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E-book: Encapsulation Technologies for Electronic Applications

(Department of Mechanical Engineering, University of Houston, USA and visiting scholar, Mechanical Engineering and Materials Science Department, Rice University), (CALCE (Center for Advanced Life Cycle Engineering), University of Maryla)
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Electronics are used in a wide range of applications including computing, communication, biomedical, automotive, military and aerospace. They must operate in varying temperature and humidity environments including indoor controlled conditions and outdoor climate changes. Moisture, ionic contamination, heat, radiation and mechanical stresses are all highly detrimental to electronic devices and can lead to device failures. Therefore, it is essential that the electronic devices be packaged for protection from their intended environments, as well as to provide handling, assembly, electrical and thermal considerations.

Currently, more than 99% of microelectronic devices are plastic encapsulated. Improvements in encapsulant materials, and cost incentives have stretched the application boundaries for plastic electronic packages. Many electronic applications that traditionally used hermetic packages such as military are now using commercial-off-the-shelf (COTS) plastic packages. Plastic encapsulation has the advantages of low cost, smaller form factors, and improved manufacturability.

With recent trends in environmental awareness, new environmentally friendly or ' green' encapsulant materials (i.e. without brominated additives) have emerged. Plastic packages are also being considered for use in extreme high and low temperature electronics. 3-D packaging and wafer-level-packaging (WLP) require unique encapsulation techniques. Encapsulant materials are also being developed for micro-electro-mechanical systems (MEMS), bio-MEMS, bio-electronics, and organic light-emitting diodes (O-LEDs).

This book offers a comprehensive discussion of encapsulants in electronic applications. The main emphasis is on the encapsulation of microelectronic devices; however, the encapsulation of connectors and transformers is also addressed. This book discusses 2-D and 3-D packaging and encapsulation, encapsulation materials including environmentally friendly 'green' encapsulants, and the properties and characterization of encapsulants. Furthermore, this book provides an extensive discussion on defects and failures related to encapsulation, how to analyze such defects and failures, and how to apply quality assurance and qualification process for encapsulated packages. This book also provides information on the trends and challenges of encapsulation and microelectronic packages including application of nanotechnology.

• Guidance on the selection and use of encapsulants in the electronics industry, with a particular focus on microelectronics • Coverage of environmentally friendly 'green encapsulants' • Practical coverage of faults and defects: how to analyze them and how to avoid them

 



Electronics are used in a wide range of applications including computing, communication, biomedical, automotive, military and aerospace. They must operate in varying temperature and humidity environments including indoor controlled conditions and outdoor climate changes. Moisture, ionic contamination, heat, radiation and mechanical stresses are all highly detrimental to electronic devices and can lead to device failures. Therefore, it is essential that the electronic devices be packaged for protection from their intended environments, as well as to provide handling, assembly, electrical and thermal considerations.

Currently, more than 99% of microelectronic devices are plastic encapsulated. Improvements in encapsulant materials, and cost incentives have stretched the application boundaries for plastic electronic packages. Many electronic applications that traditionally used hermetic packages such as military are now using commercial-off-the-shelf (COTS) plastic packages. Plastic encapsulation has the advantages of low cost, smaller form factors, and improved manufacturability.

With recent trends in environmental awareness, new environmentally friendly or ' green' encapsulant materials (i.e. without brominated additives) have emerged. Plastic packages are also being considered for use in extreme high and low temperature electronics. 3-D packaging and wafer-level-packaging (WLP) require unique encapsulation techniques. Encapsulant materials are also being developed for micro-electro-mechanical systems (MEMS), bio-MEMS, bio-electronics, and organic light-emitting diodes (O-LEDs).

