This book presents select peer-reviewed proceedings of the 2nd International Conference on Advances in VLSI and Embedded Systems (AVES 2021). This book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedd...Loe edasi...
This book presents select peer-reviewed proceedings of the 2nd International Conference on Advances in VLSI and Embedded Systems (AVES 2021). This book covers cutting-edge original research in VLSI design, devices and emerging technologies, embedd...Loe edasi...
This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices a...Loe edasi...
This book presents select peer-reviewed proceedings of the International Conference on Advances in VLSI and Embedded Systems (AVES 2019) held at SVNIT, Surat, Gujarat, India. The book covers cutting-edge original research in VLSI design, devices a...Loe edasi...
(Ilmumisaeg: 08-Jul-2015, Hardback, Kirjastus: Springer International Publishing AG, ISBN-13: 9783319191737)
This book focuses on the development of 3D design and implementation methodologies for Tree-based FPGA architecture. It also stresses the needs for new and augmented 3D CAD tools to support designs such as,the design for 3D, to manufacture...Loe edasi...
Regular Nanofabrics in Emerging Technologies gives a deep insight into both fabrication and design aspects of emerging semiconductor technologies, that represent potential candidates for the post-CMOS era. Its approach is unique, across dif...Loe edasi...
Regular Nanofabrics in Emerging Technologies gives a deep insight into both fabrication and design aspects of emerging semiconductor technologies, that represent potential candidates for the post-CMOS era. Its approach is unique, across different fie...Loe edasi...
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic...Loe edasi...
