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1 | (4) |
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3 | (2) |
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2 Components and Definitions |
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5 | (158) |
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5 | (26) |
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9 | (2) |
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11 | (3) |
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14 | (4) |
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18 | (3) |
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21 | (1) |
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22 | (6) |
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2.1.7 Functions of Statistical Variables |
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28 | (3) |
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31 | (9) |
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33 | (2) |
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2.2.2 Voltage and Temperature Coefficient |
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35 | (1) |
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2.2.3 Measuring Resistance |
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35 | (1) |
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36 | (1) |
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37 | (3) |
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40 | (16) |
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43 | (2) |
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45 | (1) |
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2.3.3 Straight-Wire Inductance |
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45 | (2) |
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2.3.4 Skin Effect and Eddy Current |
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47 | (1) |
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47 | (2) |
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49 | (1) |
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2.3.7 Energy in Capacitors |
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50 | (1) |
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51 | (1) |
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2.3.9 Digital Power Consumption |
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52 | (2) |
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54 | (2) |
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56 | (18) |
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2.4.1 Semiconductor Resistivity |
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57 | (1) |
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2.4.2 Voltage and Temperature Coefficient |
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58 | (1) |
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2.4.3 Matching of Resistors |
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59 | (1) |
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59 | (4) |
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63 | (3) |
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66 | (1) |
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66 | (4) |
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2.4.8 Capacitance Between Layers |
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70 | (1) |
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2.4.9 Voltage and Temperature Coefficient |
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71 | (1) |
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2.4.10 Matching of Capacitors |
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71 | (1) |
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71 | (3) |
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74 | (20) |
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78 | (2) |
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80 | (1) |
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2.5.3 Large Signal and Small Signal |
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81 | (1) |
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2.5.4 Drain-Voltage Influence |
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82 | (1) |
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83 | (1) |
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84 | (2) |
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2.5.7 High-Frequency Behavior |
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86 | (1) |
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87 | (1) |
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2.5.9 Temperature Coefficient |
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88 | (1) |
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89 | (2) |
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91 | (1) |
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2.5.12 Enhancement and Depletion |
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92 | (1) |
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93 | (1) |
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94 | (25) |
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94 | (3) |
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97 | (1) |
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97 | (2) |
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99 | (2) |
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2.6.5 Differential Design |
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101 | (2) |
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103 | (3) |
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106 | (1) |
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107 | (3) |
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110 | (3) |
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2.6.10 Sallen--Key 8m -- C Filters and Gyrators |
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113 | (3) |
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2.6.11 Switched-Capacitor Circuits |
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116 | (3) |
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119 | (44) |
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2.7.1 Classification of Amplifiers |
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119 | (2) |
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2.7.2 One-Transistor Amplifier |
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121 | (2) |
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123 | (1) |
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124 | (1) |
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125 | (4) |
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129 | (1) |
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2.7.7 Mixers and Variable Gain Amplifiers |
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130 | (1) |
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131 | (2) |
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2.7.9 Cascode and Regulated Cascode |
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133 | (4) |
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2.7.10 Single-Stage Amplifier |
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137 | (3) |
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140 | (3) |
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2.7.12 Choosing the W/L Ratios in a Miller Opamp |
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143 | (3) |
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2.7.13 Dominant-Pole Amplifier |
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146 | (1) |
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2.7.14 Feedback in Electronic Circuits |
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146 | (2) |
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148 | (2) |
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150 | (13) |
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163 | (34) |
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3.1 Sampling in Time and Frequency |
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163 | (21) |
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168 | (1) |
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169 | (1) |
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3.1.3 Sampling, Modulation and Chopping |
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170 | (3) |
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173 | (2) |
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175 | (1) |
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176 | (3) |
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3.1.7 Jitter of the Sampling Pulse |
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179 | (5) |
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3.2 Time-Discrete Filtering |
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184 | (13) |
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184 | (6) |
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190 | (1) |
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190 | (2) |
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192 | (5) |
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197 | (30) |
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4.1 Track-and-Hold and Sample-and-Hold Circuits |
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197 | (4) |
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201 | (3) |
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4.3 Capacitor and Switch Implementations |
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204 | (10) |
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204 | (1) |
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205 | (4) |
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4.3.3 Bottom Plate Sampling |
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209 | (1) |
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4.3.4 CMOS Bootstrap Techniques |
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210 | (2) |
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4.3.5 Buffering the Hold Capacitor |
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212 | (2) |
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4.4 Track-and-Hold Circuit Topologies |
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214 | (13) |
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4.4.1 Basic Configurations |
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214 | (3) |
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4.4.2 Amplifying Track-and-Hold Circuit |
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217 | (2) |
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4.4.3 Correlated Double Sampling |
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219 | (1) |
