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E-raamat: Electron Nano-Imaging: Basics of Imaging and Diffraction for TEM and STEM

  • Formaat: EPUB+DRM
  • Ilmumisaeg: 04-Apr-2017
  • Kirjastus: Springer Verlag, Japan
  • Keel: eng
  • ISBN-13: 9784431565024
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  • Formaat: EPUB+DRM
  • Ilmumisaeg: 04-Apr-2017
  • Kirjastus: Springer Verlag, Japan
  • Keel: eng
  • ISBN-13: 9784431565024

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In the present book, the basics of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in textbook style. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, mechanism of electron lens, and scattering/diffraction theories, which are explained in detail separately in the appendices. A comprehensive explanation is provided using Fourier transform theory. This approach is unique in comparison with other advanced textbooks on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by facts about electron microscopic imaging. The up-to-date information in this book, particularly for imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

Arvustused

I enjoyed reading this book. It covers a wide range of applications, from basics on electron microscopy and diffraction, to more advanced, newly developed techniques for imaging and diffraction. I strongly recommend this book as a resource for electron microscopists with a basic knowledge of TEM and STEM who are interested in advanced imaging and diffraction techniques. (Lourdes Salamanca-Riba, MRS Bulletin, Vol. 43, May, 2018)

Part I Nano-imaging by Transmission Electron Microscopy
1 Seeing Nanometer-Sized World
3(14)
1.1 What is the Nanoworld? How Much is Its Size?
3(3)
1.2 Necessity of Study for Nanoscience and Nanoimaging
6(2)
1.3 Basic Modes for Imaging
8(2)
1.4 Why are Electrons Necessary for Nanoimaging?
10(2)
1.5 Three Methods for Seeing Isolated Single Atoms
12(3)
1.6 Summary
15(2)
Problems
15(1)
References
15(2)
2 Structure and Imaging of a Transmission Electron Microscope (TEM)
17(12)
2.1 Structure of a Transmission Electron Microscope
17(5)
2.2 Basic Action of a Magnetic Round Lens
22(2)
2.3 Mathematics for Describing Lens Actions
24(3)
2.4 Summary
27(2)
Problems
27(1)
References
28(1)
3 Basic Theories of TEM Imaging
29(14)
3.1 How to Describe a Wave in Three-Dimensional Space?
29(4)
3.2 Why Does an Electron Microscope Visualize an Objects in Analogy with a Light Microscope?
33(2)
3.3 Why Can a Single Atom be Observed by an Electron Microscope?
35(3)
3.4 Images and Diffraction Patterns
38(3)
3.5 Summary
41(2)
Problems
42(1)
References
42(1)
4 Resolution and Image Contrast of a Transmission Electron Microscope (TEM)
43(16)
4.1 Simple Estimation of Point-to-Point Resolution of a TEM
43(5)
4.2 Limitation by Chromatic Aberration of an Objective Lens
48(1)
4.3 Effects of Other Aberrations on Image Resolution in TEM
49(1)
4.4 Image Contrast of a Transmission Electron Microscope Image
50(2)
4.5 Bright-Field Images
52(3)
4.6 Dark-Field Images
55(1)
4.7 Summary
56(3)
Problems
56(1)
References
57(2)
5 What is High-Resolution Transmission Electron Microscopy?
59(14)
5.1 How Can We Observe a Single Atom by TEM? -- Magic of Phase Contrast
59(5)
5.2 A Second-Order Theory for Single-Atom Imaging
64(2)
5.3 Phase Contrast of Atomic Clusters
66(2)
5.4 Imaging of Amorphous Films and Thon's Experiment
68(1)
5.5 Diffraction Contrast of Microcrystallites
69(1)
5.6 Where Does an Objective Lens Focus in Thin Specimens?
70(1)
5.7 Key Concepts of High-Resolution Imaging
71(1)
5.8 Summary
71(2)
Problems
72(1)
References
72(1)
6 Lattice Images and Structure Images
73(14)
6.1 Interference of Two Waves in Three-Dimension
73(2)
6.2 Lattice Images by Two-Wave Interference from a Crystal
75(3)
6.3 Three-Wave Interference and Fourier Images
78(1)
6.4 MultiWave Lattice Images
79(3)
6.5 What is a Structure Image of Thicker Crystals
82(2)
6.6 Other Lattice Images
84(1)
6.7 Summary
85(2)
Problems
85(1)
References
85(2)
7 Imaging Theory of High-Resolution TEM and Image Simulation
87(24)
7.1 Linear Imaging Theory of TEM for Single-Crystal Specimens
87(10)
7.1.1 Description of Phase Modulation by a Thin Specimen
