With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in o...Loe edasi...
With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in o...Loe edasi...
The proceedings of the March 2006 symposium consists of 93 papers and 29 posters on electronic design for manufacturability and quality, with a special focus on device modeling, circuits, and architectures for building robust systems with increasingl...Loe edasi...
In response to semiconductor fabrication scaling, the proceedings of the March 2005 symposium examines device modeling, circuits, and architectures for building robust systems with increasingly variable and leaky transistors. The 83 papers and 23 pos...Loe edasi...
A March 2004 symposium brought together industry practitioners and academics engaged in deep sub-micron integrated circuit design and development. Papers from the symposium span numerous disciplines that define the integrated circuit industry. A tuto...Loe edasi...
Papers from a March 2003 symposium describe the latest research in deep submicron integrated circuit design and development. Some areas discussed include reliability and design in deep submicron technologies, reducing leakage currents in VLSI circuit...Loe edasi...
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
An illustrated guide to manufacturing submicron devices that need multiple levels of interconnects, in high volume with high yields. The author covers the stages of submicron semiconductor device design, process development, manufacturing, assembly,...Loe edasi...
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
Most of the literature on the subject of IC reliability emphasizes the theoretical aspects. This book offers managers and engineers insight into the practical aspects of VLSI reliability, from basic concepts to packaging issues. Other topics covered...Loe edasi...
Describes methods of assessing the quality and reliability of VLSICs (very large scale integrated circuits) using sensitive, non-destructive, electrical measurements. A selection of tests has been devised and evaluated on relatively small scale integ...Loe edasi...
