Advances in Imaging and Electron Physics, Volume 207, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
| Contributors |
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vii | |
| Preface |
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ix | |
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1 Ultrafast Transmission Electron Microscopy: Historical Development, Instrumentation, and Applications |
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1 | (72) |
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2 | (2) |
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2 Time-Resolved Transmission Electron Microscopy: Timescales and Concepts |
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4 | (10) |
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3 Time-Resolved Transmission Electron Microscopy: Historical Development, Instrumental Aspects |
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14 | (17) |
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4 Applications of Ultrafast Transmission Electron Microscopy |
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31 | (19) |
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5 Toward Time-Resolved Electron Holography with Femtosecond Electron Pulses |
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50 | (9) |
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59 | (14) |
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60 | (1) |
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60 | (13) |
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2 Refinement of Generalized Mean Inequalities and Connections with Divergence Measures |
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73 | (178) |
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74 | (3) |
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2 Combined Means Inequalities |
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77 | (9) |
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86 | (73) |
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4 Three Means Inequalities |
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159 | (64) |
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223 | (24) |
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247 | (4) |
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247 | (4) |
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3 The Optical Transfer Theory of the Electron Microscope: Fundamental Principles and Applications |
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251 | (92) |
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1 The Problem of Image Formation in the Electron Microscope |
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253 | (2) |
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2 Symbols and Definitions; Numerical Data |
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255 | (4) |
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259 | (2) |
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4 The Electron Microscopical Object |
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261 | (16) |
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5 The Formation of the Optical Image |
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277 | (24) |
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6 Contrast by Means of Phase Shift: The Contrast Transfer-Functions for Axial Illumination |
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301 | (20) |
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7 Contrast by Means of Phase Shift: Contrast Transfer Functions for Oblique Illumination |
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321 | (3) |
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8 The Problem of Point Resolution |
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324 | (3) |
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327 | (4) |
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10 Contrast Transfer for Partially Coherent and for Incoherent Illumination |
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331 | (5) |
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336 | (1) |
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337 | (6) |
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338 | (1) |
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338 | (5) |
| Index |
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343 | |
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
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