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E-raamat: Extreme Environment Electronics

Edited by (Georgia Tech, Atlanta, USA), Edited by (University of Arkansas, Fayetteville, USA)
  • Formaat: 1041 pages
  • Sari: Industrial Electronics
  • Ilmumisaeg: 19-Dec-2017
  • Kirjastus: CRC Press Inc
  • Keel: eng
  • ISBN-13: 9781351832809
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  • Formaat: 1041 pages
  • Sari: Industrial Electronics
  • Ilmumisaeg: 19-Dec-2017
  • Kirjastus: CRC Press Inc
  • Keel: eng
  • ISBN-13: 9781351832809

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Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space.

The Definitive Guide to Extreme Environment Electronics

Featuring contributions by some of the worlds foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics.

Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material.

With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.

Arvustused

"It is an excellent reference book in a somewhat specialized field. ... This book details a lot of stuff not really documented anywhere else. It is likely to be the book on this subject." Marco Corsi, Texas Instruments, Parker, Texas, USA

"This book is a comprehensive compendium of valuable information on the operation of electronics in extreme environments. It contains contributions from more than 100 experts in all of the appropriate fields of study. ... a very large number of practical examples and applications. It will be valuable for students and for practicing engineers, scientists, and technical managers."Edward Petersen, Ph.D., IEEE Life Fellow, consultant, and author of Single Event Effects in Aerospace

" a very large and comprehensive collection of modern electronic circuits generally used in space applications. the authoritative guide to extreme environment electronics. loaded with a wealth of information. It will provide engineers and scientists working in this field with up-to-elate information and provide a comprehensive listing of reference sources for further study. It could also be useful to graduate students studying electrical engineering, physics or material science."IEEE Electrical Insulation Magazine

