PREFACE |
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v | |
ACKNOWLEDGMENTS |
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vii | |
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1 | |
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1.1. Classification of Materials |
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1 | |
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1.2. Evolution of Integrated Circuit (IC) Industry |
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4 | |
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1.3. From Design to Chips |
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8 | |
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1.4. The Wafer Substrate Manufacturing Flow |
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12 | |
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1.5. Wafer Processing Flow |
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19 | |
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1.6. What Is the Semiconductor Industry Trying to Achieve? |
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26 | |
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1.7. The Never-Ending Effort Yield Improvement |
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31 | |
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2. BUILDING BLOCKS FOR INTEGRATED CIRCUITS |
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38 | |
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2.1. Fundamental Semiconductor Concepts |
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38 | |
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47 | |
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50 | |
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52 | |
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55 | |
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58 | |
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63 | |
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63 | |
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3.2. Oxidation Mechanism and Modeling |
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68 | |
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3.3. Isolation Technology |
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78 | |
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86 | |
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3.5. Cleaning before Thermal Oxidation |
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91 | |
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4. GAS KINETICS AND PLASMA PHYSICS |
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97 | |
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4.1. Gas Kinetics and Ideal Gases |
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97 | |
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4.2. What Is Plasma? How Is It Formed? |
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104 | |
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4.3. Introduction to Plasma Physics |
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110 | |
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4.4. Electron Impact Phenomena |
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114 | |
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4.5. Fundamental Plasma Reactor Configurations |
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120 | |
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4.6. Magnetic Field Confinement |
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124 | |
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5. CHEMICAL VAPOR DEPOSITION |
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128 | |
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5.1. Classification of CVD Reactors and Films |
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128 | |
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5.2. CVD Reactor Design Concepts |
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133 | |
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5.3. CVD Reactor Modeling |
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136 | |
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5.4. Characterization of Thin Films |
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146 | |
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5.5. Applications of CVD Films |
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153 | |
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6. PLASMA-ENHANCED CHEMICAL VAPOR. DEPOSITION AND ETCHING |
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168 | |
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6.1. The Plasma Reaction Pathways and System Variables |
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168 | |
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6.2. Introduction to PECVD and Film Characterization |
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174 | |
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6.3. Applications of PECVD Films |
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178 | |
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6.4. Introduction to Plasma Etching |
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185 | |
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6.5. Applications of Plasma Etching |
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190 | |
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6.6. Plasma-Enhanced CVD and Etching Reactor Modeling |
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205 | |
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7. PATTERN TRANSFER: PHOTOLITHOGRAPHY |
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212 | |
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212 | |
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214 | |
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222 | |
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7.4. Fundamentals of Image Formation |
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233 | |
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7.5. The Exposure System Evolution and Photoprocess Variations |
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250 | |
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258 | |
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260 | |
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260 | |
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8.2. Electron Beam Writing and Resists |
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267 | |
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8.3. Back-End Processing for Mask Making |
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277 | |
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8.4. Resolution Enhancement Technology |
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289 | |
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304 | |
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304 | |
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310 | |
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317 | |
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9.4. Implant Damages and Annealing |
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327 | |
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9.5. Applications of Doping Technology |
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332 | |
10. METALLIZATION AND SILICIDATION |
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338 | |
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338 | |
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346 | |
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10.3. Aluminum Metal System |
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349 | |
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10.4. Meeting the Step Coverage Requirements |
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357 | |
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367 | |
11. PLANARIZATION AND CMP TECHNOLOGY |
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378 | |
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378 | |
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11.2. Interlayer Dielectrics |
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382 | |
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389 | |
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11.4. Intermetal Dielectrics |
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392 | |
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11.5. Introduction to Chemical Mechanical Polishing and Its Applications |
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398 | |
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409 | |
12. COPPER AND LOW-k |
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411 | |
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411 | |
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415 | |
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431 | |
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12.4. Integration of Copper and Low-k Materials |
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435 | |
GLOSSARY |
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440 | |
REFERENCES |
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453 | |
INDEX |
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465 | |