Preface |
|
xv | |
|
|
1 | (46) |
|
|
2 | (5) |
|
|
7 | (4) |
|
Encapsulated Microelectronic Packages |
|
|
11 | (20) |
|
|
12 | (1) |
|
Through-Hole Mounted Packages |
|
|
12 | (2) |
|
|
14 | (3) |
|
|
17 | (1) |
|
Multi-Chip Module Packages |
|
|
18 | (1) |
|
|
19 | (1) |
|
|
20 | (9) |
|
|
29 | (2) |
|
|
31 | (1) |
|
|
31 | (3) |
|
|
33 | (1) |
|
|
33 | (1) |
|
|
34 | (2) |
|
Plastic Molding Compounds |
|
|
34 | (1) |
|
Other Plastic Encapsulation Methods |
|
|
35 | (1) |
|
Plastic versus Hermetic Packages |
|
|
36 | (6) |
|
|
36 | (1) |
|
|
37 | (1) |
|
|
37 | (1) |
|
|
38 | (2) |
|
|
40 | (2) |
|
|
42 | (1) |
|
|
42 | (5) |
|
|
43 | (4) |
|
Plastic Encapsulant Materials |
|
|
47 | (82) |
|
|
47 | (9) |
|
|
49 | (3) |
|
|
52 | (1) |
|
|
52 | (2) |
|
|
54 | (2) |
|
|
56 | (33) |
|
|
57 | (3) |
|
Curing Agents or Hardeners |
|
|
60 | (6) |
|
|
66 | (1) |
|
|
66 | (7) |
|
|
73 | (1) |
|
|
73 | (3) |
|
|
76 | (1) |
|
|
77 | (1) |
|
|
78 | (1) |
|
|
78 | (1) |
|
Market Conditions and Manufacturers of Encapsulant Materials |
|
|
79 | (2) |
|
Material Properties of Commercially Available Molding Compounds |
|
|
81 | (1) |
|
|
82 | (1) |
|
|
82 | (1) |
|
|
82 | (4) |
|
|
86 | (3) |
|
|
89 | (1) |
|
Potting and Casting Encapsulants |
|
|
90 | (5) |
|
|
90 | (1) |
|
General Electric Materials |
|
|
91 | (4) |
|
|
95 | (6) |
|
|
101 | (1) |
|
Environmentally Friendly or ``Green'' Encapsulants |
|
|
102 | (20) |
|
|
102 | (5) |
|
Green Encapsulant Material Development |
|
|
107 | (4) |
|
Green Materials with Non-Halogenated Flame Retardants |
|
|
111 | (5) |
|
Green Materials without Flame Retardants |
|
|
116 | (6) |
|
|
122 | (7) |
|
|
122 | (7) |
|
Encapsulation Process Technology |
|
|
129 | (52) |
|
|
129 | (18) |
|
|
129 | (2) |
|
|
131 | (5) |
|
|
136 | (5) |
|
|
141 | (2) |
|
|
143 | (1) |
|
Reaction-Injection Molding |
|
|
144 | (1) |
|
|
145 | (1) |
|
Comparison of Molding Processes |
|
|
146 | (1) |
|
|
147 | (4) |
|
Potting and Casting Technology |
|
|
151 | (3) |
|
|
152 | (1) |
|
|
153 | (1) |
|
|
154 | (3) |
|
Conventional Flow Underfill |
|
|
155 | (2) |
|
|
157 | (1) |
|
Printing Encapsulation Technology |
|
|
157 | (2) |
|
Encapsulation of 2D Wafer-Level Packages |
|
|
159 | (2) |
|
Encapsulation of 3D Packages |
|
|
161 | (8) |
|
Cleaning and Surface Preparation |
|
|
169 | (6) |
|
|
169 | (4) |
|
|
173 | (2) |
|
|
175 | (6) |
|
|
176 | (5) |
|
Characterization of Encapsulant Properties |
|
|
181 | (44) |
|
|
181 | (8) |
|
|
181 | (2) |
|
|
183 | (1) |
|
|
184 | (1) |
|
Rheological Compatibility |
|
|
184 | (1) |
|
|
185 | (2) |
