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VNA Applications Handbook Unabridged edition [Kõva köide]

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  • Formaat: Hardback, 400 pages
  • Ilmumisaeg: 30-Sep-2019
  • Kirjastus: Artech House Publishers
  • ISBN-10: 1630816000
  • ISBN-13: 9781630816001
Teised raamatud teemal:
VNA Applications Handbook Unabridged editionSuurem pilt
  • Formaat: Hardback, 400 pages
  • Ilmumisaeg: 30-Sep-2019
  • Kirjastus: Artech House Publishers
  • ISBN-10: 1630816000
  • ISBN-13: 9781630816001
Teised raamatud teemal:
Püsilink: https://www.kriso.ee/db/9781630816001.html
Märksõnad:
Written by prominent experts in the field, this authoritative new resource provides guidelines for performing a wide variety of Vector Network Analyzers (VNA) measurements. The capabilities and limitations of modern VNA in the context of challenging real-world applications are explained, as well as insights for optimizing test setups and instrument settings, making accurate measurements and, equally important, avoiding costly mistakes. Organized by topic, the readers can focus on chapters covering particular measurement challenges. Application topics include linear and non-linear measurements of passive and active devices, frequency converting devices, and special considerations for high-power, high-gain, and pulsed devices. Signal Integrity and time-domain reflectometry are covered, as well as emerging applications at millimeter-wave frequencies driven by 5G and automotive radar. Waveguide is presented, with emphasis on understanding guided-wave propagation and the associated calculations required for creating calibration standards. Each application is supported by illustrations that help explain key concepts and VNA screenshots are used to show both expected and, in some cases, unexpected results. This book equips engineers and lab technicians to better understand these important instruments, and effectively use them to develop the technologies that drive our world.
Preface xiii
1 Architecture of the Modern Vector Network Analyzer 1(14)
1.1 What Is a Vector Network Analyzer?
1(1)
1.2 Wave Quantities and S-Parameters
2(3)
1.2.1 One-Port Measurements
2(1)
1.2.2 Two-Port Measurements
3(2)
1.3 Architecture of an N-Port Network Analyzer
5(7)
1.3.1 Main Blocks
6(3)
1.3.2 Errors
9(2)
1.3.3 Test Set Challenges
11(1)
1.4 Swept Versus Stepped Mode
12(3)
1.4.1 Chopped Versus Alternate Mode
13(2)
2 Calibration 15(42)
2.1 VNA Measurements in an Ideal World
15(3)
2.2 Measurement Errors in the Real World
18(10)
2.2.1 Random Errors
20(6)
2.2.2 Systematic Errors
26(2)
2.3 Calibration Standards
28(10)
2.3.1 Open (O)
30(2)
2.3.2 Short (S)
32(2)
2.3.3 Match (M)
34(1)
2.3.4 Sliding Match (Sliding Load)
34(2)
2.3.5 Thru (T)
36(1)
2.3.6 Reflect (R)
37(1)
2.3.7 Line (L)
37(1)
2.3.8 Symmetrical Network (N)
37(1)
2.3.9 Attenuator Standard (A)
38(1)
2.3.10 Unknown Thru (U)
38(1)
2.4 Calibration Techniques
38(11)
2.4.1 Normalization
38(1)
2.4.2 Full Single-Port Correction (OSM)
39(3)
2.4.3 One-Path, Two-Port Correction
42(1)
2.4.4 Seven-Term Error Correction
42(4)
2.4.5 12-Term Error Correction
46(3)
2.5 Power Calibration
49(5)
2.5.1 Source Power Calibration
50(1)
2.5.2 Receiver Power Cal
51(1)
2.5.3 SMARTerCal
52(1)
2.5.4 Automatic Level Control (ALC)
53(1)
References
54(1)
Selected Bibliography
55(2)
3 Passive and Active One-Port Device Measurements 57(38)
3.1 Passive One-Port Devices
57(5)
3.1.1 Steps for Setting Up a Single-Port Measurement
58(3)
3.1.2 Calibration for Multiple Single-Port Devices
61(1)
3.1.3 Port Configuration for Multiple Simultaneous Single-Port Measurements
61(1)
3.2 Impedance Measurements
62(2)
3.2.1 Impedance Traces
63(1)
3.2.2 Impedance Markers
63(1)
3.3 Phase and Electrical Length Measurements
64(5)
3.3.1 Calibration Offset Method
64(1)
3.3.2 Group Delay Method
65(4)
3.4 Measurement Uncertainty for Passive One-Port Devices
69(8)
3.4.1 Directivity
69(7)
3.4.2 Source Match
76(1)
3.5 Active One-Port DUTs: Oscillators, VCOs, and Signal Generators
77(8)
3.5.1 Spurious Signals
77(3)
3.5.2 Heterodyne Images
80(3)
3.5.3 Receiver Compression/Overload
83(2)
Reference
85(1)
Selected Bibliography
85(1)