This book offers a comprehensive discussion of encapsulants in electronic applications. The main emphasis is on the encapsulation of microelectronic devices; however, the encapsulation of connectors and transformers is also addressed. This book discusses 2-D and 3-D packaging and encapsulation, encapsulation materials including environmentally friendly 'green' encapsulants, and the properties and characterization of encapsulants. Furthermore, this book provides an extensive discussion on defects and failures related to encapsulation, how to analyze such defects and failures, and how to apply quality assurance and qualification process for encapsulated packages. This book also provides information on the trends and challenges of encapsulation and microelectronic packages including application of nanotechnology.

• Guidance on the selection and use of encapsulants in the electronics industry, with a particular focus on microelectronics
• Coverage of environmentally friendly 'green encapsulants'
• Practical coverage of faults and defects: how to analyze them and how to avoid them

More info

All manufactured electronic components and products require the selection and use of encapsulants, which provide insulation and protection to the otherwise delicate parts of a circuit
Preface xv
Introduction
1(46)
Historical Overview
2(5)
Electronic Packaging
7(4)
Encapsulated Microelectronic Packages
11(20)
2D Packages
12(1)
Through-Hole Mounted Packages
12(2)
Surface-Mounted Packages
14(3)
Substrate Packages
17(1)
Multi-Chip Module Packages
18(1)
3D Packages
19(1)
Stacked Die
20(9)
Stacked Packages
29(2)
Folded Packages
31(1)
Hermetic Packages
31(3)
Metal Packages
33(1)
Ceramic Packages
33(1)
Encapsulants
34(2)
Plastic Molding Compounds
34(1)
Other Plastic Encapsulation Methods
35(1)
Plastic versus Hermetic Packages
36(6)
Size and Weight
36(1)
Performance
37(1)
Cost
37(1)
Hermeticity
38(2)
Reliability
40(2)
Availability
42(1)
Summary
42(5)
References
43(4)
Plastic Encapsulant Materials
47(82)
Chemistry Overview
47(9)
Epoxies
49(3)
Silicones
52(1)
Polyurethanes
52(2)
Phenolics
54(2)
Molding Compounds
56(33)
Resins
57(3)
Curing Agents or Hardeners
60(6)
Accelerators
66(1)
Fillers
66(7)
Coupling Agents
73(1)
Stress-Relief Additives
73(3)
Flame Retardants
76(1)
Mold-Release Agents
77(1)
Ion-Trapping Agents
78(1)
Coloring Agents
78(1)
Market Conditions and Manufacturers of Encapsulant Materials
79(2)
Material Properties of Commercially Available Molding Compounds
81(1)
Nitto Denko
82(1)
Sumitomo Bakelite
82(1)
Plaskon
82(4)
Materials Development
86(3)
Glob-Top Encapsulants
89(1)
Potting and Casting Encapsulants
90(5)
Dow Corning Materials
90(1)
General Electric Materials
91(4)
Underfill Encapsulants
95(6)
Printing Encapsulants
101(1)
Environmentally Friendly or ``Green'' Encapsulants
102(20)
Toxic Flame Retardants
102(5)
Green Encapsulant Material Development
107(4)
Green Materials with Non-Halogenated Flame Retardants
111(5)
Green Materials without Flame Retardants
116(6)
Summary
122(7)
References
122(7)
Encapsulation Process Technology
129(52)
Molding Technology
129(18)
Transfer Molding
129(2)
Molding Equipment
131(5)
Transfer Molding Process
136(5)
Molding Simulation
141(2)
Injection Molding
143(1)
Reaction-Injection Molding
144(1)
Compression Molding
145(1)
Comparison of Molding Processes
146(1)
Glob-Topping Technology
147(4)
Potting and Casting Technology
151(3)
One-Part Encapsulants
152(1)
Two-Part Encapsulants
153(1)
Underfilling Technology
154(3)
Conventional Flow Underfill
155(2)
No-flow Underfill
157(1)