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220 | (2) |
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4.4.5 Distortion and Noise |
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222 | (5) |
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227 | (22) |
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229 | (5) |
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229 | (2) |
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5.1.2 Differential Linearity |
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231 | (3) |
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234 | (4) |
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5.2.1 One-Bit Quantization |
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234 | (1) |
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5.2.2 2-6 Bit Quantization |
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234 | (2) |
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5.2.3 7-Bit and Higher Quantization |
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236 | (2) |
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238 | (6) |
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5.3.1 Related Definitions |
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240 | (2) |
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5.3.2 Nonuniform Quantization |
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242 | (1) |
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242 | (2) |
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244 | (5) |
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249 | (16) |
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249 | (3) |
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6.2 Bandgap Reference Circuits |
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252 | (9) |
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252 | (2) |
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6.2.2 Artifacts of the Standard Circuit |
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254 | (2) |
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6.2.3 Bipolar Bandgap Circuit |
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256 | (1) |
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6.2.4 CMOS Bandgap Circuit |
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256 | (3) |
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6.2.5 Low-Voltage Bandgap Circuits |
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259 | (2) |
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6.3 Alternative References |
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261 | (4) |
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7 Digital-to-Analog Conversion |
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265 | (60) |
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7.1 Unary and Binary Representation |
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266 | (5) |
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7.1.1 Digital Representation |
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269 | (1) |
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270 | (1) |
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7.2 Digital-to-Analog Conversion in the Voltage Domain |
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271 | (10) |
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271 | (2) |
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7.2.2 Dynamic Behavior of the Resistor Ladder |
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273 | (1) |
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7.2.3 Practical Issues in Resistor Ladders |
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274 | (4) |
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278 | (3) |
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7.3 Digital-to-Analog Conversion in the Current Domain |
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281 | (10) |
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7.3.1 Current Steering Digital-to-Analog Converter |
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281 | (2) |
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283 | (2) |
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285 | (3) |
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288 | (2) |
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7.3.5 Semi-digital Filter/Converters |
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290 | (1) |
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7.4 Digital-to-Analog Conversion in the Charge Domain |
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291 | (4) |
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7.5 Digital-to-Analog Conversion in the Time Domain |
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295 | (4) |
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298 | (1) |
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299 | (5) |
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7.6.1 Accuracy in Resistors Strings |
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299 | (2) |
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7.6.2 Accuracy in Current Source Arrays |
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301 | (3) |
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7.7 Methods to Improve Accuracy |
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304 | (9) |
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7.7.1 Current Calibration |
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306 | (1) |
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7.7.2 Dynamic Element Matching |
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307 | (2) |
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7.7.3 Data-Weighted Averaging |
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309 | (4) |
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7.8 Implementation Examples |
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313 | (12) |
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7.8.1 Resistor-Ladder Digital-to-Analog Converter |
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313 | (3) |
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7.8.2 Current-Domain Digital-to-Analog Conversion |
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316 | (2) |
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318 | (1) |
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7.8.4 Algorithmic Charge-Based Digital-to-Analog Converter |
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319 | (6) |
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8 Analog-to-Digital Conversion |
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325 | (94) |
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327 | (19) |
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8.1.1 Dynamic Behavior of the Comparator |
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330 | (1) |
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331 | (2) |
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333 | (2) |
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8.1.4 Metastability and Bit Error Rate |
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335 | (1) |
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336 | (2) |
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8.1.6 Comparator Schematics |
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338 | (5) |
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8.1.7 Auto-Zero Comparators |
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343 | (1) |
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8.1.8 Track-and-Hold Plus Comparator |
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344 | (2) |
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8.2 Full-Flash Converters |
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346 | (20) |
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8.2.1 Ladder Implementation |
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349 | (1) |
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350 | (6) |
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356 | (2) |
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8.2.4 Averaging and Interpolation |
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358 | (2) |
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8.2.5 Frequency-Dependent Mismatch |
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360 | (2) |
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8.2.6 Technology Sealing for Full-Flash Converters |
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362 | (1) |
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362 | (3) |
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8.2.8 Digital Output Power |
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365 | (1) |
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366 | (6) |
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367 | (1) |
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368 | (4) |
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8.4 1-Bit Pipeline Analog-to-Digital Converters |
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372 | (8) |
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8.4.1 Error Sources in Pipeline Converters |
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376 | (2) |
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8.4.2 Reduced Radix Converters with Digital Calibration |
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378 | (2) |
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8.5 1.5 Bit Pipeline Analog-to-Digital Converter |
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380 | (9) |
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8.5.1 Design of an MDAC Stage |
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381 | (3) |
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384 | (1) |
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385 | (4) |
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8.6 Successive Approximation Converters |
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389 | (9) |
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8.6.1 Charge-Redistribution Conversion |
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391 | (3) |
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8.6.2 Algorithmic Converters |
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394 | (4) |
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8.7 Linear Approximation Converters |
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398 | (2) |
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8.8 Time-Interleaving Time-Discrete Circuits |
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400 | (4) |
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8.9 Implementation Examples |
