Muutke küpsiste eelistusi

Applied Measurement with jMetrik [Kõva köide]

(University of Virginia, USA)
  • Formaat: Hardback, 170 pages, kõrgus x laius: 229x152 mm, kaal: 362 g, 4 Tables, black and white; 19 Line drawings, black and white; 55 Illustrations, black and white
  • Ilmumisaeg: 27-Jun-2014
  • Kirjastus: Routledge
  • ISBN-10: 0415531950
  • ISBN-13: 9780415531955
  • Formaat: Hardback, 170 pages, kõrgus x laius: 229x152 mm, kaal: 362 g, 4 Tables, black and white; 19 Line drawings, black and white; 55 Illustrations, black and white
  • Ilmumisaeg: 27-Jun-2014
  • Kirjastus: Routledge
  • ISBN-10: 0415531950
  • ISBN-13: 9780415531955
"jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book"--

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

List of Figures and Tables
ix
Preface xiii
Acknowledgments xix
1 Data Management
1(12)
2 Item Scoring
13(13)
3 Test Scaling
26(14)
4 Item Analysis
40(13)
5 Reliability
53(16)
6 Differential Item Functioning
69(13)
7 Rasch Measurement
82(16)
8 Polytomous Rasch Models
98(10)
9 Plotting Item and Test Characteristics
108(15)
10 IRT Scale Linking and Score Equating
123(16)
Appendix 139(2)
References 141(6)
Index 147
J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia