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E-book: Integrated Circuit Quality and Reliability

(Encinitas, California, USA)
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This revised and expanded reference-text examines all important aspects of integrated circuit (IC) design, fabrication, assembly, and test processes as they relate to quality and reliability providing a complete treatment of the causes of error in ICs, showing how they alter the finished product, and how to prevent their occurrence. This edition is updated and reorganized to reflect the changes that have taken place and add to the original baseline and tool set established in the first edition. Annotation copyright Book News, Inc. Portland, Or.

Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

Reviews

"The new edition brings the baseline IC technology and tool set up to date. . ..it covers all the material in more depth than the first edition. . .. . . .a good tutorial on IC fabrication and packaging, including quality concerns. . .. Excellent chapters on design, fabrication, packaging, and test put today's engineer in a good position to understand the impact of contamination and manufacturing errors on their IC products. " ---IEEE Components, Packaging, and Manufacturing Technology Society Newsletter

Overview. Part 1 Introduction to integrated circuit manufacturing processes: front-end IC fabrication operations; back-end fabrication operations; in-line process monitors and test structures. Part 2 Impact of new technologies: circuit design trends; changing fabrication techniques; packaging technology trends; electrical testing of VLSICs and ASICs. Part 3 Contamination and manufacturing errors: contamination; human contamination (people); IC processing contamination; contamination control; computer-based sources of error in design and test circuit design; material issues. Part 4 Causes (sources) of IC failures: fabrication-related causes of defects; packaging and assembly related causes of IC failures; reliability improvement. Part 5 Introduction to screening: screening.
Hnatek, Eugene R.
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