(Ilmumisaeg: 31-Jan-2006, Paperback, Kirjastus: IEEE Computer Society Press,U.S., ISBN-13: 9780769526287)
These 63 papers selected for the November 2006 symposium explore techniques for testing integrated circuits and systems, and are divided into sessions on test power reduction, memory tests, design verification, scan test methods, defect diagnosis, an...Loe edasi...
