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E-book: Reliability Characterisation of Electrical and Electronic Systems

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This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices.

The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications.

  • Takes a holistic approach to reliability engineering
  • Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability
  • Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation

Reviews

"One chapter stands out in the book Reliability Characterization of Electrical and Electronic Systems, edited by Jonathan Swingler. That chapter is 'Reliability and Stupidity: Mistakes in Reliability Engineering and How to Avoid Them,"...Following are excerpts from that chapter." --Power Electronics

More info

A holistic approach to reliability engineering for electrical and electronic systems, looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices
List of contributors
ix
Woodhead Publishing Series in Electronic and Optical Materials xi
Foreword xv
1 Introduction
1(10)
J. Swingler
1.1 Introduction
1(1)
1.2 The focus of the book
1(2)
1.3 Reliability science and engineering fundamentals (Chapters 2--4)
3(3)
1.4 Reliability methods in component and system development (Chapters 5--9)
6(2)
1.5 Reliability modelling and testing in specific applications (Chapters 10 and 11)
8(1)
1.6 Conclusion
9(2)
References
10(1)
2 Reliability and stupidity: mistakes in reliability engineering and how to avoid them
11(16)
R.W.A. Barnard
2.1 Introduction
11(1)
2.2 Common mistakes in reliability engineering
12(12)
2.3 Conclusion
24(3)
References
24(3)
3 Physics-of-failure (PoF) methodology for electronic reliability
27(16)
C. Hendricks
E. George
M. Osterman
M. Pecht
3.1 Introduction
27(1)
3.2 Reliability
27(2)
3.3 PoF models
29(3)
3.4 PoF reliability assessment
32(2)
3.5 Applications of PoF to ensure reliability
34(3)
3.6 Summary and areas of future interest
37(6)
References
38(5)
4 Modern instruments for characterizing degradation in electrical and electronic equipment
43(20)
P.D. Goodman
R. Skipper
N. Aitken
4.1 Introduction
43(1)
4.2 Destructive techniques
43(9)
4.3 Nondestructive techniques
52(5)
4.4 In situ measurement techniques
57(4)
4.5 Conclusions
61(2)
References
62(1)
5 Reliability building of discrete electronic components
63(20)
T.-M.I. Bajenescu
M.I. Bazu
5.1 Introduction
63(1)
5.2 Reliability building
63(4)
5.3 Failure risks and possible corrective actions
67(11)
5.4 Effect of electrostatic discharge on discrete electronic components
78(1)
5.5 Conclusions
79(4)
References
79(4)
6 Reliability of optoelectronics
83(32)
J.-S. Huang
6.1 Introduction
83(1)
6.2 Overview of optoelectronics reliability
84(1)
6.3 Approaches and recent developments
85(5)
6.4 Case study: reliability of buried heterostructure (BH) InP semiconductor lasers
90(8)
6.5 Reliability extrapolation and modeling
98(3)
6.6 Electrostatic discharge (ESD) and electrical overstress (EOS)
101(8)
6.7 Conclusions
109(6)
References
110(5)
7 Reliability of silicon integrated circuits
115(28)
A.S. Oates
7.1 Introduction
115(1)
7.2 Reliability characterization approaches
116(2)
7.3 Integrated circuit (IC) wear-out failure mechanisms
118(15)
7.4 Summary and conclusions
133(10)
Acknowledgments
135(1)
References
135(8)
8 Reliability of emerging nanodevices
143(26)
N. Raghavan
K.L. Pey
8.1 Introduction to emerging nanodevices
143(3)
8.2 Material and architectural evolution of nanodevices
146(2)
8.3 Failure mechanisms in nanodevices
148(12)
8.4 Reliability challenges: opportunities and issues
160(3)
8.5 Summary and conclusions
163(6)
References
163(6)
9 Design considerations for reliable embedded systems
169(26)
R.A. Shafik
A. Das
S. Yang
G. Merrett
B.M. Al-Hashimi
9.1 Introduction
169(1)
9.2 Hardware faults
170(3)
9.3 Reliable design principles
173(7)
9.4 Low-cost reliable design
180(7)
9.5 Future research directions
187(3)
9.6 Conclusions
190(5)
References
190(5)
10 Reliability approaches for automotive electronic systems
195(20)
D. Medhat
10.1 Introduction
195(1)
10.2 Circuit reliability challenges for the automotive industry
195(1)
10.3 Circuit reliability checking for the automotive industry
196(4)
10.4 Using advanced electronic design automation (EDA) tools
200(8)
10.5 Case studies and examples
208(4)
10.6 Conclusion
212(3)
Acknowledgment
212(1)
References
212(3)
11 Reliability modeling and accelerated life testing for solar power generation systems
215(36)
F. Schenkelberg
11.1 Introduction
215(1)
11.2 Overview
215(3)
11.3 Challenges
218(4)
11.4 Modeling
222(4)
11.5 Accelerated life testing (ALT)
226(12)
11.6 ALT example: how to craft a thermal cycling ALT plan for SnAgCu (SAC) solder failure mechanism
238(5)
11.7 How to craft a temperature, humidity, and bias ALT plan for CMOS metallization corrosion
243(4)
11.8 Developments and opportunities
247(1)
11.9 Conclusions
248(1)
11.10 Sources of further information
248(3)
References
248(3)
Index 251
Jonathan Swingler is Senior Lecturer in Energy at Heriott-Watt University within the School of Engineering and Physical Sciences (Electrical Engineering). His work is primarily focused on electrical contacts and interconnecting in automotive and aerospace systems.
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