Printing Encapsulation Technology
157(2)
Encapsulation of 2D Wafer-Level Packages
159(2)
Encapsulation of 3D Packages
161(8)
Cleaning and Surface Preparation
169(6)
Plasma Cleaning
169(4)
Deflashing
173(2)
Summary
175(6)
References
176(5)
Characterization of Encapsulant Properties
181(44)
Manufacturing Properties
181(8)
Spiral Flow Length
181(2)
Gelation Time
183(1)
Bleed and Flash
184(1)
Rheological Compatibility
184(1)
Polymerization Rate
185(2)
Curing Time and Temperature
187(1)
Hot Hardness
188(1)
Post-cure Time and Temperature
189(1)
Hygro-thermomechanical Properties
189(25)
Coefficient of Thermal Expansion and Glass Transition Temperature
189(6)
Thermal Conductivity
195(2)
Flexural Strength and Modulus
197(1)
Tensile Strength, Elastic and Shear Modulus, and %Elongation
198(2)
Adhesion Strength
200(3)
Moisture Content and Diffusion Coefficient
203(1)
Fickian Diffusion
204(2)
Non-Fickian Diffusion
206(2)
Coefficient of Hygroscopic Expansion
208(3)
Gas Permeability
211(1)
Outgassing
212(2)
Electrical Properties
214(2)
Chemical Properties
216(2)
Ionic Impurity (Contamination Level)
216(1)
Ion Diffusion Coefficient
217(1)
Flammability and Oxygen Index
218(1)
Summary
218(7)
References
220(5)
Encapsulation Defects and Failures
225(62)
Overview of Package Defects and Failures
225(11)
Package Defects
225(1)
Package Failures
226(2)
Classification of Failure Mechanisms
228(7)
Contributing Factors
235(1)
Encapsulation Defects
236(15)
Wire Sweep
236(5)
Paddle Shift
241(1)
Warpage
242(3)
Die Cracking
245(1)
Delamination
246(1)
Voids
247(2)
Non-uniform Encapsulation
249(1)
Flash
250(1)
Foreign Particles
250(1)
Incomplete Cure
250(1)
Encapsulation Failures
251(17)
Delamination
251(7)
Vapor-Induced Cracking (Popcorning)
258(4)
Brittle Fracture
262(3)
Ductile Fracture
265(1)
Fatigue Fracture
266(2)
Failure Accelerators
268(8)
Moisture
268(4)
Temperature
272(1)
Exposure to Contaminants and Solvents
273(1)
Residual Stresses
274(1)
General Environmental Stress
275(1)
Manufacturing and Assembly Loads
276(1)
Combined Load-Stress Conditions
276(1)
Summary
276(11)
References
277(10)
Defect and Failure Analysis Techniques for Encapsulated Microelectronics
287(64)
General Defect and Failure Analysis Procedures
287(11)
Electrical Testing
288(1)
Non-destructive Evaluation
288(1)
Destructive Evaluation
289(1)
Analytical Testing of the Encapsulant Material
289(1)
Decapsulation (Removal of the Encapsulant)
290(6)
Internal Examination
296(1)
Selective Layer Removal
297(1)
Locating the Failure Site and Identifying the Failure Mechanism
297(1)
Simulation Testing
297(1)
Optical Microscopy
298(3)
Scanning Acoustic Microscopy
301(20)
Imaging Modes
302(1)
C-Mode Scanning Acoustic Microscope
302(8)
Scanning Laser Acoustic Microscope
310(2)
Case Studies
312(1)
C-mode Imaging of Delaminations in a 40-Pin PDIP
312(1)
Rapid Screening for Defects Using THRU-Scan™ Imaging
313(4)
Non-destructive Cross-Section Analysis of Plastic-Encapsulated Devices Using Q-BAM™ and TOF Imaging
317(1)
Production Rate Screening Using Tray-Scan Imaging
318(1)
Molding Compound Characterization
319(2)
X-ray Microscopy
321(10)
X-ray Generation and Absorption
322(3)
X-ray Contact Microscope
325(2)
X-ray Projection Microscope
327(1)
High-Resolution Scanning X-ray Diffraction Microscope
328(1)
Case Study: Encapsulation in Plastic-Encapsulated Devices
329(2)
X-ray Fluorescence Spectroscopy
331(1)
Electron Microscopy
332(10)
Electron-Specimen Interaction
333(2)
Scanning Electron Microscopy
335(2)
Environmental Scanning Electron Microscopy (ESEM)
337(2)
Transmission Electron Microscopy