Preface xiii
MATLAB Disclaimer xvii
Editors xix
Contributors xxi
PART I Introduction
Introduction 1(2)
1 Big Picture and Some History of the Field
3(8)
John D. Cressler
2 Extreme Environments in NASA Planetary Exploration
11(12)
Elizabeth Kolawa
Mohammad Mojarradi
Linda Del Castillo
3 Extreme Environment Electronics in NASA's Heliophysics Vision
23(6)
Dana Brewer
Janet Barth
4 Overview of the NASA ETDP RHESE Program
29(12)
Andrew S. Keys
5 Role of Extreme Environment Electronics in NASA's Aeronautics Research
41(8)
Gary W. Hunter
Dennis Culley
6 Technology Options for Extreme Environment Electronics
49(10)
Jonathan A. Pellish
Lewis M. Cohn
PART II Background
Introduction
59(2)
John D. Cressler
7 Physics of Temperature and Temperature's Role in Carrier Transport
61(10)
John D. Cressler
Kurt A. Moen
8 Overview of Radiation Transport Physics and Space Environments
71(8)
Robert Reed
Janet Barth
9 Interaction of Radiation with Semiconductor Devices
79(14)
Kenneth F. Galloway
Ronald D. Schrimpf
PART III Environments and Prediction Tools
Introduction
93(2)
John D. Cressler
10 Orbital Radiation Environments
95(12)
Michael Xapsos
11 CREME96 and Related Error Rate Prediction Methods
107(16)
James H. Adams, Jr.
12 Monte Carlo Simulation of Radiation Effects
123(14)
Robert A. Weller
13 Extreme Environments in Energy Production and Utilization
137(8)
Alexander B. Lostetter
14 Extreme Environments in Transportation
145(9)
Peter Wilson
H. Alan Mantooth
PART IV Semiconductor Device Technologies for Extreme Environments
Introduction
154(1)
John D. Cressler
15 Radiation Effects in Si CMOS Platforms
155(20)
Lloyd W. Massengill
16 Wide Temperature Range Operation of Si CMOS Platforms
175(10)
Aravind C. Appaswamy
17 Trade-Offs between Performance and Reliability in Sub-100 nm RF-CMOS on SOI Technologies
185(12)
Rajan Arora
18 SiGe HBT Platforms
197(14)
John D. Cressler
19 Using Temperature to Explore the Scaling Limits of SiGe HBTs
211(14)
Jiahui Yuan
20 SiC Integrated Circuit Platforms for High-Temperature Applications
225(8)
Philip G. Neudeck
21 Passive Elements in Silicon Technology
233(10)
Edward P. Wilcox
22 Power Device Platforms
243(10)
H. Alan Mantooth
23 CMOS-Compatible Silicon-on-Insulator MESFETs for Extreme Environments
253(10)
Trevor J. Thornton
William Lepkowski
Seth J. Wilk
Mohammad Reza Ghajar
Asha Balijepalli
Joseph Ervin
24 III-Nitride Platforms
263(12)
Shyh-Chiang Shen
25 Photonic Devices
275(12)
Cheryl J. Marshall
26 Radiation Hardening by Process
287(10)
Michael L. Alles
27 Rad-Hard Silicon Technologies at BAE Systems
297(8)
Richard W. Berger
28 Rad-Hard Silicon Technologies at Honeywell
305(14)
Paul S. Fechner
Jerry Yue
29 High-Temperature SOI Technologies at Honeywell
319(13)
Bruce Ohme
PART V Modeling for Extreme Environment Electronic Design
Introduction
332(1)
H. Alan Mantooth
30 TCAD of Advanced Transistors
333(12)
Guofu Niu
31 Mixed-Mode TCAD Tools
345(14)
Ashok Raman
Marek Turowski
32 Mixed-Mode TCAD for Modeling of Single-Event Effects
359(14)
Kurt A. Moen
Stanley D. Phillips
33 Compact Modeling of SiGe HBTs
373(14)
Guofu Niu
Lan Luo
34 Compact Modeling of CMOS Devices
387(10)
A. Matt Francis
35 Compact Modeling of LDMOS Transistors
397(12)
Avinash S. Kashyap
36 Compact Modeling of Power Devices
409(10)
Ty R. McNutt
37 Best Practices for Modeling Radiation Effects in Mixed-Signal Circuits
419(12)
Jeffrey S. Kauppila
38 Compact Model Toolkits
431(10)
Jim Holmes
A. Matt Francis
PART VI Device and Circuit Reliability in Extreme Environments
Introduction
441(2)
John D. Cressler
39 Failure Mechanisms in Modern Integrated Circuits and Industry Best Practices for Reliability Degradation Predictions
443(8)
Fernando Guarin
40 Considerations for the Reliability Estimation of SiGe HBTs
451(4)
Fernando Guarin
41 Considerations for the Reliability Estimation of Silicon CMOS
455(4)
Stewart Rauch
42 Qualification Methodology for Extreme Environment Electronics
459(14)
Yuan Chen
PART VII Circuit Design for Extreme Environments
Introduction
473(2)
H. Alan Mantooth
43 Best Practices in Radiation Hardening by Design
475(10)
Jeffrey D. Black
44 Investigations of RHBD Techniques for SiGe Devices and Circuits
485(12)
Stanley D. Phillips
Kurt A. Moen
45 Best Practices in Wide Temperature Range Circuit Design
497(12)
