Muutke küpsiste eelistusi

E-raamat: Advanced Instrumentation and Computer I/O Design: Defined Accuracy Decision, Control, and Process Applications

(The University of Cincinnati)
  • Formaat: EPUB+DRM
  • Ilmumisaeg: 19-Mar-2013
  • Kirjastus: Wiley-IEEE Press
  • Keel: eng
  • ISBN-13: 9781118504796
Teised raamatud teemal:
  • Formaat - EPUB+DRM
  • Hind: 104,91 €*
  • * hind on lõplik, st. muud allahindlused enam ei rakendu
  • Lisa ostukorvi
  • Lisa soovinimekirja
  • See e-raamat on mõeldud ainult isiklikuks kasutamiseks. E-raamatuid ei saa tagastada.
  • Formaat: EPUB+DRM
  • Ilmumisaeg: 19-Mar-2013
  • Kirjastus: Wiley-IEEE Press
  • Keel: eng
  • ISBN-13: 9781118504796
Teised raamatud teemal:

DRM piirangud

  • Kopeerimine (copy/paste):

    ei ole lubatud

  • Printimine:

    ei ole lubatud

  • Kasutamine:

    Digitaalõiguste kaitse (DRM)
    Kirjastus on väljastanud selle e-raamatu krüpteeritud kujul, mis tähendab, et selle lugemiseks peate installeerima spetsiaalse tarkvara. Samuti peate looma endale  Adobe ID Rohkem infot siin. E-raamatut saab lugeda 1 kasutaja ning alla laadida kuni 6'de seadmesse (kõik autoriseeritud sama Adobe ID-ga).

    Vajalik tarkvara
    Mobiilsetes seadmetes (telefon või tahvelarvuti) lugemiseks peate installeerima selle tasuta rakenduse: PocketBook Reader (iOS / Android)

    PC või Mac seadmes lugemiseks peate installima Adobe Digital Editionsi (Seeon tasuta rakendus spetsiaalselt e-raamatute lugemiseks. Seda ei tohi segamini ajada Adober Reader'iga, mis tõenäoliselt on juba teie arvutisse installeeritud )

    Seda e-raamatut ei saa lugeda Amazon Kindle's. 

"Advanced Instrumentation & Computer I/O Design, 2nd. Edition, employs comprehensive electronic device and circuit specifications to design custom defined-accuracy sensor instrumentation and computer interfacing systems with definitive accountability to assist critical applications"--

Garrett (electrical and computer engineering, U. of Cincinnati) describes the systematic design of instrumented processes aided by advanced decision-and-control methodologies. He walks through the process from input sensor signal conditioning to output sampled-data linear signal reconstruction designs, at data accuracies of interest. Then he evolves process design methods culminating in a hierarchical subprocess control architecture. His topics include instrumentation amplifiers and parameter errors, filters for measurement signals, data conversion devices and parameters, instrumented processes decision and control, and process automation applications. Annotation ©2013 Book News, Inc., Portland, OR (booknews.com)

