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Beginnings of Electron Microscopy - Part 2, Volume 221 [Kõva köide]

Edited by (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France), Edited by (Senior)
  • Formaat: Hardback, 544 pages, kõrgus x laius: 229x152 mm, kaal: 1020 g
  • Sari: Advances in Imaging and Electron Physics
  • Ilmumisaeg: 29-Apr-2022
  • Kirjastus: Academic Press Inc
  • ISBN-10: 0323989195
  • ISBN-13: 9780323989190
Teised raamatud teemal:
Beginnings of Electron Microscopy - Part 2, Volume 221Suurem pilt
  • Formaat: Hardback, 544 pages, kõrgus x laius: 229x152 mm, kaal: 1020 g
  • Sari: Advances in Imaging and Electron Physics
  • Ilmumisaeg: 29-Apr-2022
  • Kirjastus: Academic Press Inc
  • ISBN-10: 0323989195
  • ISBN-13: 9780323989190
Teised raamatud teemal:
Püsilink: https://www.kriso.ee/db/9780323989190.html
Märksõnad:
The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917–1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.
  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in Advances in Imaging and Electron Physics series
Contributors xiii
Foreword xv
Foreword to first edition xix
Preface xxiii
Ernst Ruska
Afterword xxv
Peter Hawkes
References xxvi
1 Recollections from the early years: Canada-USA
1(24)
Cecil E. Hall
Peter Hawkes
1 Introduction
1(2)
2 Initial work: University of Toronto (1935-1936)
3(4)
3 Kodak Research Laboratories, Rochester, New York (1937-1941)
7(6)
4 Massachusetts Institute of Technology
13(6)
4.1 Note on the war period
15(1)
4.2 Electron stains
16(1)
4.3 Paramyosin
17(2)
5 Transition from the early years
19(3)
5.1 Shadowcasting
19(1)
5.2 Stigmator
20(1)
5.3 Microtomy
21(1)
6 Afterword by Peter Hawkes
22(3)
References
22(3)
2 My recollection of the early history of our work on electron optics and the electron microscope
25(20)
Tadatosi Hibi
Peter Hawkes
1 Emission microscope
25(2)
2 Studies of specimen techniques for electron microscopy
27(2)
3 Electron-microscopic observations of ionic crystals
29(5)
4 The pointed filament and its application
34(3)
5 Interference and coherence
37(5)
6 Afterword by Peter Hawkes
42(3)
References
42(3)
3 Walter Hoppe -- X-ray crystallographer and visionary pioneer in electron microscopy
45(26)
Joachim Frank
1 Introduction
45(1)
2 Life
46(1)
3 Work in X-ray crystallography
47(1)
4 Structure research using electron microscopy
48(5)
5 Electron tomography
53(2)
6 Walter Hoppe remembered
55(16)
Acknowledgments
57(1)
Appendix to "Walter Hoppe -- X-ray crystallographer and visionary pioneer in electron microscopy"
58(8)
Joachim Frank
References
66(5)
4 Reminiscences of the development of electron optics and electron microscope instrumentation in Japan
71(68)
Koichi Kanaya
Peter Hawkes
1 Historical survey of the early stages of electron microscopy in Japan
72(8)
2 Lens aberrations
80(13)
2.1 Fifth-order Seidel aberrations and third-order astigmatism
80(4)
2.2 Aberrations of a focused charged-particle beam caused by space charge
84(4)
2.3 Asymmetric aberrations and manufacture accuracy
88(5)
3 Practical magnetic lens design
93(17)
3.1 Minimum aberration coefficients
93(3)
3.2 Aberrations of three-stage electron microscopes
96(9)
3.3 Minimum aberrations and achromatization
105(4)
3.4 Anastigmatic lens
109(1)
4 Formation of caustic and shadow images
110(7)
4.1 Third-order caustic
110(3)
4.2 Caustic properties combined with second- and third-order astigmatism
113(1)
4.3 Shadow image
114(3)
5 Stigmators
117(10)
5.1 Electrostatic stigmator used to correct second- and third-order astigmatisms
117(3)
5.2 Magnetic stigmator used to correct second- and third-order astigmatisms
