This microfiche constitutes the final report produced from the IEEE International Integrated Reliability Workshop, which took part in 1999....Loe edasi...
IEEE Electron Devices Society, International Reliability Physics Symposium, Institute of Electrical & Electronics Engineers, Ieee Institute of Electrical & Electroni, IEEE Inst of Electrical & Electronics
This collection from the 1999 International Reliability Physics Symposium, includes work that identifies microelectronic failure of degeneration mechanisms, improves understanding of existing failure mechanisms, and demonstrates innovative analytica...Loe edasi...
This text deals with physical mechanisms that reduce the reliability or performance of integrated circuits and microelectronics. It covers such topics as: advanced semiconductor devices; failure and yield enhancement analysis; device dielectrics; ch...Loe edasi...
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics include: contributors to failure; waver level reliability; building in reliability; a...Loe edasi...
The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics reproduced in this volume include: BIR - breaking down barriers; and shear test for a...Loe edasi...
This video pack describes the factors, techniques, tools, and data that form the foundation of an effective design process for reliable human performance. The programme also describes how to set reliability and maintainability requirements for syste...Loe edasi...