Appendix 3A: Phase Wrap Resulting from an Offset Open or Offset Short Calibration Kit Standard
85(5)
Appendix 3A.2: MATLAB Script for Generating Data for Offset Open and Short Standards Versus Frequency
90(5)
4 Passive Two-Port Device Measurements 95(34)
4.1 Passive Two-Port Devices
95(32)
4.1.1 Steps for Establishing a Two-Port Measurement Baseline
96(2)
4.1.2 Cable Measurements
98(5)
4.1.3 Filter Measurements
103(5)
4.1.4 Passive Multiport Devices Measured as a Two-Port
108(6)
4.1.5 Switches: Time-Domain Transient Measurements
114(2)
4.1.6 Phase and Delay-Matching of Complex-Modulated Signals
116(11)
Selected Bibliography
127(2)
5 Active Two-Port Device Measurements 129(62)
5.1 General-Purpose Amplifier Measurements
130(18)
5.1.1 Linear Measurements
130(3)
5.1.2 Nonlinear Measurements
133(15)
5.2 High-Power Amplifier Measurements
148(12)
5.2.1 Power Considerations for High-Power Calibration
149(3)
5.2.2 Power Calibration for High-Power Applications
152(2)
5.2.3 Adding an Attenuator to a Low-Power Sensor for High-Power Measurements
154(1)
5.2.4 Hot S22 Measurements
155(5)
5.3 High-Gain Amplifier Measurements
160(5)
5.3.1 Attenuator Position Versus Coupler Design
161(1)
5.3.2 Power Calibration Strategy
162(3)
5.4 Low Noise Amplifier (LNA) Measurements
165(25)
5.4.1 Noise Figure Theory
165(3)
5.4.2 Y-Factor Method
168(9)
5.4.3 Signal-to-Noise Method
177(12)
5.4.4 Cold Source Method
189(1)
5.4.5 Other Concerns
190(1)
References
190(1)
6 Measurements on Mixers and Frequency Converters 191(38)
6.1 Introduction
191(2)
6.2 Mixer Architecture
193(9)
6.2.1 Conversion Loss
197(1)
6.2.2 Isolation
197(1)
6.2.3 1-dB Compression Point
198(1)
6.2.4 VSWR
199(1)
6.2.5 Noise Figure
200(1)
6.2.6 Dynamic Range
200(1)
6.2.7 Single-Tone IMD
201(1)
6.2.8 Multitone IMD
201(1)
6.2.9 DC Polarity
201(1)
6.2.10 DC Offset
202(1)
6.3 Scalar Mixer Measurements
202(4)
6.3.1 Scalar Mixer Setup (ZNB)
203(1)
6.3.2 Scalar Mixer Calibration Steps
204(1)
6.3.3 Scalar Mixer Measurement Steps
205(1)
6.4 Mixer Phase Measurements with a VNA
206(15)
6.4.1 Reference Mixer Method
207(3)
6.4.2 Vector-Corrected Mixer Method
210(7)
6.4.3 Simply Better Vector Mixer Measurements
217(4)
6.5 Two-Tone Group Delay Measurements
221(7)
6.5.1 Group Delay Measurements with the ZVA
225(3)
References
228(1)
7 Pulse Measurements 229(34)
7.1 Pulse Measurement Introduction
229(4)
7.1.1 Time-Domain Representation
230(1)
7.1.2 Frequency-Domain Representation
231(2)
7.2 VNA Pulsed Measurement Techniques
233(8)
7.2.1 Pulse Averaging
234(1)
7.2.2 Point-in-Pulse
234(6)
7.2.3 Pulse Profile
240(1)
7.3 Instrument Setups and Power Calibration Approaches for Pulse Measurements
241(15)
7.3.1 Pulse Averaging Measurement Setup
244(2)
7.3.2 Point-in-Pulse (Wideband) Measurement Setup
246(4)
7.3.3 Pulse Profile Measurement Setup
250(6)
Appendix 7A: Fourier Analysis Review
256(3)
Appendix 7B: Odd and Even Functions
259(4)
8 Time-Domain Reflectometry and Distance-to-Fault Measurements 263(30)
8.1 Introduction
263(27)
8.1.1 Steps for Establishing a Single-Port TDR Measurement Baseline
265(4)
8.1.2 Time-Domain Basics
269(9)
8.1.3 Time-Domain Gating
278(2)
8.1.4 Cable Measurements
280(2)
8.1.5 PCB Measurements
282(4)
8.1.6 Advanced De-Embedding Tools
286(3)
8.1.7 DUTs with Pigtails
289(1)
8.2 Best Practices
290(3)
8.2.1 Device Characteristics
290(1)
8.2.2 VNA Settings
291(1)
8.2.3 Correlations Between Frequency Domain and Time Domain
292(1)
9 Millimeter-Wave and Waveguide-Based Measurements 293(34)
9.1 Introduction
293(2)
9.2 On-Wafer Measurements
295(6)
9.2.1 Power Calibration
298(3)
9.3 Over-the-Air Measurements
301(2)
9.4 Millimeter-Wave Converters
303(23)
9.4.1 Millimeter-Wave Converter Architecture
304(3)
9.4.2 Millimeter-Wave Converter Applications
307(5)
9.4.3 Waveguide Calibration
312(6)
9.4.4 VNA-Based Spectrum Analysis
318(8)
References
326(1)
10 Signal and Power Integrity Measurements 327(34)
10.1 Signal Integrity (SI)
327(23)
10.1.1 Steps for Establishing a Four-Port Differential Measurement Baseline
328(12)
10.1.2 SI Basics
340(6)
10.1.3 Eye Diagrams
346(4)
10.2 Power Integrity
350(1)
10.3 Reciprocity
351(1)
10.4 Passivity
352(1)
10.5 Causality
353(1)
10.6 2x Thru De-Embedding
353(3)
10.7 Delta L
356(1)
10.8 PCB Probing
356(3)
Reference
359(2)
About the Authors 361(2)
Index 363