(Ilmumisaeg: 08-Jan-2024, EPUB+DRM, Kirjastus: Taylor & Francis Ltd, ISBN-13: 9781003831181)
This text comprehensively discusses the advanced MOS devices and their circuit applications with reliability concerns. Further, an energy-efficient Tunnel FET-based circuit application will be investigated in terms of the output voltage, power effici...Loe edasi...
(Ilmumisaeg: 08-Jan-2024, PDF+DRM, Kirjastus: Taylor & Francis Ltd, ISBN-13: 9781003831129)
This text comprehensively discusses the advanced MOS devices and their circuit applications with reliability concerns. Further, an energy-efficient Tunnel FET-based circuit application will be investigated in terms of the output voltage, power effici...Loe edasi...
(Ilmumisaeg: 29-Nov-2023, EPUB+DRM, Kirjastus: Taylor & Francis Ltd, ISBN-13: 9781000985153)
This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communication...Loe edasi...
(Ilmumisaeg: 29-Nov-2023, PDF+DRM, Kirjastus: Taylor & Francis Ltd, ISBN-13: 9781000985139)
This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate and graduate students and professionals in areas including electronics and communication...Loe edasi...
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are o...Loe edasi...
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are o...Loe edasi...
