While transmission electron microscopy samples of bulk metallic or ceramic materials can be prepared in a straightforward manner, the need to examine nonbulk or other classes of materials creates a need for more specialized preparation methods. These 27 papers from the April 1997 symposium address new methods of characterizing the specimen preparation process. Both general and materials-specific preparation methods are discussed. Materials covered include metallic, polymer, plastic, semiconducting, ceramic, and magnetic materials as they are found in bulk, thin-film, dispersed, and powdered forms. Annotation c. by Book News, Inc., Portland, Or.
