Muutke küpsiste eelistusi

E-raamat: Engineering Materials Characterization

  • Formaat: PDF+DRM
  • Sari: De Gruyter STEM
  • Ilmumisaeg: 20-Nov-2023
  • Kirjastus: De Gruyter
  • Keel: eng
  • ISBN-13: 9783110997590
  • Formaat - PDF+DRM
  • Hind: 95,58 €*
  • * hind on lõplik, st. muud allahindlused enam ei rakendu
  • Lisa ostukorvi
  • Lisa soovinimekirja
  • See e-raamat on mõeldud ainult isiklikuks kasutamiseks. E-raamatuid ei saa tagastada.
  • Formaat: PDF+DRM
  • Sari: De Gruyter STEM
  • Ilmumisaeg: 20-Nov-2023
  • Kirjastus: De Gruyter
  • Keel: eng
  • ISBN-13: 9783110997590

DRM piirangud

  • Kopeerimine (copy/paste):

    ei ole lubatud

  • Printimine:

    ei ole lubatud

  • Kasutamine:

    Digitaalõiguste kaitse (DRM)
    Kirjastus on väljastanud selle e-raamatu krüpteeritud kujul, mis tähendab, et selle lugemiseks peate installeerima spetsiaalse tarkvara. Samuti peate looma endale  Adobe ID Rohkem infot siin. E-raamatut saab lugeda 1 kasutaja ning alla laadida kuni 6'de seadmesse (kõik autoriseeritud sama Adobe ID-ga).

    Vajalik tarkvara
    Mobiilsetes seadmetes (telefon või tahvelarvuti) lugemiseks peate installeerima selle tasuta rakenduse: PocketBook Reader (iOS / Android)

    PC või Mac seadmes lugemiseks peate installima Adobe Digital Editionsi (Seeon tasuta rakendus spetsiaalselt e-raamatute lugemiseks. Seda ei tohi segamini ajada Adober Reader'iga, mis tõenäoliselt on juba teie arvutisse installeeritud )

    Seda e-raamatut ei saa lugeda Amazon Kindle's. 

Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation.

The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy.

PART A MICROSCOPIC CHARACTERIZATION

Chapter 1: Optical Microscope

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Imaging Analysis and Interpretation.

Chapter 2: Scanning Electron Microscopy

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Imaging Analysis and Interpretation.

Chapter 3: Atomic Force Microscopy

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Imaging Analysis and Interpretation.

Chapter 4: Scanning Probe Microscopy

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Imaging Analysis and Interpretation.

Chapter 5: X-Ray Diffraction.

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Imaging Analysis and Interpretation.

PART B SPECTROSCOPIC CHARACTERIZATION

Chapter 1: FTIR Spectrometer

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Data Analysis and Interpretation.

Chapter 2: Raman Spectrometer

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Data Analysis and Interpretation.

Chapter 3: X-ray Photoelectron Spectroscopy

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Data Analysis and Interpretation.

Chapter 4: Ultraviolet Photoelectron Spectroscopy

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Data Analysis and Interpretation.

Chapter 5: Fluorescence Spectroscopy

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Data Analysis and Interpretation.

Chapter 6: Nuclear Magnetic Resonance Spectroscopy

    1. Introduction
    2. Instrumental Details
    3. Working And Handling of Instruments
    4. Sample Preparation
    5. Data Analysis and Interpretation.
Dr. Kaushik Kumar, B.Tech (Mechanical Engineering, REC (Now NIT), Warangal), MBA (Marketing, IGNOU) and Ph.D (Engineering, Jadavpur University), is presently an Associate Professor in the Department of Mechanical Engineering, Birla Institute of Technology, Mesra, Ranchi, India. He has 20 years of Teaching & Research and over 11 years of industrial experience in a manufacturing unit of Global repute. His areas of teaching and research interest are Composites, Optimization, Non-conventional machining, CAD / CAM, Rapid Prototyping and Quality Management Systems. He has 14 Patents, 60+ Books, 30+ Edited Book Volume, 65+ Book Chapters, 180+ International Journal, 21 International and 1 National Conference Publications to his credit. He is on the editorial board and review panel of many International and National Journals of repute. He has been felicitated with many awards and honours.

Dr. Divya Zindani, BE (Mechanical Engineering, Rajasthan Technical University, Kota), M.E. (Design of Mechanical Equipment, BIT Mesra), and Ph.D. (Mechanical Engineering, National Institute of Technology, Silchar), is presently an Assistant Professor in the Department of Mechanical Engineering, Sri Sivasubramaniya Nadar College of Engineering, Kalavakkam, Tamil Nadu, India. He has over 2 years of Industrial experience. His areas of interests are Optimization, Product and Process Design, CAD/CAM/CAE and rapid prototyping. He has 6 Patents, 7 Authored Books, 7 Edited Book, 20 Book Chapters and 20 international Journal publications to his credit. He has been felicitated with awards.