Jiafu Wan, Kai Lin, Delu Zeng, Jin Li, Yang Xiang, Xiaofeng Liao, Jiwu Huang, Zheli Liu
Sari: Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering
(Ilmumisaeg: 11-Nov-2017, PDF+DRM, Kirjastus: Springer International Publishing AG, ISBN-13: 9783319696058)
This book constitutes the refereed proceedings of the 7th International Conference on Cloud Computing, Security, Privacy in New Computing Environments, CloudComp 2016, and the First EAI International Conference SPNCE 2016, both held in Guangzhou, Chi...Loe edasi...
Jiafu Wan, Kai Lin, Delu Zeng, Jin Li, Yang Xiang, Xiaofeng Liao, Jiwu Huang, Zheli Liu
Sari: Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering
(Ilmumisaeg: 11-Nov-2017, EPUB+DRM, Kirjastus: Springer International Publishing AG, ISBN-13: 9783319696058)
This book constitutes the refereed proceedings of the 7th International Conference on Cloud Computing, Security, Privacy in New Computing Environments, CloudComp 2016, and the First EAI International Conference SPNCE 2016, both held in Guangzhou, Chi...Loe edasi...
The Crisis of Welfare in East Asia adopts a unique and critical perspective on contemporary social welfare policies in East Asia. This edited volume reflects on current welfare theories and challenges the dominant productivist ideology that overempha...Loe edasi...
The Crisis of Welfare in East Asia adopts a unique and critical perspective on contemporary social welfare policies in East Asia. This edited volume reflects on current welfare theories and challenges the dominant productivist ideology that overempha...Loe edasi...
Yit Lin Michael Chew, Lai Hiong Kang, Chung Wan Wong
(Ilmumisaeg: 20-Feb-1998, PDF+DRM, Kirjastus: World Scientific Publishing Co Pte Ltd, ISBN-13: 9789814496346)
Much attention has been given to the increasing number of defects on building facades in relation to the construction industrys growing use of large panel curtain walls. This book highlights the various types of defects commonly found on building fa...Loe edasi...
