(Ilmumisaeg: 30-Dec-2019, Hardback, Kirjastus: A S M International, ISBN-13: 9781627082457)
The 51 papers in the collection describe the chip failure analysis process, incoming inspection tools, fault isolation techniques, circuit characterization, physical analysis options, and memory failure analysis. Special applications of failure a...Loe edasi...
Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can...Loe edasi...
(Ilmumisaeg: 08-Dec-2017, Hardback, Kirjastus: Springer International Publishing AG, ISBN-13: 9783319668598)
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Now in a second, updated edition, this detailed description of basic semiconductor physics covers a wide range of important phenomena in semiconductors, from the simple to the advanced, and includes an essential new chapter on semiconductor lasers...Loe edasi...
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Integrated computational materials engineering (ICME) is a specialty within material science and engineering, and the 15 papers here explore some of its constituent parts. The topics include the four foundational groups required for a successful ICME...Loe edasi...
(Ilmumisaeg: 06-Jul-2011, Other digital carrier, Kirjastus: John Wiley & Sons Inc, ISBN-13: 9781119997290)
Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS...Loe edasi...
Editors Fleetwood (electrical engineering and computer science, Vanderbilt U.), Pantelides (physics, Vanderbilt U.) and Schrimpf (electrical engineering, Vanderbilt U.) have assembled this textbook on defects and damage detection in MOSFET technologi...Loe edasi...
For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job...Loe edasi...
Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/...Loe edasi...
A compact compendium of information and techniques designed to address many of the varied subjects of concern to failure analysis. The volume is divided into sections devoted to failure analysis procedures and overview, electrical and mechanical char...Loe edasi...
(Ilmumisaeg: 24-Sep-1991, Hardback, Kirjastus: John Wiley & Sons Ltd, ISBN-13: 9780471917137)
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Presents a comprehensive survey of analytical techniques currently used in support of all stages of microelectronic materials and device processing. The diversity of topics covered has been achieved by bringing together an international field of aut...Loe edasi...
