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E-raamat: Defects and Impurities in Silicon Materials: An Introduction to Atomic-Level Silicon Engineering

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  • Formaat: EPUB+DRM
  • Sari: Lecture Notes in Physics 916
  • Ilmumisaeg: 30-Mar-2016
  • Kirjastus: Springer Verlag, Japan
  • Keel: eng
  • ISBN-13: 9784431558002
  • Formaat - EPUB+DRM
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  • Formaat: EPUB+DRM
  • Sari: Lecture Notes in Physics 916
  • Ilmumisaeg: 30-Mar-2016
  • Kirjastus: Springer Verlag, Japan
  • Keel: eng
  • ISBN-13: 9784431558002

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This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. 

The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.
1 Diffusion and Point Defects in Silicon Materials
1(68)
Hartmut Bracht
2 Density Functional Modeling of Defects and Impurities in Silicon Materials
69(60)
Jose Coutinho
3 Electrical and Optical Defect Evaluation Techniques for Electronic and Solar Grade Silicon
129(52)
Anthony R. Peaker
Vladimir P. Markevich
4 Control of Intrinsic Point Defects in Single-Crystal Si and Ge Growth from a Melt
181(60)
Jan Vanhellemont
Kozo Nakamura
Eiji Kamiyama
Koji Sueoka
5 Numerical Analysis of Impurities and Dislocations During Silicon Crystal Growth for Solar Cells
241(32)
Bing Gao
Koichi Kakimoto
6 Oxygen Precipitation in Silicon
273(70)
Gudrun Kissinger
7 Defect Characterization in Silicon by Electron-Beam-Induced Current and Cathodoluminescence Techniques
343(32)
Takashi Sekiguchi
Jun Chen
8 Nuclear Methods to Study Defects and Impurities in Si Materials
375(56)
Guido Langouche
Yutaka Yoshida
9 Defect Engineering in Silicon Materials
431
Werner Bergholz
Prof. Yutaka Yoshida Since 2004 Yutaka Yoshida is professor in Materials and Bio Science at Shizuoka Institute of Science and Technology (SIST) Japan. He is also the director of SIST Advanced instrumental analysis center. After obtaining his doctoral degree from Osaka University under the guidance of emeritus Professor F.E. Fujita, and he stayed in the group of Professor Gero Vogl as a guest scientist at the Hahn-Meitner Institute Berlin, Germany, in the period between 1983 and 1985, and 1990, and also as a research assistant at the Institute of solid state physics, Universität Wien, Austria, between 1986 and 1989. Since 1993 he is a guest Scientist at the RIKEN, Japan. He served for the chairperson of ICAME 2011 at Kobe and also will be the chairperson for 7th Forum of Science and Technology of Silicon Materials 2014 (Hamamatsu).

Prof.Guido Langouche Since 2010 Guido Langouche is emeritus professor in nuclear solid state physics at the University of Leuven. After obtaining his doctoral and habilitation degrees from K.U. Leuven, he was post-doc at the universities of Stanford and Groningen and guest professor at the universities of Osaka, Lyon and Kinshasa. From 1995 till 2005 he was vice-rector of K.U. Leuven. From 2005 till 2010 he was chairman of the Coimbra Group, an academic collaboration network of 40 of Europes longest-established research-intensive universities. He was also vice-president of NVAO, the Accreditation Agency for the Netherlands and Flanders, residing in The Hague, where he was appointed in 2007 jointly by the Dutch and Flemish Ministers of Education. Since 2011 he is also Secretary of INQAAHE, the International Network for Quality Assurance Agencies in Higher Education. He is editor-in-chief of the Hyperfine Interactions journal.