions are ATPG, test equipment hardware, software testing, DFT, applied BIST, board testing, test economics, memory testing, test engineering, and test quality and reliability. Annotation copyright Book News, Inc. Portland, Or.