120(2)
5.3 Anastigmatic alignment
122(2)
5.4 Anastigmatic deflection system for correcting astigmatism and its defocusing action
124(3)
6 Electron phase microscope
127(3)
7 High-voltage electron microscopes
130(1)
8 Afterword by Peter Hawkes
131(8)
References
133(6)
5 Early electron microscopy in the Netherlands
139(34)
J.B. Le Poole
Pieter Kruit
1 Afterword by Pieter Kruit: about Jan Bart Le Poole (1917-1993)
168(5)
References
171(2)
6 LLMarton, 1901-1979
173(28)
Charles Susskind
Peter Hawkes
1 Bibliographical appendix: publications of LLMarton
192(6)
2 Afterword by Peter Hawkes
198(3)
References
198(3)
7 The invention of the electron Fresnel interference biprism
201(24)
G. Mollenstedt
Peter Hawkes
1 Childhood years in Bielefeld
201(1)
2 Gaining technical know-how as a student apprentice
202(1)
3 A broad education in physics with Professor Walter Kossel
202(1)
4 Influence of the work of Kikuchi and convergent beam diffraction
203(2)
5 Electron-optical experiments with Bruche, Scherzer, and Mahl
205(6)
6 Quantitative testing of the operation of the biprism
211(7)
7 Measurement of the inner potential of solids
218(1)
8 Electron interference microscope in the transmission mode
219(1)
9 The intensity problem in electron interferometers
219(1)
10 Atomic resolution electron holography
220(2)
11 Editorial note
222(1)
12 Afterword by Peter Hawkes
222(3)
References
223(2)
8 The industrial development of the electron microscope by the Metropolitan Vickers Electrical Company and AEI Limited
225(30)
T. Mulvey
Peter Hawkes
1 Introduction
225(1)
2 Cathode rays and electron images--Gabor and the ironclad concentration coil
226(2)
3 The first commercial electron microscope--EM1
228(4)
4 Wartime developments
232(1)
5 The EM2 electron microscope
233(1)
6 A three-stage electron microscope--EM3
234(2)
7 A simple electron microscope--EM4
236(1)
8 High-voltage electron microscopy--the EM5
237(1)
9 Improving the resolving power--EM3A and the emergence of electron holography
238(5)
10 High-resolution microscopes--EM6
243(3)
11 The image intensifier
246(1)
12 The electron microscope in biology
247(1)
13 Very high-resolution microscopy
248(1)
14 Afterword by Peter Hawkes
248(7)
References
252(3)
9 The development of the scanning electron microscope
255(34)
C.W. Oatley
D. McMullan
K.C.A. Smith
Peter Hawkes
1 Introduction
255(1)
2 The initial aims of the three groups
256(4)
3 The Cambridge microscope
260(15)
4 Uses of the microscope
275(8)
5 Afterword by Peter Hawkes
283(6)
Bibliography including cited references
283(6)
10 Some recollections of electron microscopy in Britain from 1943 to 1948
289(22)
R. Reed
Peter Hawkes
1 Afterword by Peter Hawkes
307(4)
References
309(2)
11 Rudolf Ruhle and the BOSCH electron microscope: another early commercial instrument
311(66)
Hans R. Gelderblom
Heinz Schwarz
1 Origins of electron microscopy in Berlin
311(1)
2 First steps for the S&H instrument
312(2)
3 The commercial Siemens & Halske magnetic electron microscope
314(3)
4 The electrostatic electron microscope of the AEG
317(1)
5 Competition between concepts, characters, and companies
317(4)
6 The gifted entrepreneur: Baron Manfred von Ardenne
321(3)
7 Development of electron microscopy inside the Bosch company
324(1)
8 Rudolf Ruhle (1907-2003): personal background and development
325(2)
9 Rudolf Ruhle: the technical engineer at Bosch
327(4)
10 Walter Rentschler and the Bosch electron microscope
331(1)
11 Rudolf Ruhle's groundwork for the Bosch electron microscope
332(1)
12 Rudolf Ruhle's thesis: on the future Bosch electron microscope
333(4)
13 Rebuilding of Germany after WWII
337(3)
