This book presents a comprehensive overview of RTL (Register Transfer Level) debugging, addressing both foundational concepts and emerging technologies. It begins by examining the key issues faced in RTL design, such as timing violations, limited signal observability, and complex verification environments. It then outlines the basic principles of RTL debugging, including simulation techniques, waveform inspection, and the use of assertions and testbenches. Traditional debugging methods are discussed in depth, highlighting techniques like print-style debugging, coverage analysis, and assertion-based verification, along with their respective advantages and limitations. The book concludes with an exploration of leading-edge approaches involving Large Language Models (LLMs), showcasing how AI can support RTL debugging by assisting in code comprehension, anomaly detection, and bug localization.
RTL-Level Design Hazards A Pre-Debugging Guide.- Introduction: Basics
of RTL Debugging.- Conventional Methods for RTL Debugging Rule-Based
Techniques.- AI-Driven Methods for RTL Debugging: Localization and
Auto-Corrections of RTL Bugs Towards Smart Debug.
Dr. Khaled Mohammed received his B.Sc. degree in Electronics and Communications Engineering with distinction and honors in 2003 from Ain Shams University, Cairo, Egypt. He obtained his M.Sc. and Ph.D. degrees in Electronics and Communications Engineering in 2008 and 2012, respectively, followed by an MBA degree in 2016. Throughout his career, Dr. Salah has contributed extensively to the design and verification of advanced System-on-Chip (SoC) intellectual property cores, including high-speed interconnects and memory interfaces. He has also led several engineering initiatives in hardware emulation, system modeling, and complex SoC integration. Dr. Salah has authored and co-authored numerous books, patents, and over 170 peer-reviewed research papers published in leading international journals and conferences. His research interests span 3D integration, IP modeling, hardware emulation, machine learning, artificial intelligence, and Internet of Things (IoT) applications. He is a Senior Member of the IEEE and actively serves as a reviewer for several prestigious journals, including the IEEE Transactions on VLSI Systems, IEEE Transactions on Circuits and Systems II, IEEE Transactions on Semiconductor Manufacturing, IEEE Microwave and Wireless Components Letters, IEEE Transactions on Microwave Theory and Techniques, and the Elsevier Microelectronics Journal.
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