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E-raamat: Amplitude Modulation Atomic Force Microscopy

  • Formaat: PDF+DRM
  • Ilmumisaeg: 06-Aug-2010
  • Kirjastus: Blackwell Verlag GmbH
  • Keel: eng
  • ISBN-13: 9783527632190
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Amplitude Modulation Atomic Force MicroscopySuurem pilt
  • Formaat: PDF+DRM
  • Ilmumisaeg: 06-Aug-2010
  • Kirjastus: Blackwell Verlag GmbH
  • Keel: eng
  • ISBN-13: 9783527632190
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Filling a gap in the literature, this book features in-depth discussions on amplitude modulation AFM, providing an overview of the theory, instrumental considerations and applications of the technique in both academia and industry. As such, it includes examples from material science, soft condensed matter, molecular biology, and biophysics, among others. The text is written in such a way as to enable readers from different backgrounds and levels of expertise to find the information suitable for their needs.
Preface xi
Annotation List xiii
1 Introduction
1(8)
1.1 Historical Perspective
1(1)
1.2 Evolution Periods and Milestones
2(3)
1.2.1 Early Times (1987-1992)
2(1)
1.2.2 Exploration and Expansion (1993-1999)
3(1)
1.2.3 Cantilever-Tip Dynamics (2000-2006)
4(1)
1.2.4 Multifrequency AFM (2007 to Present)
4(1)
1.3 Tapping Mode or Amplitude Modulation Force Microscopy?
5(1)
1.4 Other Dynamic AFM Methods
6(3)
1.4.1 Frequency Modulation AFM
6(1)
1.4.2 Amplitude Modulation versus Frequency Modulation AFM
6(3)
2 Instrumental and Conceptual Aspects
9(16)
2.1 Introduction
9(1)
2.2 Amplitude Modulation AFM
9(1)
2.3 Elements of an Amplitude Modulation AFM
10(5)
2.3.1 Feedback Controller
10(2)
2.3.2 Optical Beam Deflection
12(1)
2.3.3 Other Detection Methods
13(1)
2.3.4 Tip-Sample Motion System
14(1)
2.3.5 Imaging Acquisition and Display
14(1)
2.4 Cantilever-Tip System
15(4)
2.4.1 Cantilevers
16(1)
2.4.2 Tips
17(1)
2.4.3 Excitation of Cantilever-Tip Oscillations
18(1)
2.5 Calibration Protocols
19(2)
2.5.1 Optical Sensitivity
19(1)
2.5.2 Calibration of the Cantilever Force Constant
20(1)
2.5.2.1 Thermal Noise Method
20(1)
2.5.2.2 Sader Method
21(1)
2.6 Common Experimental Curves
21(2)
2.6.1 Resonance Curves in Air and Liquids
21(2)
2.6.2 Amplitude and Phase Shift Distance Curves
23(1)
2.7 Displacements and Distances
23(2)
3 Tip-Surface Interaction Forces
25(16)
3.1 Introduction
25(1)
3.2 Van der Waals Forces
25(2)
3.3 Contact Mechanics Forces
27(3)
3.3.1 Derjaguin-Muller-Toporov Model
29(1)
3.3.2 Johnson-Kendall-Roberts Model
30(1)
3.4 Capillary Force
30(2)
3.5 Forces in Liquid
32(3)
3.5.1 Electrostatic Double-Layer Force
32(1)
3.5.2 Derjaguin-Landau-Verwey-Overbeek Forces
33(1)
3.5.3 Solvation Forces
34(1)
3.5.4 Other Forces in Aqueous Solutions
35(1)
3.6 Electrostatic Forces
35(1)
3.7 Nonconservative Forces
36(2)
3.8 Net Tip-Surface Force
38(3)
3.8.1 Tip-Surface Force for a Stiff Material with Surface Adhesion Hysteresis
38(1)
3.8.2 Tip-Surface Force for a Viscoelastic Material
39(2)
4 Theory of Amplitude Modulation AFM
41(18)
4.1 Introduction
41(1)
4.2 Equation of Motion
42(1)
4.3 The Point-Mass Model: Elemental Aspects
43(5)
4.3.1 The Harmonic Oscillator
44(2)
4.3.2 Dynamics of a Weakly Perturbed Harmonic Oscillator
46(2)
4.4 The Point-Mass Model: Analytical Approximations
48(4)
4.4.1 Perturbed Harmonic Oscillator
49(1)
4.4.2 Wang Model
50(1)
4.4.3 Virial Dissipation Method
51(1)
4.5 Peak and Average Forces
52(2)
4.5.1 Peak Forces
53(1)
4.5.2 Average Forces
53(1)
4.6 The Point-Mass Model: Numerical Solutions
54(2)
4.6.1 Attractive and Repulsive Interaction Regimes
55(1)
4.6.2 Driving the Cantilever Below Resonance
56(1)
