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E-raamat: Beginnings of Electron Microscopy - Part 2

Edited by Martin H˙tch (Senior), Edited by Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Formaat: PDF+DRM
Sari: Advances in Imaging and Electron Physics
Ilmumisaeg: 26-Apr-2022
Kirjastus: Academic Press Inc
Keel: eng
ISBN-13: 9780323989206

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Formaat: PDF+DRM
Sari: Advances in Imaging and Electron Physics
Ilmumisaeg: 26-Apr-2022
Kirjastus: Academic Press Inc
Keel: eng
ISBN-13: 9780323989206

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The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917–1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.

Provides the authority and expertise of leading contributors from an international board of authors
Presents the latest release in Advances in Imaging and Electron Physics series

Contributors

xiii

Foreword

Foreword to first edition

xix

Preface

xxiii

Ernst Ruska

Afterword

xxv

Peter Hawkes

References

xxvi

1 Recollections from the early years: Canada-USA

(24)

Cecil E. Hall

Peter Hawkes

1 Introduction

(2)

2 Initial work: University of Toronto (1935-1936)

(4)

3 Kodak Research Laboratories, Rochester, New York (1937-1941)

(6)

4 Massachusetts Institute of Technology

(6)

4.1 Note on the war period

(1)

4.2 Electron stains

(1)

4.3 Paramyosin

(2)

5 Transition from the early years

(3)

5.1 Shadowcasting

(1)

5.2 Stigmator

(1)

5.3 Microtomy

(1)

6 Afterword by Peter Hawkes

(3)

References

(3)

2 My recollection of the early history of our work on electron optics and the electron microscope

(20)

Tadatosi Hibi

Peter Hawkes

1 Emission microscope

(2)

2 Studies of specimen techniques for electron microscopy

(2)

3 Electron-microscopic observations of ionic crystals

(5)

4 The pointed filament and its application

(3)

5 Interference and coherence

(5)

6 Afterword by Peter Hawkes

(3)

References

(3)

3 Walter Hoppe -- X-ray crystallographer and visionary pioneer in electron microscopy

(26)

Joachim Frank

1 Introduction

(1)

2 Life

(1)

3 Work in X-ray crystallography

(1)

4 Structure research using electron microscopy

(5)

5 Electron tomography

(2)

6 Walter Hoppe remembered

(16)

Acknowledgments

(1)

Appendix to "Walter Hoppe -- X-ray crystallographer and visionary pioneer in electron microscopy"

(8)

Joachim Frank

References

(5)

4 Reminiscences of the development of electron optics and electron microscope instrumentation in Japan

(68)

Koichi Kanaya

Peter Hawkes

1 Historical survey of the early stages of electron microscopy in Japan

(8)

2 Lens aberrations

(13)

2.1 Fifth-order Seidel aberrations and third-order astigmatism

(4)

2.2 Aberrations of a focused charged-particle beam caused by space charge

(4)

2.3 Asymmetric aberrations and manufacture accuracy

(5)

3 Practical magnetic lens design

(17)

3.1 Minimum aberration coefficients

(3)

3.2 Aberrations of three-stage electron microscopes

(9)

3.3 Minimum aberrations and achromatization

105

(4)

3.4 Anastigmatic lens

109

(1)

4 Formation of caustic and shadow images

110

(7)

4.1 Third-order caustic

110

(3)

4.2 Caustic properties combined with second- and third-order astigmatism

113

(1)

4.3 Shadow image

114

(3)

5 Stigmators

117

(10)

5.1 Electrostatic stigmator used to correct second- and third-order astigmatisms

117

(3)

5.2 Magnetic stigmator used to correct second- and third-order astigmatisms

120

(2)

5.3 Anastigmatic alignment

122

(2)

5.4 Anastigmatic deflection system for correcting astigmatism and its defocusing action

124

(3)

6 Electron phase microscope

127

(3)

7 High-voltage electron microscopes

130

(1)

8 Afterword by Peter Hawkes

131

(8)

References

133

(6)

5 Early electron microscopy in the Netherlands

139

(34)

