Explains basic semiconductor physics, and looks at bipolar junction, metal oxide semiconductor field effect, and compound semiconductor field effect transistors, thin film transistors, and circuit simulation
This text-reference presents a combination of background device physics and technology, a review of existing models, and a set of new and improved models compatible with the most advanced technology. These models are used to establish new device characterization techniques which are accurate, unambiguous, and fast. These techniques and the implementation of the new models in AIM-Spice allow readers to use these models for device and circuit design, circuit simulation, parameter extraction, statistical yield analysis, and other tasks which were difficult before. Annotation copyright Book News, Inc. Portland, Or.