87(2)
7.1.2 Exit Wave Field for a Thicker Crystal
89(1)
7.1.3 Lens Transfer Function
89(1)
7.1.4 Phase Contrast Caused by Aberrations of an Objective Lens
90(1)
7.1.5 Contrast Transfer Function Described in Reciprocal Space
91(2)
7.1.6 Effects of a Slight Convergence of Incident Electron Waves and Fluctuation of Accelerating Voltage
93(1)
7.1.7 Imaging Theory of Weak-Amplitude Objects
94(2)
7.1.8 Effects of Inelastic Scattering on HRTEM Images
96(1)
7.2 Image Simulation of High-Resolution TEM Images
97(5)
7.2.1 Necessity of the Simulation
97(1)
7.2.2 Principle and Method of Simulation
98(2)
7.2.3 What is the Supercell Method in Image Simulation
100(2)
7.3 Coherence Problems in TEM Imaging
102(7)
7.3.1 Imaging Theory of TEM and the Related Coherence of Incident Waves
102(2)
7.3.2 Contrast of Interference Fringes and the Definition of Coherence
104(1)
7.3.3 Temporal Coherence and Spatial Coherence of Waves
105(4)
7.4 Summary
109(2)
Problems
109(1)
References
109(2)
8 Advanced Transmission Electron Microscopy
111(38)
8.1 Energy-Filtered Transmission Electron Microscopy (EFTEM)
111(7)
8.1.1 Basic Theory of Electron Energy Loss Spectroscopy (EELS)
111(2)
8.1.2 EELS in Image and Diffraction Modes
113(2)
8.1.3 Practical Energy-Filtered TEM Instruments
115(1)
8.1.4 What is Elemental Mapping Image?
116(1)
8.1.5 Spatial Resolution of Energy-Filtered TEM Images
117(1)
8.2 Electron Holography
118(8)
8.2.1 What is Holography?
118(2)
8.2.2 Instruments for Electron Holography
120(2)
8.2.3 What Can We Do Using Electron Holography?
122(4)
8.3 Electron Tomography -- 3D Visualization of Nanoworld
126(6)
8.3.1 Principle of 3D Tomography
126(3)
8.3.2 Application of the Principle to TEM
129(1)
8.3.3 Actual Instruments for Electron Tomography
130(1)
8.3.4 Present Issues in Electron Tomography
130(2)
8.4 Aberration-Corrected Transmission Electron Microscopy
132(12)
8.4.1 Overview of Spherical Aberration Correction in TEM
132(2)
8.4.2 Aberrations of Magnetic Round Lens
134(1)
8.4.3 Basic Principle of Spherical Aberration Correction
134(4)
8.4.4 Actual Aberration Corrector for TEM
138(2)
8.4.5 Benefits of Aberration-Corrected TEM
140(3)
8.4.6 Correction of Chromatic Aberration in TEM
143(1)
8.5 Summary
144(5)
Problems
144(1)
References
144(5)
Part II Nano-imaging by Scanning Transmission Electron Microscopy
9 What is Scanning Transmission Electron Microscopy (STEM)?
149(12)
9.1 Characteristics of STEM
149(3)
9.1.1 Comparison between TEM, SEM, and STEM
149(3)
9.1.2 Application Possibilities of STEM
152(1)
9.2 Basics for nm-Sized Electron Probe (Geometrical Optical Approach)
152(3)
9.3 Principle of Image Formation in STEM
155(2)
9.4 Actual Instrument of STEM
157(1)
9.5 Summary
158(3)
Problems
158(1)
References
158(3)
10 Imaging of Scanning Transmission Electron Microscopy (STEM)
161(6)
10.1 Reciprocal Theorem between STEM and TEM
161(2)
10.2 Imaging Modes in STEM
163(2)
10.3 Summary
165(2)
Problems
166(1)
References
166(1)
11 Image Contrast and Its Formation Mechanism in STEM
167(24)
11.1 Bright-Field Image Contrast and Lattice Images with Phase Contrast
168(1)
11.2 Crewe's Z-Contrast of a Single Atom
169(2)
11.3 Pennycook's Z2-x-Contrast in Annular Dark-Field (ADF) STEM
171(4)
11.4 Depth-Sectioning for ADF-STEM Images
175(2)
11.5 Annular Bright-Field (ABF) STEM -- Revival of Bright-Field Imaging in STEM --
177(1)
11.6 Elemental Mapping Imaging by EELS and EDX in STEM
178(4)
11.7 Secondary Electron Imaging in STEM
182(1)
11.8 Scanning Confocal Electron Microscopy (SCEM)
182(1)
11.9 High-Voltage STEM
183(1)
11.10 Electron Tomography by STEM
184(3)
11.10.1 Image Contrast of Amorphous Specimens
185(1)
11.10.2 STEM Tomography of Crystalline Specimens
186(1)
11.10.3 3D Images Using EELS Signals and EDX Ones
186(1)
11.10.4 Topography Versus Tomography for 3D Representation
187(1)
11.11 Nanodiffraction in STEM
187(2)
11.12 Summary
189(2)
Problems
189(1)
References
189(2)
12 Imaging Theory for STEM
191(12)
12.1 Basic Concept of Imaging Theory for STEM
191(1)
12.2 Cowley--Moodie's Multislice Method
192(7)
12.3 Bethe's Bloch Wave Method
199(2)
12.4 Summary
201(2)
Problems
202(1)
References
202(1)
13 Future Prospects and Possibility of TEM and STEM