339(3)
Atomic Force Microscopy
342(1)
Infrared Microscopy
342(2)
Selection of Failure Analysis Techniques
344(4)
Summary
348(3)
References
349(2)
Qualification and Quality Assurance
351(66)
A Brief History of Qualification and Reliability Assessment
352(4)
Qualification Process Overview
356(5)
Virtual Qualification
361(10)
Life-Cycle Loads
363(3)
Product Characteristics
366(1)
Application Requirements
367(1)
Reliability Prediction using PoF Approach
367(2)
Failure Modes, Mechanisms, and Effects Analysis (FMMEA)
369(2)
Product Qualification
371(12)
Strength Limits and Highly Accelerated Life Test
372(2)
Qualification Requirements
374(3)
Qualification Test Planning
377(1)
Modeling and Validation
378(1)
Accelerated Testing
378(4)
Reliability Assessment
382(1)
Qualification Accelerated Tests
383(9)
Steady-State Temperature Test
384(1)
Thermal Cycling Test
385(1)
Tests That Include Humidity
386(4)
Solvent Resistance Test
390(1)
Salt Atmosphere Test
391(1)
Flammability and Oxygen Index Test
391(1)
Solderability
391(1)
Radiation Hardness
392(1)
Industry Practices
392(2)
Quality Assurance
394(16)
Screening Overview
399(1)
Stress Screening and Burn-In
400(1)
Screen Selection
401(1)
Screen Stress Levels
402(3)
Screen Duration
405(1)
Root-Cause Analysis
406(1)
Economy of Screening
407(1)
Statistical Process Control
408(2)
Summary
410(7)
References
411(6)
Trends and Challenges
417(42)
Microelectronic Device Structure and Packaging
417(14)
Extreme High-and Low-Temperature Electronics
431(3)
High Temperatures
431(2)
Low Temperatures
433(1)
Emerging Technologies
434(19)
Microelectromechanical Systems
435(5)
Bioelectronics, Biosensors, and Bio-MEMS
440(5)
Nanotechnology and Nanoelectronics
445(4)
Organic Light-Emitting Diodes, Photovoltaics, and Optoelectronics
449(4)
Summary
453(6)
References
455(4)
Index 459
Dr. Haleh Ardebili has a BS honors degree in Engineering Science and Mechanics from Pennsylvania State University at University Park, MS degree in Mechanical Engineering from Johns Hopkins University and PhD degree in Mechanical Engineering from University of Maryland at College Park. She has three years of industry experience as research scientist at General Electric Global Research Center at Niskayuna, New York. She is a recipient of GE Invention Fulcrum of Progress Award. She has several years of experience teaching engineering courses at University of Houston. In Sep 2010, she joined as Assistant Professor in the Mechanical Engineering Department at University of Houston. Her research work is mainly focused on nanomaterials for Energy Storage and Electronics. He is the founder and director of CALCE (Center for Advanced Life Cycle Engineering) at the University of Maryland, which is funded by over 150 of the worlds leading electronics companies at more than US$6M/year. He is a Professional Engineer, an IEEE Fellow, an ASME Fellow, an SAE Fellow, and an IMAPS Fellow. He is currently serving as editor-in-chief of Circuit World. He served as editor-in-chief of IEEE Access for 6 years, as editor-in-chief of IEEE Transactions on Reliability for 9 years, and as editor-in-chief of Microelectronics Reliability for 16 years. He has also served on three U.S. National Academy of Science studies, two U.S. Congressional investigations in automotive safety, and as an expert to the U.S. FDA. He is also a Chair Professor. He consults for 22 major international electronics companies, providing expertise in strategic planning, design, test, prognostics, IP and risk assessment of electronic products and systems.