Foreword I |
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xi | |
Foreword II |
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xiii | |
Foreword III |
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xv | |
Preface |
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xvii | |
Chapter 1 Introduction |
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1 | (22) |
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1 | (7) |
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4 | (1) |
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1.1.2 The Existence Of Free Electrons |
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5 | (1) |
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1.1.3 Maximum Secondary Electron Yield (SEY) Of The Material Is Greater Than 1 |
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5 | (1) |
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1.1.4 Transition Time Of Secondary Electrons Is An Odd Multiple Of One Half-Cycle Of A Microwave Signal |
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6 | (2) |
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1.2 Research Background Of Spacecraft Multipactor Effect |
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8 | (1) |
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1.3 Research History Of Numerical Simulation Methods Of Multipactor For Space Application |
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9 | (7) |
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1.4 Related Research Institutions And Research Progress In China |
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16 | (2) |
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18 | (1) |
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18 | (5) |
Chapter 2 Basic Theory And Measurement Method Of Secondary Electron Emission In Multipactor |
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23 | (56) |
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23 | (2) |
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25 | (8) |
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25 | (8) |
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2.2.1.1 Electron Internal Collision |
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26 | (2) |
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2.2.1.2 Electron Emission |
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28 | (2) |
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2.2.1.3 Influence Of Surface Barrier |
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30 | (3) |
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33 | (26) |
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2.3.1 Theoretical Formula |
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33 | (21) |
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33 | (5) |
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38 | (1) |
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2.3.1.3 Semi-Physical Model |
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39 | (15) |
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2.3.2 Monte Carlo Simulation |
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54 | (5) |
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2.3.2.1 Elastic Scattering |
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55 | (1) |
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2.3.2.2 Inelastic Scattering |
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55 | (1) |
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2.3.2.3 Simulation Process Of Electron Scattering |
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56 | (3) |
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59 | (8) |
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2.4.1 Measurement Of SEY Of Metal Materials |
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59 | (3) |
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2.4.2 Measurement Of SEY Of Dielectric And Semiconductor Materials |
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62 | (2) |
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64 | (3) |
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2.5 Factors Affecting Sey |
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67 | (6) |
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2.5.1 Surface Adsorption And Contaminants On The Surface |
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67 | (3) |
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70 | (3) |
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2.6 The SEY And SES Of Some Common Metal Materials |
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73 | (3) |
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76 | (1) |
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76 | (3) |
Chapter 3 Electromagnetic Particle-In-Cell Method |
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79 | (58) |
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79 | (2) |
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3.2 Development And Application Of EM-PIC Method |
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81 | (3) |
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3.3 Procedure Of The EM-PIC Method |
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84 | (1) |
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85 | (10) |
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3.4.1 Maxwell Equations And Differential Difference Scheme |
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85 | (3) |
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3.4.2 Spatial Discrete And Time-Discrete Format |
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88 | (3) |
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91 | (4) |
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3.5 Particle Model And Equation Of Motion |
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95 | (2) |
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3.5.1 Macroparticle Model |
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95 | (1) |
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3.5.2 Equations Of Motion Of Particles |
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95 | (2) |
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3.6 An Algorithm Of Beam-Wave Interaction |
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97 | (6) |
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3.6.1 Charged Particle Motion In Electromagnetic Fields |
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97 | (2) |
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3.6.2 Effect Of Charged Particle Motion On Electromagnetic Field |
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99 | (4) |
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3.6.2.1 Effect Of Particle Propulsion On Charge Density |
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100 | (1) |
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3.6.2.2 Effect Of Particle Propulsion On Current Density |
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101 | (2) |
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3.7 Particle Boundary Conditions |
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103 | (14) |
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3.7.1 General Particle Boundary Conditions |
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103 | (1) |
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3.7.2 Particle Emission Boundary Conditions |
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104 | (13) |
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3.7.2.1 Thermal Electron Emission Boundary Conditions |
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105 | (3) |
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3.7.2.2 Boundary Conditions Of Field Electron Emission |
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108 | (4) |
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3.7.2.3 Boundary Conditions Of Thermal Field Emission |
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112 | (2) |
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3.7.2.4 Space Charge Limited Emission |
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114 | (3) |
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3.8 Field Boundary Condition |
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117 | (13) |
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3.8.1 Conventional Field Boundary Condition |
