Muutke küpsiste eelistusi

Protocol Test Systems V: Proceedings of the IFIP TC6/WG6.1 Fifth Working Conference, Montreal, Quebec, Canada, 28-30 September 1992 [Pehme köide]

Edited by , Edited by (all of Department IRO, University of Montreal, Montreal, Quebec, Canada), Edited by
  • Formaat: Paperback / softback, 344 pages, kõrgus: 230 mm, Illustrations
  • Sari: IFIP Transactions C: Communication Systems v. C-11
  • Ilmumisaeg: 09-Mar-1993
  • Kirjastus: Elsevier Science Ltd
  • ISBN-10: 0444899804
  • ISBN-13: 9780444899804
Teised raamatud teemal:
  • Pehme köide
  • Hind: 102,48 €*
  • * saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
  • See raamat on trükist otsas, kuid me saadame teile pakkumise kasutatud raamatule.
  • Kogus:
  • Lisa ostukorvi
  • Tasuta tarne
  • Lisa soovinimekirja
Protocol Test Systems V: Proceedings of the IFIP TC6/WG6.1 Fifth Working Conference, Montreal,  Quebec, Canada, 28-30 September 1992
  • Formaat: Paperback / softback, 344 pages, kõrgus: 230 mm, Illustrations
  • Sari: IFIP Transactions C: Communication Systems v. C-11
  • Ilmumisaeg: 09-Mar-1993
  • Kirjastus: Elsevier Science Ltd
  • ISBN-10: 0444899804
  • ISBN-13: 9780444899804
Teised raamatud teemal:
Important issues in the area of protocol testing are examined in this volume, from consideration of recent developments, through a review of the current state of the art, to discussions of likely trends and directions for the future. The major topics covered include: theoretical foundations; conformance testing issues; test specification issues; test selection-LOTOS; test selection and optimization; multi-party testing experiences and test selection-non-determinism. Interoperability testing, test coverage and testablity, and GSM testing issues are also explored and the book contains three invited papers on broadband ISDN testing, conformance testing experience and on test selection based on abstract data type specification.
Part 1 Invited papers: issues in testing fast packet services over the
broadband ISDN, M. Koblentz; testing in practice - OSI Test Center, M.
Haulard la Briere; test selection based on ADT specifications, M.-C. Gaudel.
Part 2 Theoretical foundations: the limited power of testing, M. Phalippou;
on asynchronous testing, L. Verhaard et al; characterizing and ordering
errors detected by conformance testing, K. Drira et al. Part 3 Conformance
testing issues: on inconclusive verdict in conformance testing, S.T. Chanson
and Q. Li; automated test case selection based on test coverage metrics, M.
McAllister et al; diagnostic tests for single transition faults in
non-deterministic finite state machines, A. Ghedamsi et al. Part 4 Test
specification issues: an approach to the test of an ATM-based signalling
application, M. di Concetto et al; an operational semantics for concurrent
TTCN, T. Walter and B. Plattner. Part 5 Panel discussion on
interoperabability testing: the silence of the LANs, D.J. Dwyer;
interoperability testing panel minutes, J.-P. Favreau; position statements.
Part 6 Panel discussion on test coverage and testability: summary of panel
presentations and discussion, R.L. Probert. Part 7 Test selection - LOTOS:
specification and derivation of OSI conformance test suites, T. Robles et al;
interactive test generation from LOTOS specifications, S.P. van de Burgt et
al; test system for a restricted class of LOTOS expressions with data
parameters, T. Higashino et al. Part 8 Test selection and optimization:
applications of sufficient conditions for efficient protocol test generation,
A. Chung and D. Sidhu; a further optimization technique for conformance
testing based on multiple UIO sequences, Z. Lidong et al; automated protocol
conformance test generation based on formal methods for LOTOS specifications,
A.R. Cavalli et al. Part 9 Multi-party testing experience: the IS-IS
multi-party conformance test system, D. Tang et al; ISO conformance testing
of the GSM mobile network system, R. Koester and M. Dicks; non-deterministic
and fault behaviour, M.F. Witteman et al. Part 10 Panel discussion on GSM
testing issues: position statements, Part 11 Test selection -
non-determinism: test derivation from non-deterministic finite state
machines, H. Kloosterman; generation of adaptive test cases from
non-deterministic finite state models, P. Tripathy and K. Naik. Part 12
Overview of tool demonstrations.