(Ilmumisaeg: 19-Nov-2008, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781040078501)
Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the in...Loe edasi...
(Ilmumisaeg: 19-Nov-2008, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781420043778)
Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the in...Loe edasi...
(Ilmumisaeg: 29-Jul-2004, PDF+DRM, Kirjastus: World Scientific Publishing Co Pte Ltd, ISBN-13: 9789814482158)
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft...Loe edasi...