|
Curing Time and Temperature |
|
|
187 | (1) |
|
|
188 | (1) |
|
Post-cure Time and Temperature |
|
|
189 | (1) |
|
Hygro-thermomechanical Properties |
|
|
189 | (25) |
|
Coefficient of Thermal Expansion and Glass Transition Temperature |
|
|
189 | (6) |
|
|
195 | (2) |
|
Flexural Strength and Modulus |
|
|
197 | (1) |
|
Tensile Strength, Elastic and Shear Modulus, and %Elongation |
|
|
198 | (2) |
|
|
200 | (3) |
|
Moisture Content and Diffusion Coefficient |
|
|
203 | (1) |
|
|
204 | (2) |
|
|
206 | (2) |
|
Coefficient of Hygroscopic Expansion |
|
|
208 | (3) |
|
|
211 | (1) |
|
|
212 | (2) |
|
|
214 | (2) |
|
|
216 | (2) |
|
Ionic Impurity (Contamination Level) |
|
|
216 | (1) |
|
Ion Diffusion Coefficient |
|
|
217 | (1) |
|
Flammability and Oxygen Index |
|
|
218 | (1) |
|
|
218 | (7) |
|
|
220 | (5) |
|
Encapsulation Defects and Failures |
|
|
225 | (62) |
|
Overview of Package Defects and Failures |
|
|
225 | (11) |
|
|
225 | (1) |
|
|
226 | (2) |
|
Classification of Failure Mechanisms |
|
|
228 | (7) |
|
|
235 | (1) |
|
|
236 | (15) |
|
|
236 | (5) |
|
|
241 | (1) |
|
|
242 | (3) |
|
|
245 | (1) |
|
|
246 | (1) |
|
|
247 | (2) |
|
Non-uniform Encapsulation |
|
|
249 | (1) |
|
|
250 | (1) |
|
|
250 | (1) |
|
|
250 | (1) |
|
|
251 | (17) |
|
|
251 | (7) |
|
Vapor-Induced Cracking (Popcorning) |
|
|
258 | (4) |
|
|
262 | (3) |
|
|
265 | (1) |
|
|
266 | (2) |
|
|
268 | (8) |
|
|
268 | (4) |
|
|
272 | (1) |
|
Exposure to Contaminants and Solvents |
|
|
273 | (1) |
|
|
274 | (1) |
|
General Environmental Stress |
|
|
275 | (1) |
|
Manufacturing and Assembly Loads |
|
|
276 | (1) |
|
Combined Load-Stress Conditions |
|
|
276 | (1) |
|
|
276 | (11) |
|
|
277 | (10) |
|
Defect and Failure Analysis Techniques for Encapsulated Microelectronics |
|
|
287 | (64) |
|
General Defect and Failure Analysis Procedures |
|
|
287 | (11) |
|
|
288 | (1) |
|
Non-destructive Evaluation |
|
|
288 | (1) |
|
|
289 | (1) |
|
Analytical Testing of the Encapsulant Material |
|
|
289 | (1) |
|
Decapsulation (Removal of the Encapsulant) |
|
|
290 | (6) |
|
|
296 | (1) |
|
|
297 | (1) |
|
Locating the Failure Site and Identifying the Failure Mechanism |
|
|
297 | (1) |
|
|
297 | (1) |
|
|
298 | (3) |
|
Scanning Acoustic Microscopy |
|
|
301 | (20) |
|
|
302 | (1) |
|
C-Mode Scanning Acoustic Microscope |
|
|
302 | (8) |
|
Scanning Laser Acoustic Microscope |
|
|
310 | (2) |
|
|
312 | (1) |
|
C-mode Imaging of Delaminations in a 40-Pin PDIP |
|
|
312 | (1) |
|
Rapid Screening for Defects Using THRU-Scan™ Imaging |
|
|
313 | (4) |
|