J.B. Le Poole

Pieter Kruit

1 Afterword by Pieter Kruit: about Jan Bart Le Poole (1917-1993)

168

(5)

References

171

(2)

6 LLMarton, 1901-1979

173

(28)

Charles Susskind

Peter Hawkes

1 Bibliographical appendix: publications of LLMarton

192

(6)

2 Afterword by Peter Hawkes

198

(3)

References

198

(3)

7 The invention of the electron Fresnel interference biprism

201

(24)

G. Mollenstedt

Peter Hawkes

1 Childhood years in Bielefeld

201

(1)

2 Gaining technical know-how as a student apprentice

202

(1)

3 A broad education in physics with Professor Walter Kossel

202

(1)

4 Influence of the work of Kikuchi and convergent beam diffraction

203

(2)

5 Electron-optical experiments with Bruche, Scherzer, and Mahl

205

(6)

6 Quantitative testing of the operation of the biprism

211

(7)

7 Measurement of the inner potential of solids

218

(1)

8 Electron interference microscope in the transmission mode

219

(1)

9 The intensity problem in electron interferometers

219

(1)

10 Atomic resolution electron holography

220

(2)

11 Editorial note

222

(1)

12 Afterword by Peter Hawkes

222

(3)

References

223

(2)

8 The industrial development of the electron microscope by the Metropolitan Vickers Electrical Company and AEI Limited

225

(30)

T. Mulvey

Peter Hawkes

1 Introduction

225

(1)

2 Cathode rays and electron images--Gabor and the ironclad concentration coil

226

(2)

3 The first commercial electron microscope--EM1

228

(4)

4 Wartime developments

232

(1)

5 The EM2 electron microscope

233

(1)

6 A three-stage electron microscope--EM3

234

(2)

7 A simple electron microscope--EM4

236

(1)

8 High-voltage electron microscopy--the EM5

237

(1)

9 Improving the resolving power--EM3A and the emergence of electron holography

238

(5)

10 High-resolution microscopes--EM6

243

(3)

11 The image intensifier

246

(1)

12 The electron microscope in biology

247

(1)

13 Very high-resolution microscopy

248

(1)

14 Afterword by Peter Hawkes

248

(7)

References

252

(3)

9 The development of the scanning electron microscope

255

(34)

C.W. Oatley

D. McMullan

K.C.A. Smith

Peter Hawkes

1 Introduction

255

(1)

2 The initial aims of the three groups

256

(4)

3 The Cambridge microscope

260

(15)

4 Uses of the microscope

275

(8)

5 Afterword by Peter Hawkes

283

(6)

Bibliography including cited references

283

(6)

10 Some recollections of electron microscopy in Britain from 1943 to 1948

289

(22)

R. Reed

Peter Hawkes

1 Afterword by Peter Hawkes

307

(4)

References

309

(2)

11 Rudolf Ruhle and the BOSCH electron microscope: another early commercial instrument

311

(66)

Hans R. Gelderblom

Heinz Schwarz

1 Origins of electron microscopy in Berlin

311

(1)

2 First steps for the S&H instrument

312

(2)

3 The commercial Siemens & Halske magnetic electron microscope

314

(3)

4 The electrostatic electron microscope of the AEG

317

(1)

5 Competition between concepts, characters, and companies

317

(4)

6 The gifted entrepreneur: Baron Manfred von Ardenne

321

(3)

7 Development of electron microscopy inside the Bosch company

324

(1)

8 Rudolf Ruhle (1907-2003): personal background and development

325

(2)

9 Rudolf Ruhle: the technical engineer at Bosch

327

(4)

10 Walter Rentschler and the Bosch electron microscope

331

(1)

11 Rudolf Ruhle's groundwork for the Bosch electron microscope

332

(1)

12 Rudolf Ruhle's thesis: on the future Bosch electron microscope

333

(4)

13 Rebuilding of Germany after WWII

337

(3)

14 Foundation of the German society for electron microscopy

340

(1)

15 The commercial Bosch electron microscope

340

(5)

16 Promotion for the Bosch electron microscope

345

(2)

