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Trustworthy Machine Learning under Imperfect Data [Kõva köide]

  • Formaat: Hardback, 200 pages, kõrgus x laius: 235x155 mm, Approx. 200 p., 1 Hardback
  • Ilmumisaeg: 14-Oct-2025
  • Kirjastus: Springer Nature Switzerland AG
  • ISBN-10: 9819693950
  • ISBN-13: 9789819693955
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  • Formaat: Hardback, 200 pages, kõrgus x laius: 235x155 mm, Approx. 200 p., 1 Hardback
  • Ilmumisaeg: 14-Oct-2025
  • Kirjastus: Springer Nature Switzerland AG
  • ISBN-10: 9819693950
  • ISBN-13: 9789819693955
Teised raamatud teemal:
The subject of this book centres

around trustworthy machine learning under imperfect data. It is primarily designed for

scientists, researchers, practitioners, professionals, postgraduates and

undergraduates in the

field of machine learning and artificial intelligence. The book focuses

on trustworthy deep learning under various types of imperfect data, including

noisy labels, adversarial examples, and out-of-distribution data. It covers

trustworthy machine learning algorithms, theories, and systems.

The main goal of the book is to provide students and researchers in academia with an

unbiased and comprehensive literature review. More importantly, it aims to stimulate

insightful discussions about the future of trustworthy machine learning. By engaging the audience

in more in-depth conversations, the book intends to spark ideas for addressing core

problems in this topic. For example, it will explore how to build up benchmark datasets in

noisy-supervised learning, how to tackle the emerging adversarial learning, and

how to tackle out-of-distribution detection.

For practitioners in the industry,

this book will present state-of-the-art trustworthy machine learning methods to

help them solve real-world problems in different scenarios, such as online

recommendation and web search. While the book will introduce the basics of

knowledge required, readers will benefit from having some familiarity with

linear algebra, probability, machine learning, and artificial intelligence. The

emphasis will be on conveying the intuition behind all formal concepts,

theories, and methodologies, ensuring the book remains self-contained at a high

level.
"Chapter1-Introduction".- "Chapter-2,Trustworthy Machine Learning with
Noisy Labels".- "Chapter-3,Trustworthy Machine Learning with Adversarial
Examples".- "Chapter-4,Trustworthy Machine Learning with Out-of-distribution
Data".- "Chapter-5,Advance Topics in Trustworthy Machine Learning".
Prof. Bo Han is an Assistant Professor



in Machine Learning at Hong Kong Baptist University and a BAIHO Visiting



Scientist at RIKEN AIP, where his research focuses on machine learning, deep



learning, foundation models and their applications. He was a Visiting Faculty Researcher



at Microsoft Research and a Postdoc Fellow at RIKEN AIP. He has co authored a



machine learning monograph by MIT Press. He has served as Area Chairs of



NeurIPS, ICML, ICLR and UAI. He has also served as Action Editors and Editorial



Board Members of JMLR, MLJ, JAIR, TMLR and IEEE TNNLS. He received the



Outstanding Paper Award at NeurIPS and Outstanding Area Chair at ICLR. He



received the RIKEN BAIHO Award (2019), RGC Early CAREER Scheme (2020),



Microsoft Research StarTrack Program (2021), and Tencent AI Faculty Research



Award (2022). 



Prof. Tongliang Liu is the Director of



Sydney AI Centre at University of Sydney, Australia; a Visiting Professor of



University of Science and Technology of China, Hefei, China; a Visiting



Scientist of RIKEN AIP, Tokyo, Japan; and a Visiting Associate Professor at



Mohamed bin Zayed University of Artificial Intelligence, Abu Dhabi, United Arab



 



Emirates. He has published more than 100 papers at leading ML/AI conferences



and journals. He is regularly the meta reviewer of ICML, NeurIPS, ICLR, UAI,



IJCAI, and AAAI. He is the Action Editor of Transactions on Machine Learning



Research, Associate Editor of ACM Computing Surveys, and in the Editorial Board



of Journal of Machine Learning Research and the Machine Learning journal. He



received the ARC DECRA Award in 2018, ARC Future Fellowship Award in 2022, and



IEEE AI's 10 to Watch Award in 2023. He also received multiple faculty awards,



e.g., from OPPO and Meituan.