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E-raamat: Analog BiCMOS Design: Practices and Pitfalls

(University of Rhode Island, Kingston, Rhode Island, USA), (Clerry Semiconductor, Woonsocket, Rhode Island, USA)
  • Formaat: 232 pages
  • Ilmumisaeg: 08-Oct-2018
  • Kirjastus: CRC Press Inc
  • Keel: eng
  • ISBN-13: 9781351833783
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  • Raamatukogudele
  • Formaat: 232 pages
  • Ilmumisaeg: 08-Oct-2018
  • Kirjastus: CRC Press Inc
  • Keel: eng
  • ISBN-13: 9781351833783
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Offers integrated circuit (IC) design engineers effective methods in design of BiCMOS integrated circuits. Offers complete coverage of basic circuit building blocks, full details of common design pitfalls, and a compendium of design and layout problems and solutions. Contains chapters on devices and device models, current sources, voltage references, amplifiers, comparators, amplifier output stages, and design practices. Daly teaches electrical and computer engineering at the University of Rhode Island. Galipeau is affiliated with Cherry Semiconductor Corp. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Integrated circuits (ICs) don't always work the first time. Many things can and do go wrong in analog circuit designs. There are a number of common errors that often require costly chip redesign and refabrication, all of which can be avoided when designers are aware of the pitfalls. To realize success, IC designers need a complete toolbox-a toolbox filled not only with a solid background in electronics, design concepts and analysis skills, but also with the most valuable tool of all: experience.

Analog BiCMOS Design offers IC design engineers the learning equivalent to decades of practical experience. Culled from the careers of practicing engineers, it presents the most effective methods and the pitfalls most frequently encountered in the design of biCMOS integrated circuits. Accessible to anyone who has taken a course in electronics, this book covers the basic design of bandgap voltage references, current mirrors, amplifiers, and comparators. It reviews common design errors often overlooked and offers design techniques used to remedy those problems.

With its complete coverage of basic circuit building blocks, full details of common design pitfalls, and a compendium of design and layout problems and solutions, Analog BiCMOS Design is the perfect reference for IC designers and engineers, fledgling and experienced alike. Read it to reinforce your background, browse it for ideas on avoiding pitfalls, and when you run into a problem, use it to find a solution.
Devices
1(38)
Introduction
1(1)
Silicon Conductivity
1(8)
Drift Current
4(1)
Energy Bands
4(3)
Sheet Resistance
7(1)
Diffusion Current
8(1)
Pn Junctions
9(8)
Breakdown Voltage
13(1)
Junction Capacitance
14(1)
The Law of the Junction
15(1)
Diffusion Capacitance
16(1)
Diode Current
17(2)
Bipolar Transistors
19(7)
Collector Current
20(1)
Base Current
21(1)
Ebers-Moll Model
22(3)
Breakdown
25(1)
MOS Transistors
26(7)
Simple MOS Model
31(2)
DMOS Transistors
33(1)
Zener Diodes
34(1)
EpiFETs
35(1)
Chapter Exercises
36(3)
Device Models
39(18)
Introduction
39(1)
Bipolar Transistors
39(5)
Early Effect
39(1)
High Level Injection
39(1)
Gummel-Poon Model
40(4)
MOS Transistors
44(7)
Bipolar SPICE Implementation
49(2)
Simple Small Signal Models for Hand Calculations
51(3)
Bipolar Small Signal Model
51(1)
Output Impedance
52(1)
Simple MOS Small Signal Model
53(1)
Chapter Exercises
54(3)
Current Sources
57(22)
Current Mirrors in Bipolar Technology
59(12)
Current Mirrors in MOS Technology
71(5)
Chapter Exercises
76(3)
Voltage References
79(10)
Simple Voltage References
79(1)
Vbe Multiplier
80(2)
Zener Voltage Reference
82(1)
Temperature Characteristics of Ic and Vbe
83(2)
Bandgap Voltage Reference
85(4)
Amplifiers
89(38)
The Common-Emitter Amplifier
90(6)
The Common-Base Amplifier
96(2)
Common-Collector Amplifiers (Emitter Followers)
98(1)
Two-Transistor Amplifiers
99(1)
CC-CE and CC-CC Amplifiers
99(2)
The Darlington Configuration
101(2)
The CE-CB Amplifier, or Cascode
103(1)
Emitter-Coupled Pairs
104(9)
The MOS Case: The Common-Source Amplifier
113(2)
The CMOS Inverter
115(1)
The Common-Source Amplifier with Source Degeneration
115(2)
The MOS Cascode Amplifier
117(1)
The Common-Drain (Source Follower) Amplifier
117(1)
Source-Coupled Pairs
118(5)
Chapter Exercises
123(4)
Comparators
127(18)
Hysteresis
133(4)
Hysteresis with a Resistor Divider
133(1)
Hysteresis from Transistor Current Density
134(2)
Comparator with Vbe-Dependent Hysteresis
136(1)
The Bandgap Reference Comparator
137(1)
Operational Amplifiers
138(1)
A Programmable Current Reference
139(1)
A Triangle-Wave Oscillator
140(2)
A Four-Bit Current Summing DAC
142(1)
The MOS Case
143(1)
Chapter Exercises
143(2)
Amplifier Output Stages
145(14)
The Emitter Follower: a Class A Output Stage
146(3)
The Common-Emitter Class A Output Stage
149(1)
The Class B (Push-Pull) Output
150(4)
The Class AB Output Stage
154(1)
CMOS Output Stages
154(1)
Overcurrent Protection
155(2)
Chapter Exercises
157(2)
Pitfalls
159(34)
IR Drops
159(7)
The Effect of IR Drops on Current Mirrors
162(4)
Lateral pnp
166(3)
The Saturation of Lateral pnp Transistors
166(1)
Low Beta in Large Area Lateral pnps
167(2)
npn Transistors
169(4)
Saturating npn Steals Base Current
169(2)
Temperature Turns On Transistors
171(2)
Comparators
173(6)
Headroom Failure
173(2)
Comparator Fails When Its Low Input Limit Is Exceeded
175(2)
Premature Switching
177(2)
Latchup
179(6)
Resistor ISO EPI Latchup
182(3)
Floating Tubs
185(2)
Parasitic MOS Transistors
187(3)
Examples of Parasitic MOSFETs
188(1)
OSFETs
188(1)
Examples of Parasitic OSFETs
189(1)
Metal Over Implant Resistors
190(3)
Design Practices
193(24)
Matching
193(15)
Component Size
193(1)
Orientation
194(1)
Temperature
195(1)
Stress
195(2)
Contact Placement for Matching
197(1)
Buried Layer Shift
197(1)
Resistor Placement
198(1)
Ion Implant Resistor Conductivity Modulation
199(1)
Tub Bias Affects Resistor Match
200(1)
Contact Resistance Upsets Matching
201(1)
The Cross Coupled Quad Improves Matching
201(1)
Matching Calculations
202(6)
Electrostatic Discharge Protection (ESD)
208(2)
ESD Protection Circuit Analysis
210(4)
Chapter Exercises
214(3)
Index 217
James C. Daly, Denis P. Galipeau