Benjamin J. Blalock
46 Achieving Invariability in Analog Circuits Operating in Extreme Environments
509(11)
Peter Wilson
Robert Rudolf
Reuben Wilcock
PART VIII Examples of Extreme Environment Circuit Designs
Introduction
520(1)
H. Alan Mantooth
47 Voltage and Current References
521(8)
Laleh Najafizadeh
48 Operational Amplifiers
529(16)
Benjamin J. Blalock
49 Cryogenic Low-Noise Amplifiers
545(18)
Joseph C. Bardin
50 Active Filters
563(16)
Fa Foster Dai
Desheng Ma
51 Analog-to-Digital Converters
579(6)
Benjamin J. Blalock
52 Digital-to-Analog Converters
585(16)
Fa Foster Dai
Yuan Yao
Zhenqi Chen
53 CMOS Phase-Locked Loops
601(18)
T. Daniel Loveless
54 Low-Voltage, Weakly Saturated SiGe HBT Circuits
619(10)
Sachin Seth
55 Memory Circuits
629(12)
Richard W. Berger
56 Field Programmable Gate Arrays
641(16)
Melanie Berg
57 Microprocessors and Microcontrollers
657(6)
Kenneth Li
Michael Johnson
58 Asynchronous Digital Circuits
663(12)
Jia Di
Scott C. Smith
59 Characterizing SETs in Oscillator Circuits
675(12)
Stephen J. Horst
60 Low-Voltage Power Electronics
687(12)
Mohammad Mojarradi
Philippe Adell
61 Medium-Voltage Power Electronics
699(14)
Marcelo Schupbach
62 SiC JFET Integrated Circuits for Extreme Environment Electronics
713(10)
Philip G. Neudeck
Michael J. Krasowski
N. F. Prokop
63 Using CMOS-Compatible SOI MESFETs for Power Supply Management
723(10)
William Lepkowski
Seth J. Wilk
Mohammad Reza Ghajar
Michael Goryll
Keith Hobert
Bertan Bakkaloglu
Trevor J. Thornton
PART IX Verification of Analog and Mixed-Signal Systems
Introduction
733(2)
H. Alan Mantooth
64 Model-Based Verification
735(14)
Jim Holmes
65 Event-Driven Mixed-Signal Modeling Techniques for System-in-Package Functional Verification
749(14)
Chip Webber
PART X Packaging for Extreme Environments
Introduction
763(2)
John D. Cressler
66 Electronic Packaging Approaches for Low-Temperature Environments
765(12)
R. Wayne Johnson
67 Electronic Packaging Approaches for High-Temperature Environments
777(14)
R. Wayne Johnson
68 Failure Analysis of Electronic Packaging
791(12)
Linda Del Castillo
69 Silicon Carbide Power Electronics Packaging
803(17)
Jared Hornberger
Brice McPherson
Brandon Passmore
PART XI Real-World Extreme Environment Applications
Introduction
820(1)
H. Alan Mantooth
70 A SiGe Remote Sensor Interface
821(10)
Ryan M. Diestelhorst
71 A SiGe Remote Electronics Unit
831(8)
Troy D. England
72 Distributed Motor Controller for Operation in Extreme Environments
839(10)
Colin McKinney
73 Radiation-Hard Multichannel Digitizer ASIC for Operation in the Jovian Environment
849(14)
Shahid Aslam
Akin Akturk
Gerard Quilligan
74 Approaches to Commercial Communications Satellite Design
863(10)
David A. Sunderland
75 UHF Micro-Transceiver Development Project
873(10)
William Kuhn
Yogesh Tugnawat
76 Down-Hole Instrumentation Package for Energy Well Drilling
883(4)
Randy Normann
77 Electronics Requirements for Collider Physics Experiments
887(8)
Alexander A. Grillo
78 Cryogenic Electronics for High-Energy Physics Experiments
895(14)
Veljko Radeka
Gianluigi de Geronimo
Shaorui Li
79 Radar Systems for Extreme Environments
909(16)
Tushar Thrivikraman
PART XII Appendices
Appendix A Properties of Silicon and Germanium
925(2)
John D. Cressler
Appendix B Temperature and Energy Scales
927(4)
John D. Cressler
Appendix C Planetary Temperature Ranges and Radiation Levels
931(4)
H. Alan Mantooth
Appendix D Ionizing Radiation Test Facilities
935(8)
Paul W. Marshall
Appendix E Radiation Testing Protocols and Mil-Spec Standards
943(6)
Ronald Pease
Appendix F Primer on the Semiconductor Transport Equations and Their Solution
949(10)
John D. Cressler
Guofu Niu
Appendix G Primer on MOSFETs
959(4)
H. Alan Mantooth
Appendix H Primer on Si and SiGe Bipolar Transistors
963(10)
John D. Cressler
Appendix I Compendium of NASA's COTS Radiation Test Data
973(4)
Martha O'Bryan
Appendix J Compendium of NASA's COTS Extreme Temperature Test Data
977(12)
Richard L. Patterson
Ahmad Hammoud
Index 989
John D. Cressler is currently Ken Byers Professor of Electrical and Computer Engineering at Georgia Tech.







H. Alan Mantooth

is a Distinguished Professor of Electrical Engineering and the holder of the 21st Century Endowed Chair in Mixed-Signal IC Design and CAD at the University of Arkansas.