Otsingu tulemus - E-Raamatud

Ingliskeelsed e-raamatud

1. E-raamat: Thermal-Aware Testing of Digital VLSI Circuits and Systems [e-raamat]
Santanu Chattopadhyay
(Ilmumisaeg: 24-Apr-2018, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351227773)
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents... Loe edasi...

2. E-raamat: Thermal-Aware Testing of Digital VLSI Circuits and Systems [e-raamat]
Santanu Chattopadhyay
(Ilmumisaeg: 24-Apr-2018, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351227766)
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents... Loe edasi...

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Märksõna: Integrated circuits - Very large scale integration - Thermal properties

Ingliskeelsed e-raamatud