4.7 The Effective Model
56(3)
Appendix: The Runge-Kutta Algorithm
56(3)
5 Advanced Theory of Amplitude Modulation AFM
59(18)
5.1 Introduction
59(1)
5.2 Q-Control
59(3)
5.3 Nonlinear Dynamics
62(2)
5.4 Continuous Cantilever Beam Model
64(3)
5.4.1 One-Dimensional Model
64(3)
5.5 Equivalence between Point-Mass and Continuous Models
67(2)
5.6 Systems Theory Description
69(1)
5.7 Force Reconstruction Methods: Force versus Distance
70(3)
5.7.1 Lee-Jhe Method
70(1)
5.7.2 Holscher Method
71(2)
5.8 Time-Resolved Force
73(4)
5.8.1 Acceleration
74(1)
5.8.2 Higher Harmonics Method
74(2)
5.8.3 Direct Time-Resolved Force Measurements
76(1)
6 Amplitude Modulation AFM in Liquid
77(14)
6.1 Introduction
77(1)
6.2 Qualitative Aspects of the Cantilever Dynamics in Liquid
77(3)
6.2.1 Dynamics Far from the Surface
77(1)
6.2.2 Dynamics Close to the Surface
78(2)
6.3 Interaction Forces in Liquid
80(2)
6.4 Some Experimental and Conceptual Considerations
82(2)
6.5 Theoretical Descriptions of Dynamic AFM in Liquid
84(7)
6.5.1 Analytical Descriptions: Far from the Surface
84(3)
6.5.2 Analytical and Numerical Descriptions in the Presence of Tip-Surface Forces
87(1)
6.5.3 Semianalytical Models
87(2)
6.5.4 Finite Element Simulations
89(2)
7 Phase Imaging Atomic Force Microscopy
91(12)
7.1 Introduction
91(1)
7.2 Phase Imaging Atomic Force Microscopy
91(4)
7.3 Theory of Phase Imaging AFM
95(3)
7.3.1 Phase Imaging Atomic AFM: High Q
95(2)
7.3.2 Phase Imaging AFM: Low Q
97(1)
7.4 Energy Dissipation Measurements at the Nanoscale
98(5)
7.4.1 Energy Dissipation and Observables
98(1)
7.4.2 Identification of Energy Dissipation Processes
99(1)
7.4.3 Atomic and Nanoscale Dissipation Processes
100(3)
8 Resolution, Noise, and Sensitivity
103(14)
8.1 Introduction
103(1)
8.2 Spatial Resolution
103(5)
8.2.1 Vertical Resolution and Noise
104(2)
8.2.2 Lateral Resolution
106(2)
8.3 Image Distortion and Surface Reconstruction
108(1)
8.4 Force-Induced Surface Deformations
109(2)
8.5 Atomic, Molecular, and Subnanometer Lateral Resolution
111(2)
8.5.1 True Resolution
112(1)
8.6 High-Resolution Imaging of Isolated Molecules
113(1)
8.7 Conditions for High-Resolution Imaging
113(1)
8.8 Image Artifacts
114(3)
9 Multifrequency Atomic Force Microscopy
117(12)
9.1 Introduction
117(1)
9.2 Normal Modes and Harmonics
117(5)
9.2.1 Generation of Higher Harmonics
117(3)
9.2.2 Coupling Eigenmodes and Harmonics
120(1)
9.2.3 Imaging Beyond the Fundamental Mode
121(1)
9.3 Bimodal AFM
122(3)
9.3.1 Intermodulation Frequencies
124(1)
9.4 Mode-Synthesizing Atomic Force Microscopy
125(1)
9.5 Torsional Harmonic AFM
126(1)
9.6 Band Excitation
127(2)
10 Beyond Topographic Imaging
129(10)
10.1 Introduction
129(1)
10.2 Scattering Near-Field Optical Microscopy
129(3)
10.3 Topography and Recognition Imaging
132(2)
10.3.1 Tip Functionalization
133(1)
10.4 Nanofabrication by AFM
134(5)
10.4.1 AFM Oxidation Nanolithography
134(2)
10.4.2 Patterning and Devices
136(3)
References 139(36)
Index 175
Ricardo García is Professor at the Instituto de Microelectróni-ca de Madrid (CSIC), one of the Institutes of the Spanish Council for Scienti¿ c Research. He received his PhD degree in physics from the Universidad Autónoma de Madrid in 1990. From 1990 to 1993 he was a post-doctoral associate at the Universities of New Mexico and Oregon. Professor García is author and co-author of 104 articles and 14 book chapters, and has contributed some highly regarded papers on the development and optimization of amplitude modulation AFM (tapping mode AFM) as well as on the emergence of scanning probe nanolithographies. In 2007, Professor García was elected a Fellow of the American Physical Society.
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