This book describes the various tradeoffs systems designers face when designing embedded memory. It uses real product examples to demonstrate embedded memory design flow from architecture, to circuit design, design for test and yield analysis.
This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.