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117 | (4) |
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3.8.1.1 Conductor And Dielectric Boundary Condition |
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117 | (2) |
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3.8.1.2 Symmetry Boundary Condition |
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119 | (2) |
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3.8.2 Excitation Source Boundary Condition |
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121 | (6) |
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3.8.2.1 Time Harmonic Field Source |
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122 | (1) |
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123 | (1) |
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3.8.2.3 Waveguide Excitation Source |
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123 | (4) |
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3.8.3 Electromagnetic Wave Absorption Boundary Condition |
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127 | (3) |
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130 | (2) |
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132 | (1) |
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132 | (5) |
Chapter 4 EM-PIC Simulation Of Multipactor |
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137 | (42) |
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137 | (1) |
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4.2 EM-PIC Simulation Method |
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138 | (3) |
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4.3 EM-PIC Simulation Method Based On Non-Uniform Meshing |
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141 | (2) |
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4.3.1 Mesh Coordinates Converted To Actual Coordinates |
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141 | (1) |
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4.3.2 Actual Coordinates Converted To Mesh Coordinates |
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142 | (1) |
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4.4 Boundary Conditions In Multipactor Simulation |
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143 | (2) |
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143 | (1) |
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144 | (1) |
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145 | (1) |
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145 | (1) |
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4.5 Effect Of See On Multipactor Simulation |
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145 | (12) |
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145 | (2) |
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4.5.2 Numerical See Model |
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147 | (1) |
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147 | (1) |
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148 | (1) |
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148 | (8) |
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4.5.3.1 Basic Assumptions |
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148 | (1) |
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4.5.3.2 Elastic Electron Model |
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149 | (1) |
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4.5.3.3 Scattering Electron Model |
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150 | (1) |
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4.5.3.4 True Secondary Electrons |
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151 | (1) |
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4.5.3.5 Emission Probability |
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151 | (1) |
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4.5.3.6 Correction Of Tse Emission Probability |
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152 | (1) |
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4.5.3.7 Relationship With The Incident Angle |
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153 | (1) |
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4.5.3.8 Secondary Electron Emission Spectrum |
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154 | (2) |
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4.5.4 See Calculation In Multipactor Simulation |
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156 | (1) |
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4.6 Simulation Of Multipactor In Rectangular Waveguides |
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157 | (3) |
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4.7 Simulation And Analysis Of Multipactor In An Impedance Transformer |
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160 | (6) |
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4.7.1 Geometric Modelling |
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160 | (1) |
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160 | (1) |
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161 | (5) |
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4.8 Simulation And Analysis Of Multipactor In An Ridge-Waveguide Filter |
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166 | (5) |
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4.8.1 Geometric Modelling |
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166 | (1) |
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166 | (2) |
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168 | (3) |
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4.9 Simulation And Analysis Of Multipactor In Microwave Switch |
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171 | (4) |
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175 | (1) |
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175 | (4) |
Chapter 5 Multipactor Analysis In Multicarrier Systems |
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179 | (18) |
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179 | (2) |
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181 | (3) |
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5.3 Twenty Gap-Crossing Rule (TGR) |
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184 | (3) |
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5.4 Long-Term Multicarrier Multipactor |
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187 | (7) |
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194 | (3) |
Chapter 6 Pic Simulation Of Collector For TWT |
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197 | |
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197 | (1) |
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6.2 Principle Of Traveling Wave Tube |
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198 | (2) |
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6.3 Operating Principle Of The Collector Of Traveling Wave Tube |
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200 | (3) |
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6.4 Numerical Algorithm For Collector |
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203 | (5) |
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6.4.1 The Basic Principle Of The Algorithm |
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203 | (4) |
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204 | (1) |
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6.4.1.2 Equation Of Motion |
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205 | (1) |
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6.4.1.3 Current Continuity Equation |
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205 | (2) |
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6.4.2 Secondary Electrons In The Collector |
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207 | (1) |
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6.5 Simulated Examples Of Collector |
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208 | (7) |
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6.5.1 The Efficiency Of The Collector |
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208 | (3) |
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211 | (4) |
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215 | (1) |
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215 | |