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Advances in Imaging and Electron Physics, Volume 197 [Kõva köide]

(Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
  • Formaat: Hardback, 174 pages, kõrgus x laius: 229x152 mm, kaal: 450 g
  • Sari: Advances in Imaging and Electron Physics
  • Ilmumisaeg: 14-Oct-2016
  • Kirjastus: Academic Press Inc
  • ISBN-10: 0128048115
  • ISBN-13: 9780128048115
Teised raamatud teemal:
  • Formaat: Hardback, 174 pages, kõrgus x laius: 229x152 mm, kaal: 450 g
  • Sari: Advances in Imaging and Electron Physics
  • Ilmumisaeg: 14-Oct-2016
  • Kirjastus: Academic Press Inc
  • ISBN-10: 0128048115
  • ISBN-13: 9780128048115
Teised raamatud teemal:

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contains contributions from leading authorities on imaging and electron physics that inform and update on the latest developments in the field
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

Muu info

This series provides cutting-edge articles on the latest developments in all areas of microscopy, image science, and related subjects in electron physics
Contributors vii
Preface ix
Future Contributors xi
1 Interference of Light and of Material Particles: A Departure from the Superposition Principle
1(44)
R. Castaneda
G. Matteucci
R. Capelli
1 Introduction
1(3)
2 Theoretical Model
4(6)
3 Particle Interference Described with the Novel Model
10(7)
4 Interpretation of Electron Interference
17(6)
5 Interpretation of Massive Molecule Interference
23(8)
6 Perspectives in the Realization of Molecular Nanostructures
31(3)
7 Conclusions
34(11)
Appendix 1 The Size of the Structured Supports of Spatial Coherence
35(2)
Appendix 2 Nonparaxial Far-Field Interference of Light
37(4)
Acknowledgments
41(1)
References
41(4)
2 Unified Numerical Formalism of Modal Methods in Computational Electromagnetics and the Latest Advances: Applications in Plasmonics
45(60)
K. Edee
J.-P. Plumey
B. Guizal
1 Introduction
46(2)
2 From Maxwell Equations to Modal Equations
48(8)
3 Method of Moment and Operator Representation
56(3)
4 FMM in the Cartesian Coordinate System
59(1)
5 From Subsectional to Global Basis Functions
60(18)
6 Anisotropic Impedance Matched Media and Their Equivalence With Complex Coordinates
78(2)
7 Application: Modal Analysis of the Coupling Between a Square Ring Resonator and a Metal-Insulator-Metal Waveguide
80(16)
8 About Monomode Behavior of a More Realistic 3D Plasmonic Open Waveguide
96(9)
References
102(3)
3 Fundamentals of Focal Series Inline Electron Holography
105(44)
A. Lubk
K. Vogel
D. Wolf
J. Krehl
F. Roder
L. Clark
G. Guzzinati
J. Verbeeck
1 Introduction
105(5)
2 Thin Lens Imaging
110(5)
3 Experimental Implementation
115(8)
4 Long-Range Focal Series Reconstruction
123(10)
5 Case Study
133(5)
6 Summary and Outlook
138(11)
Appendix
139(4)
Acknowledgments
143(1)
References
143(6)
Index 149(4)
Contents of Volumes 151--196 153
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.