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404 | (6) |
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8.9.1 Full-Flash Analog-to-Digital Converter |
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405 | (2) |
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8.9.2 Successive-Approximation Analog-to-Digital Converter |
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407 | (1) |
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8.9.3 Multistep Analog-to-Digital Converter |
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407 | (2) |
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409 | (1) |
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8.10 Other Conversion Proposals |
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410 | (9) |
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8.10.1 Level-Crossing Analog-to-Digital Conversion |
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410 | (1) |
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8.10.2 Feedback Asynchronous Conversion |
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411 | (1) |
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8.10.3 Mismatch Dominated Conversion |
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412 | (1) |
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8.10.4 Time-Related Conversion |
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413 | (2) |
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8.10.5 Vernier/Nonius Principle |
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415 | (1) |
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8.10.6 Floating-Point Converter |
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415 | (4) |
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9 Sigma--Delta Modulation |
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419 | (50) |
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420 | (3) |
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9.1.1 Oversampling in Analog-to-Digital Conversion |
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420 | (1) |
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9.1.2 Oversampling in Digital-to-Analog Conversion |
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421 | (2) |
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423 | (6) |
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9.2.1 Higher Order Noise Shaping |
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426 | (3) |
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9.3 Sigma--Delta Modulation |
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429 | (6) |
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432 | (2) |
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9.3.2 Sigma--Delta Digital-to-Analog Conversion |
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434 | (1) |
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9.4 Time-Discrete Sigma--Delta Modulation |
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435 | (10) |
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9.4.1 First-Order Modulator |
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435 | (2) |
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9.4.2 Cascade of Integrators in FeedBack or Feed-Forward |
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437 | (2) |
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9.4.3 Second-Order Modulator |
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439 | (2) |
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9.4.4 Circuit Design Considerations |
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441 | (2) |
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9.4.5 Cascaded Sigma--Delta Modulator |
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443 | (2) |
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9.5 Time-Continuous Sigma--Delta Modulation |
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445 | (11) |
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9.5.1 First-Order Modulator |
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445 | (4) |
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9.5.2 Higher-Order Sigma--Delta Converters |
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449 | (5) |
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9.5.3 Excess Loop Delay in Time-Continuous Sigma--Delta Conversion |
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454 | (1) |
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455 | (1) |
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9.6 Time-Discrete and Time-Continuous Sigma--Delta Conversion |
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456 | (3) |
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9.7 Multi-bit Sigma--Delta Conversion |
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459 | (3) |
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9.8 Various Forms of Sigma--Delta Modulation |
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462 | (7) |
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9.8.1 Complex Sigma--Delta Modulation |
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462 | (1) |
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9.8.2 Asynchronous Sigma--Delta Modulation |
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463 | (1) |
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9.8.3 Input Feed-Forward Modulator |
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463 | (1) |
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9.8.4 Band-Pass Sigma--Delta Converter |
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464 | (1) |
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9.8.5 Sigma--Delta Loop with Noise Shaping |
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465 | (1) |
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9.8.6 Incremental Sigma--Delta Converter |
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466 | (3) |
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10 Characterization and Specification |
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469 | (14) |
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470 | (3) |
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473 | (6) |
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473 | (3) |
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476 | (3) |
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479 | (4) |
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483 | (54) |
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483 | (6) |
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11.1.1 Power Supply and Signal Swing |
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484 | (2) |
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486 | (1) |
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487 | (2) |
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11.2 Variability: An Overview |
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489 | (2) |
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11.3 Deterministic Offsets |
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491 | (16) |
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11.3.1 Offset Caused by Electrical Differences |
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492 | (2) |
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11.3.2 Offset Caused by Lithography |
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494 | (1) |
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495 | (1) |
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11.3.4 Implantation-Related Effects |
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496 | (3) |
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11.3.5 Temperature Gradients |
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499 | (1) |
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11.3.6 Offset Caused by Stress |
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500 | (4) |
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504 | (3) |
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507 | (14) |
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11.4.1 Random Fluctuations in Devices |
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507 | (3) |
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11.4.2 MOS Threshold Mismatch |
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510 | (3) |
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11.4.3 Current Mismatch in Strong and Weak Inversion |
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513 | (2) |
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11.4.4 Mismatch for Various Processes |
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515 | (4) |
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11.4.5 Application to Other Components |
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519 | (1) |
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520 | (1) |
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11.5 Consequences for Design |
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521 | (5) |
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521 | (1) |
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522 | (2) |
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524 | (1) |
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11.5.4 Limits of Power and Accuracy |
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525 | (1) |
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526 | (4) |
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530 | (7) |
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12 System Aspects of Conversion |
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537 | (20) |
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539 | (8) |
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12.1.1 Specification of Functionality |
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541 | (1) |
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12.1.2 Signal Processing Strategy |
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542 | (2) |
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544 | (2) |
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12.1.4 Conversion of Modulated Signals |
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546 | (1) |
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12.2 Comparing Converters |
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547 | (7) |
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12.3 Limits of Conversion |
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554 | (3) |
References |
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557 | (16) |
About the Author |
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573 | (2) |
Index |
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575 | |