14 Foundation of the German society for electron microscopy
340(1)
15 The commercial Bosch electron microscope
340(5)
16 Promotion for the Bosch electron microscope
345(2)
17 The Bosch electron microscope in Hohenheim
347(7)
18 The Bosch-EM in Tubingen
354(10)
19 Giving up the commercial electron microscope
364(2)
20 A list of Rudolf Ruhle's patents
366(11)
Acknowledgments
368(1)
References
369(8)
12 Otto Scherzer and his contributions to electron microscopy
377(30)
Dieter Typke
1 Introduction
377(1)
2 Hans Busch, "the father of electron optics"
378(2)
3 Otto Scherzer
380(27)
3.1 Munich 1927-1931
380(1)
3.2 Berlin and Munich, 1932-1935
381(1)
3.3 Darmstadt 1935-1940, Scherzer's theorem
382(4)
3.4 The time during the Third Reich and the struggle against Deutsche Physik
386(1)
3.5 Peenemunde 1940-1945: radar investigations in war time
387(1)
3.6 Mosbach, Fort Monmouth, and again Mosbach 1946-1949; the start of aberration correction, "Scherzer Focus"
388(2)
3.7 Darmstadt, 1949-1982
390(10)
3.8 Scherzer's personality, other activities
400(1)
3.9 Scherzer anecdotes
401(2)
Acknowledgments
403(1)
References
403(4)
13 1950-1960: a decade from the viewpoint of an applications laboratory
407(36)
Cilly Weichan
Maren Heinzerling
1 Introduction
407(2)
2 Experience with testing a new microscope
409(7)
2.1 The importance of a higher electron-optical magnification
409(2)
2.2 Astigmatism and testing the resolving power
411(2)
2.3 Contrast and aperture proWems
413(2)
2.4 Calibration and high-resolution test specimens
415(1)
3 A microscope with higher resolving power
416(8)
3.1 Contamination and an anticontamination device
418(2)
3.2 Contrast improvement and focusing aids
420(2)
3.3 I take up the aperture problem again
422(1)
3.4 Extended application of microscopical techniques
423(1)
3.5 One end point: 0.4-nm high resolution
423(1)
4 Development and improvement of preparation methods
424(11)
4.1 Investigation of rubber and filling material
424(4)
4.2 Further applications: modifications of the replica technique
428(4)
4.3 Shadowing and special techniques
432(3)
5 Teaching duties in an applications laboratory for electron microscopy
435(3)
6 Final remarks
438(1)
7 Afterword by the late Dipl.-lng. Maren Heinzerling (Deutscher Akademikerinnenbund e.v.)
439(4)
References
442(1)
14 From the cathode-ray oscillograph to the high-resolution electron microscope
443(26)
Otto Wolff
Peter Hawkes
1 Introduction
443(1)
2 Developments up to the end of World War II
444(9)
2.1 Working toward Braun's tube
444(1)
2.2 From Braun's tube to the cathode-ray oscillograph
445(2)
2.3 Further development of the cathode-ray oscillograph into a technical instrument
447(4)
2.4 The recording oscillograph
451(2)
3 Period of transition
453(4)
4 Improvements in the electron microscope after 1945
457(8)
4.1 The task ahead
457(1)
4.2 Improvements in the electron optics
458(1)
4.3 Stability of the operating parameters
458(2)
4.4 Replacement of the previous control circuits
460(1)
4.5 Test equipment
460(1)
4.6 A new high-voltage system
461(3)
4.7 Improvement of resolution
464(1)
5 Concluding remarks
465(2)
6 Afterword by Peter Hawkes
467(2)
References
467(2)
15 Reminiscences
469(6)
R.W.G. Wyckoff
Peter Hawkes
1 Afterword by Peter Hawkes
473(2)
References
473(2)
16 Complementary accounts of the history of electron microscopy
475(36)
Peter Hawkes
1 Appendix
488(8)
Acknowledgments
495(1)
2 Afterword
496(15)
Acknowledgments
498(1)
References
498(13)
Index 511
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Dr Martin H˙tch, serial editor for the book series Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.