17 The Bosch electron microscope in Hohenheim

347

(7)

18 The Bosch-EM in Tubingen

354

(10)

19 Giving up the commercial electron microscope

364

(2)

20 A list of Rudolf Ruhle's patents

366

(11)

Acknowledgments

368

(1)

References

369

(8)

12 Otto Scherzer and his contributions to electron microscopy

377

(30)

Dieter Typke

1 Introduction

377

(1)

2 Hans Busch, "the father of electron optics"

378

(2)

3 Otto Scherzer

380

(27)

3.1 Munich 1927-1931

380

(1)

3.2 Berlin and Munich, 1932-1935

381

(1)

3.3 Darmstadt 1935-1940, Scherzer's theorem

382

(4)

3.4 The time during the Third Reich and the struggle against Deutsche Physik

386

(1)

3.5 Peenemunde 1940-1945: radar investigations in war time

387

(1)

3.6 Mosbach, Fort Monmouth, and again Mosbach 1946-1949; the start of aberration correction, "Scherzer Focus"

388

(2)

3.7 Darmstadt, 1949-1982

390

(10)

3.8 Scherzer's personality, other activities

400

(1)

3.9 Scherzer anecdotes

401

(2)

Acknowledgments

403

(1)

References

403

(4)

13 1950-1960: a decade from the viewpoint of an applications laboratory

407

(36)

Cilly Weichan

Maren Heinzerling

1 Introduction

407

(2)

2 Experience with testing a new microscope

409

(7)

2.1 The importance of a higher electron-optical magnification

409

(2)

2.2 Astigmatism and testing the resolving power

411

(2)

2.3 Contrast and aperture proWems

413

(2)

2.4 Calibration and high-resolution test specimens

415

(1)

3 A microscope with higher resolving power

416

(8)

3.1 Contamination and an anticontamination device

418

(2)

3.2 Contrast improvement and focusing aids

420

(2)

3.3 I take up the aperture problem again

422

(1)

3.4 Extended application of microscopical techniques

423

(1)

3.5 One end point: 0.4-nm high resolution

423

(1)

4 Development and improvement of preparation methods

424

(11)

4.1 Investigation of rubber and filling material

424

(4)

4.2 Further applications: modifications of the replica technique

428

(4)

4.3 Shadowing and special techniques

432

(3)

5 Teaching duties in an applications laboratory for electron microscopy

435

(3)

6 Final remarks

438

(1)

7 Afterword by the late Dipl.-lng. Maren Heinzerling (Deutscher Akademikerinnenbund e.v.)

439

(4)

References

442

(1)

14 From the cathode-ray oscillograph to the high-resolution electron microscope

443

(26)

Otto Wolff

Peter Hawkes

1 Introduction

443

(1)

2 Developments up to the end of World War II

444

(9)

2.1 Working toward Braun's tube

444

(1)

2.2 From Braun's tube to the cathode-ray oscillograph

445

(2)

2.3 Further development of the cathode-ray oscillograph into a technical instrument

447

(4)

2.4 The recording oscillograph

451

(2)

3 Period of transition

453

(4)

4 Improvements in the electron microscope after 1945

457

(8)

4.1 The task ahead

457

(1)

4.2 Improvements in the electron optics

458

(1)

4.3 Stability of the operating parameters

458

(2)

4.4 Replacement of the previous control circuits

460

(1)

4.5 Test equipment

460

(1)

4.6 A new high-voltage system

461

(3)

4.7 Improvement of resolution

464

(1)

5 Concluding remarks

465

(2)

6 Afterword by Peter Hawkes

467

(2)

References

467

(2)

15 Reminiscences

469

(6)

R.W.G. Wyckoff

Peter Hawkes

1 Afterword by Peter Hawkes

473

(2)

References

473

(2)

16 Complementary accounts of the history of electron microscopy

475

(36)

Peter Hawkes

1 Appendix

488

(8)

Acknowledgments

495

(1)

2 Afterword

496

(15)

Acknowledgments

498

(1)

References

498

(13)

Index

511

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Dr Martin H˙tch, serial editor for the book series Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.

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