Non-destructive Cross-Section Analysis of Plastic-Encapsulated Devices Using Q-BAM™ and TOF Imaging |
|
|
317 | (1) |
|
Production Rate Screening Using Tray-Scan Imaging |
|
|
318 | (1) |
|
Molding Compound Characterization |
|
|
319 | (2) |
|
|
321 | (10) |
|
X-ray Generation and Absorption |
|
|
322 | (3) |
|
|
325 | (2) |
|
X-ray Projection Microscope |
|
|
327 | (1) |
|
High-Resolution Scanning X-ray Diffraction Microscope |
|
|
328 | (1) |
|
Case Study: Encapsulation in Plastic-Encapsulated Devices |
|
|
329 | (2) |
|
X-ray Fluorescence Spectroscopy |
|
|
331 | (1) |
|
|
332 | (10) |
|
Electron-Specimen Interaction |
|
|
333 | (2) |
|
Scanning Electron Microscopy |
|
|
335 | (2) |
|
Environmental Scanning Electron Microscopy (ESEM) |
|
|
337 | (2) |
|
Transmission Electron Microscopy |
|
|
339 | (3) |
|
|
342 | (1) |
|
|
342 | (2) |
|
Selection of Failure Analysis Techniques |
|
|
344 | (4) |
|
|
348 | (3) |
|
|
349 | (2) |
|
Qualification and Quality Assurance |
|
|
351 | (66) |
|
A Brief History of Qualification and Reliability Assessment |
|
|
352 | (4) |
|
Qualification Process Overview |
|
|
356 | (5) |
|
|
361 | (10) |
|
|
363 | (3) |
|
|
366 | (1) |
|
|
367 | (1) |
|
Reliability Prediction using PoF Approach |
|
|
367 | (2) |
|
Failure Modes, Mechanisms, and Effects Analysis (FMMEA) |
|
|
369 | (2) |
|
|
371 | (12) |
|
Strength Limits and Highly Accelerated Life Test |
|
|
372 | (2) |
|
Qualification Requirements |
|
|
374 | (3) |
|
Qualification Test Planning |
|
|
377 | (1) |
|
|
378 | (1) |
|
|
378 | (4) |
|
|
382 | (1) |
|
Qualification Accelerated Tests |
|
|
383 | (9) |
|
Steady-State Temperature Test |
|
|
384 | (1) |
|
|
385 | (1) |
|
Tests That Include Humidity |
|
|
386 | (4) |
|
|
390 | (1) |
|
|
391 | (1) |
|
Flammability and Oxygen Index Test |
|
|
391 | (1) |
|
|
391 | (1) |
|
|
392 | (1) |
|
|
392 | (2) |
|
|
394 | (16) |
|
|
399 | (1) |
|
Stress Screening and Burn-In |
|
|
400 | (1) |
|
|
401 | (1) |
|
|
402 | (3) |
|
|
405 | (1) |
|
|
406 | (1) |
|
|
407 | (1) |
|
Statistical Process Control |
|
|
408 | (2) |
|
|
410 | (7) |
|
|
411 | (6) |
|
|
417 | (42) |
|
Microelectronic Device Structure and Packaging |
|
|
417 | (14) |
|
Extreme High-and Low-Temperature Electronics |
|
|
431 | (3) |
|
|
431 | (2) |
|
|
433 | (1) |
|
|
434 | (19) |
|
Microelectromechanical Systems |
|
|
435 | (5) |
|
Bioelectronics, Biosensors, and Bio-MEMS |
|
|
440 | (5) |
|
Nanotechnology and Nanoelectronics |
|
|
445 | (4) |
|
Organic Light-Emitting Diodes, Photovoltaics, and Optoelectronics |
|
|
449 | (4) |
|
|
453 | (6) |
|
|
455 | (4) |
Index |
|
459 | |