| Preface to the Second Edition |
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xi | |
| Preface to the First Edition |
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xiii | |
| Authors |
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xv | |
| Abbreviations |
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xvii | |
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List of Elements by Symbol |
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xxi | |
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Chapter 1 Semiconductor Basics |
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1 | (28) |
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1 | (2) |
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3 | (3) |
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6 | (2) |
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1.4 Phonons and the Brillouin Zone |
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8 | (2) |
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10 | (1) |
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11 | (5) |
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16 | (3) |
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19 | (2) |
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21 | (2) |
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1.10 Electronic Transport |
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23 | (1) |
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1.11 Examples of Semiconductors |
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24 | (5) |
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25 | (1) |
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26 | (3) |
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Chapter 2 Defect Classifications |
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29 | (20) |
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29 | (1) |
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30 | (3) |
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2.3 Examples of Native Defects |
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33 | (2) |
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2.4 Examples of Nonhydrogenic Impurities |
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35 | (3) |
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38 | (1) |
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39 | (3) |
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42 | (7) |
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46 | (1) |
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47 | (2) |
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Chapter 3 Interfaces and Devices |
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49 | (18) |
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3.1 Ideal Metal-Semiconductor Junctions |
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49 | (2) |
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3.2 Real Metal-Semiconductor Junctions |
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51 | (4) |
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55 | (1) |
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56 | (2) |
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3.5 Applications of p-n Junctions |
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58 | (1) |
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3.6 The Metal-Oxide-Semiconductor Junction |
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59 | (2) |
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3.7 The Charge-Coupled Device |
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61 | (1) |
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3.8 Light-Emitting Devices |
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62 | (1) |
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63 | (4) |
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64 | (1) |
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65 | (2) |
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Chapter 4 Crystal Growth and Doping |
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67 | (30) |
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67 | (3) |
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4.2 Dopant Incorporation During Bulk Crystal Growth |
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70 | (4) |
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74 | (1) |
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75 | (2) |
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4.5 Chemical Vapor Deposition |
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77 | (2) |
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4.6 Molecular Beam Epitaxy |
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79 | (2) |
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81 | (2) |
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83 | (2) |
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85 | (4) |
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4.10 Annealing and Dopant Activation |
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89 | (3) |
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4.11 Neutron Transmutation |
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92 | (5) |
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94 | (1) |
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94 | (3) |
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Chapter 5 Electronic Properties |
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97 | (32) |
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97 | (5) |
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5.2 Wave Function Symmetry |
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102 | (4) |
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5.3 Donor and Acceptor Wave Functions |
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106 | (2) |
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108 | (5) |
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5.5 Carrier Concentrations as a Function of Temperature |
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113 | (3) |
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116 | (3) |
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119 | (3) |
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5.8 Hopping and Impurity Band Conduction |
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122 | (3) |
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125 | (4) |
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126 | (1) |
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127 | (2) |
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Chapter 6 Vibrational Properties |
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129 | (32) |
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129 | (4) |
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6.2 Defect Vibrational Modes |
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133 | (5) |
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138 | (2) |
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6.4 Interactions and Lifetimes |
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140 | (2) |
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142 | (2) |
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6.6 Wave Functions and Symmetry |
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144 | (3) |
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6.7 Oxygen in Silicon and Germanium |
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147 | (4) |
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6.8 Impurity Vibrational Modes in GaAs |
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151 | (4) |
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6.9 Hydrogen Vibrational Modes |
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155 | (6) |
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157 | (1) |
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158 | (3) |
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Chapter 7 Optical Properties |
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161 | (32) |
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7.1 Free-Carrier Absorption and Reflection |
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161 | (3) |
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164 | (4) |
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168 | (1) |
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169 | (4) |
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173 | (5) |
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7.6 Exciton and Donor-Acceptor Emission |
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178 | (4) |
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7.7 Isoelectronic Impurities |
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182 | (2) |
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184 | (3) |
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187 | (6) |
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189 | (1) |
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190 | (3) |
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Chapter 8 Thermal Properties |
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193 | (28) |
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193 | (2) |
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195 | (2) |
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197 | (2) |
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199 | (5) |
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8.5 Microscopic Mechanisms of Diffusion |
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204 | (3) |
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207 | (3) |
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210 | (4) |
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8.8 Quantum-Well Intermixing |
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214 | (7) |
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218 | (1) |
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219 | (2) |
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Chapter 9 Electrical Measurements |
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221 | (26) |
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9.1 Resistivity and Conductivity |
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222 | (1) |
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9.2 Methods of Measuring Resistivity |
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223 | (5) |
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228 | (3) |
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9.4 Capacitance-Voltage Profiling |
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231 | (3) |
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9.5 Carrier Emission and Capture |
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234 | (1) |
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9.6 Deep-Level Transient Spectroscopy |
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235 | (3) |
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9.7 Minority Carriers and Deep-Level Transient Spectroscopy |
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238 | (2) |
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9.8 Minority Carrier Lifetime |
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240 | (1) |
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9.9 Thermoelectric Effect |
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241 | (6) |
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242 | (1) |
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243 | (4) |
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Chapter 10 Optical Spectroscopy |
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247 | (30) |
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248 | (2) |
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250 | (2) |
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252 | (3) |
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10.4 Fourier Transform Infrared Spectroscopy |
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255 | (3) |
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258 | (2) |
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10.6 Time-Resolved Techniques |
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260 | (2) |
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262 | (3) |
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10.8 Electron Paramagnetic Resonance |
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265 | (4) |
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10.9 Optically Detected Magnetic Resonance |
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269 | (1) |
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10.10 Electron Nuclear Double Resonance |
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270 | (7) |
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273 | (1) |
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274 | (3) |
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Chapter 11 Particle-Beam Methods |
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277 | (28) |
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11.1 Rutherford Backscattering Spectrometry |
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277 | (4) |
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281 | (4) |
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11.3 Secondary Ion Mass Spectrometry |
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285 | (2) |
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287 | (1) |
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288 | (2) |
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11.6 Photoelectric Effect |
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290 | (2) |
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292 | (2) |
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11.8 Positron Annihilation |
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294 | (2) |
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296 | (2) |
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11.10 Perturbed Angular Correlation Spectroscopy |
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298 | (3) |
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301 | (4) |
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301 | (1) |
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302 | (3) |
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Chapter 12 Microscopy and Structural Characterization |
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305 | (24) |
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305 | (5) |
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12.2 Scanning Electron Microscopy |
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310 | (4) |
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314 | (2) |
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12.4 Electron Beam Induced Current Microscopy |
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316 | (2) |
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318 | (1) |
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12.6 Transmission Electron Microscopy |
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319 | (3) |
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12.7 Scanning Probe Microscopy |
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322 | (7) |
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326 | (1) |
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327 | (2) |
| Appendices |
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329 | (8) |
| Physical Constants |
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337 | (2) |
| Index |
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339 | |