203(10)
13.1 Image Resolution
203(1)
13.2 Effects of Chromatic Aberration
204(1)
13.3 Development of Electron Energy Loss Spectroscopy (EELS)
205(1)
13.4 Simulation for Quantitative Estimation for TEM and STEM Images
205(1)
13.5 Development of Elemental Analysis Using EDX
205(1)
13.6 Other Signal Detection for STEM Imaging
206(1)
13.7 Electron Tomography in TEM and STEM
206(2)
13.7.1 Ordinary Electron Tomography
206(1)
13.7.2 HRTEM Method for the Extraction of 3D Information of Small Particles
207(1)
13.7.3 Depth-Sectioning Method in ADF-STEM
207(1)
13.7.4 Confocal Imaging Mode in STEM
208(1)
13.8 Toward Lower Voltage TEM and STEM
208(1)
13.9 In Situ Observation and High-Resolution Observation in Gas and Liquid Atmospheres
209(1)
13.10 Pulsed Electron Beam for Time-Resolved Observation and Its New Possibility
209(1)
13.11 Use of Spin-Polarized Electron Beams and Vortex Electron Beams
210(3)
References
211(2)
14 Concluding Remarks
213(6)
References
215(4)
Part III Appendix: Basics for Understanding TEM and STEM Imaging
15 Introduction to Fourier Transforms for TEM and STEM
219(8)
15.1 Fourier Series
219(1)
15.2 Fourier Integral (Fourier Transform)
220(1)
15.3 Two-Dimensional and Three-Dimensional Fourier Transforms
221(1)
15.4 Properties of Fourier Transforms
221(1)
15.5 Fourier Transform of a Product of Two Functions
222(1)
15.6 Parseval's Relation
223(1)
15.7 Relationship between Various Fourier Transforms and Phenomena in Optics and Diffraction
224(2)
15.8 Sign Convention for Fourier Transforms
226(1)
References
226(1)
16 Imaging by Using a Convex Lens as a Phase Shifter
227(8)
16.1 Propagation of Electron Waves
227(3)
16.2 Action of a Convex Lens
230(5)
References
233(2)
17 Contrast Transfer Function of a Transmission Electron Microscope
235(8)
References
242(1)
18 Complex-Valued Expression of Aberrations of a Round Lens
243(4)
References
245(2)
19 Cowley's Theory for TEM and STEM Imaging
247(6)
19.1 Transmission Electron Microscope (TEM) Images
247(2)
19.2 Scanning Transmission Electron Microscope (STEM) Images
249(4)
References
251(2)
20 Introduction to the Imaging Theory for TEM Including Nonlinear Terms
253(8)
20.1 What is Mutual Intensity?
253(3)
20.2 Interaction with Specimens and Image Intensity
256(2)
20.3 Nonlinear Imaging Theory for High-Resolution TEM
258(3)
References
259(2)
21 What are Image Processing Methods?
261(4)
References
263(2)
22 Elemental Analysis by Electron Microscopes
265(2)
References
266(1)
23 Electron Beam Damage to Specimens
267(6)
23.1 Damage to Non-Biological Specimens
267(1)
23.2 Damage to Organic and Biological Specimens
268(3)
23.3 Future Prospects
271(2)
References
271(2)
24 Scattering of Electrons by an Atom
273(6)
References
278(1)
25 Electron Diffraction and Convergent Beam Electron Diffraction (CBED)
279(8)
References
286(1)
26 Bethe's Method for Dynamical Electron Diffraction
287(6)
References
291(2)
27 Column Approximation and Howie-Whelan's Method for Dynamical Electron Diffraction
293(4)
27.1 Column Approximation
293(2)
27.2 Dynamical Diffraction Theory Developed by Howie and Whelan
295(2)
References
296(1)
28 Van Dyck's Method for Dynamical Electron Diffraction and Imaging
297(4)
References
300(1)
29 Eikonal Theory for Scattering of Electrons by a Potential
301(4)
References
303(2)
30 Debye-Waller Factor and Thermal Diffuse Scattering (TDS)
305(4)
References
307(2)
31 Relativistic Effects to Diffraction and Imaging by a Transmission Electron Microscope
309(4)
References
312(1)
Author Index 313(4)
Subject Index 317
Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC). He received a ph.D degree from Applied Physics Department of Nagoya University in 1978, and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004. He was the director of the institute from 2012 to 2015. He is also the president of Japanese Microscopy Society (JSM) from 2015 to 2017. His professionals are high-resolution electron microscopy and nano-diffraction, and physics of atomic clusters and thin filmsas well as surfaces and interfaces of semiconductors. He is also the editor/author of a textbook as Scanning Transmission Electron Microscopy of Nanomaterials.