Advanced Instrumentation & Computer I/O Design, 2nd Edition, employs comprehensive electronic device and circuit specifications to design custom defined-accuracy sensor instrumentation and computer interfacing systems with definitive accountability to assist critical applications. These real-world electrical engineering designs are required by broad users from industrial enterprises to basic research institutions and government laboratories. The initial six chapters develop sensor-amplifier-filter signal conditioning design methods, enabled by device and system mathematical models, to achieve conditioned signal accuracies of interest and follow-on computer data conversion and reconstruction functions. Chapter 7 integrates the preceding chapters to provide complete automated system design analyses employing the Analysis Suite computer-assisted engineering spreadsheet. Chapters 8 and 9 then develop an extension of these performance accountability methods coordinated with versatile and evolving hierarchical subprocess and control architectures, to overcome difficult contemporary process automation challenges combining both quantitative and qualitative methods. Chapter 10 concludes this book with a taxonomy of computer interfaces and standards including telemetry, virtual, and analytical instrumentation. End-of-chapter problems provide enhanced educational value.
Preface
1 Thermal, Mechanical, Quantum, and Analytical Sensors
1(28)
1-0 Introduction
1(1)
1-1 Instrumentation Error Interpretation
1(3)
1-2 Temperature Sensors
4(3)
1-3 Mechanical Sensors
7(6)
1-4 Quantum Sensors
13(5)
1-5 Analytical Sensors
18(11)
Problems
25(2)
Bibliography
27(2)
2 Instrumentation Amplifiers and Parameter Errors
29(24)
2-0 Introduction
29(1)
2-1 Device Temperature Characteristics
30(1)
2-2 Differential Amplifiers
31(4)
2-3 Operational Amplifiers
35(4)
2-4 Instrumentation Amplifiers
39(8)
2-5 Amplifier Parameter Error Evaluation
47(6)
Problems
50(1)
Bibliography
51(2)
3 Filters for Measurement Signals
53(32)
3-0 Introduction
53(1)
3-1 Bandlimiting Instrumentation Filters
53(5)
3-2 Active Filter Design
58(10)
3-3 Filter Error Evaluation
68(5)
3-4 Bandpass Instrumentation Filters
73(12)
Problems
82(1)
Bibliography
83(2)
4 Signal Conditioning Design and Instrumentation Errors
85(24)
4-0 Introduction
85(1)
4-1 Low-Level Signal Acquisition
85(4)
4-2 Signal Quality in Random And Coherent Interference
89(6)
4-3 DC, Sinusoidal, and Harmonic Signal Conditioning
95(6)
4-4 Analog Signal Processing
101(8)
Problems
106(2)
Bibliography
108(1)
5 Data Conversion Devices and Parameters
109(30)
5-0 Introduction
109(1)
5-1 Analog Multiplexers
109(3)
5-2 Sample Hold Devices
112(3)
5-3 Digital-to-Analog Converters
115(6)
5-4 Analog-to-Digital Converters
121(18)
Problems
136(1)
Bibliography
136(3)
6 Sampled Data and Reconstruction with Intersample Error
139(30)
6-0 Introduction
139(1)
6-1 Sampled Data Theory
140(4)
6-2 Aliasing of Signal and Noise
144(6)
6-3 Sampled Data Intersample and Aperture Errors
150(6)
6-4 Output Signal Interpolation Functions
156(9)
6-5 Video Sampling and Reconstruction
165(4)
Problems
166(1)
Bibliography
167(2)
7 Instrumentation Analysis Suite, Error Propagation, Sensor Fusion, and Interfaces
169(38)
7-0 Introduction
169(1)
7-1 Aerospace Computer I/O Design With Analysis Suite
169(14)
7-2 Measurement Error Propagation in Example Airflow Process
183(3)
7-3 Homogeneous and Heterogeneous Sensor Fusion
186(6)
7-4 Instrumentation Integration and Interfaces
192(15)
Problems
199(3)
Bibliography
202(1)
Appendix
203(4)
8 Instrumented Processes Decision and Control
207(38)
8-0 Introduction
207(2)
8-1 Process Apparatus Controller Variability and Tuning
209(11)
8-2 Model Reference to Remodeling Adaptive Control
220(9)
8-3 Empirical to Intelligent Process Decision Systems
229(16)
Problems
240(3)
Bibliography
243(2)
9 Process Automation Applications
245(26)
9-0 Introduction
245(1)
9-1 Ashby Map Guided Equiaxed Titanium Forging
246(1)
9-2 Z-Fit Modeled Spectral Control of Exfoliated Nanocomposites
247(3)
9-3 Superconductor Production with Adaptive Decision and Control
250(9)
9-4 Neural Network Attenuated Steel Annealing Hardness Variance
259(4)
9-5 Ultralinear Molecular Beam Epitaxy Flux Calibration
263(8)
Bibliography
269(2)
Index 271
PATRICK H. GARRETT, PhD, P.E., is an Associate Professor of Electrical and Computer Engineering at the University of Cincinnati, where he has developed courses in manufacturing, controls, and process instrumentation. The author of several internationally adopted textbooks on instrumentation and process control, he continues to be involved in long-term research projects, for both government and private sectors, focused on performance advancement of information-intensive real-time systems. A member of the IEEE, Dr. Garrett has been an American Council on Education reviewer, a White House intern, and visiting scientist at the Air Force Materials & Manufacturing Directorate.