Preface |
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xiii | |
MATLAB Disclaimer |
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xvii | |
Editors |
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xix | |
Contributors |
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xxi | |
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Introduction |
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1 | (2) |
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1 Big Picture and Some History of the Field |
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3 | (8) |
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2 Extreme Environments in NASA Planetary Exploration |
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11 | (12) |
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3 Extreme Environment Electronics in NASA's Heliophysics Vision |
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23 | (6) |
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4 Overview of the NASA ETDP RHESE Program |
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29 | (12) |
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5 Role of Extreme Environment Electronics in NASA's Aeronautics Research |
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41 | (8) |
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6 Technology Options for Extreme Environment Electronics |
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49 | (10) |
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59 | (2) |
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7 Physics of Temperature and Temperature's Role in Carrier Transport |
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61 | (10) |
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8 Overview of Radiation Transport Physics and Space Environments |
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71 | (8) |
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9 Interaction of Radiation with Semiconductor Devices |
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79 | (14) |
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PART III Environments and Prediction Tools |
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93 | (2) |
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10 Orbital Radiation Environments |
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95 | (12) |
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11 CREME96 and Related Error Rate Prediction Methods |
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107 | (16) |
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12 Monte Carlo Simulation of Radiation Effects |
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123 | (14) |
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13 Extreme Environments in Energy Production and Utilization |
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137 | (8) |
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14 Extreme Environments in Transportation |
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145 | (9) |
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PART IV Semiconductor Device Technologies for Extreme Environments |
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154 | (1) |
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15 Radiation Effects in Si CMOS Platforms |
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155 | (20) |
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16 Wide Temperature Range Operation of Si CMOS Platforms |
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175 | (10) |
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17 Trade-Offs between Performance and Reliability in Sub-100 nm RF-CMOS on SOI Technologies |
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185 | (12) |
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197 | (14) |
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19 Using Temperature to Explore the Scaling Limits of SiGe HBTs |
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211 | (14) |
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20 SiC Integrated Circuit Platforms for High-Temperature Applications |
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225 | (8) |
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21 Passive Elements in Silicon Technology |
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233 | (10) |
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22 Power Device Platforms |
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243 | (10) |
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23 CMOS-Compatible Silicon-on-Insulator MESFETs for Extreme Environments |
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253 | (10) |
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263 | (12) |
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275 | (12) |
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26 Radiation Hardening by Process |
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287 | (10) |
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27 Rad-Hard Silicon Technologies at BAE Systems |
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297 | (8) |
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28 Rad-Hard Silicon Technologies at Honeywell |
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305 | (14) |
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29 High-Temperature SOI Technologies at Honeywell |
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319 | (13) |
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PART V Modeling for Extreme Environment Electronic Design |
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332 | (1) |
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30 TCAD of Advanced Transistors |
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333 | (12) |
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345 | (14) |
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32 Mixed-Mode TCAD for Modeling of Single-Event Effects |
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359 | (14) |
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33 Compact Modeling of SiGe HBTs |
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373 | (14) |
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34 Compact Modeling of CMOS Devices |
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387 | (10) |
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35 Compact Modeling of LDMOS Transistors |
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397 | (12) |
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36 Compact Modeling of Power Devices |
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409 | (10) |
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37 Best Practices for Modeling Radiation Effects in Mixed-Signal Circuits |
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419 | (12) |
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38 Compact Model Toolkits |
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431 | (10) |
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PART VI Device and Circuit Reliability in Extreme Environments |
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441 | (2) |
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39 Failure Mechanisms in Modern Integrated Circuits and Industry Best Practices for Reliability Degradation Predictions |
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443 | (8) |
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40 Considerations for the Reliability Estimation of SiGe HBTs |
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451 | (4) |
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41 Considerations for the Reliability Estimation of Silicon CMOS |
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455 | (4) |
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42 Qualification Methodology for Extreme Environment Electronics |
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459 | (14) |
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PART VII Circuit Design for Extreme Environments |
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473 | (2) |
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43 Best Practices in Radiation Hardening by Design |
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475 | (10) |
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44 Investigations of RHBD Techniques for SiGe Devices and Circuits |
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485 | (12) |
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45 Best Practices in Wide Temperature Range Circuit Design |
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497 | (12) |
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46 Achieving Invariability in Analog Circuits Operating in Extreme Environments |
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509 | (11) |
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PART VIII Examples of Extreme Environment Circuit Designs |
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520 | (1) |
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47 Voltage and Current References |
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521 | (8) |
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48 Operational Amplifiers |
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529 | (16) |
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49 Cryogenic Low-Noise Amplifiers |
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545 | (18) |
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563 | (16) |
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51 Analog-to-Digital Converters |
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579 | (6) |
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52 Digital-to-Analog Converters |
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585 | (16) |
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53 CMOS Phase-Locked Loops |
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601 | (18) |
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54 Low-Voltage, Weakly Saturated SiGe HBT Circuits |
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619 | (10) |
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629 | (12) |
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56 Field Programmable Gate Arrays |
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641 | (16) |
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57 Microprocessors and Microcontrollers |
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657 | (6) |
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58 Asynchronous Digital Circuits |
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663 | (12) |
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59 Characterizing SETs in Oscillator Circuits |
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675 | (12) |
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60 Low-Voltage Power Electronics |
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687 | (12) |
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61 Medium-Voltage Power Electronics |
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699 | (14) |
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62 SiC JFET Integrated Circuits for Extreme Environment Electronics |
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713 | (10) |
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63 Using CMOS-Compatible SOI MESFETs for Power Supply Management |
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723 | (10) |
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PART IX Verification of Analog and Mixed-Signal Systems |
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733 | (2) |
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64 Model-Based Verification |
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735 | (14) |
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65 Event-Driven Mixed-Signal Modeling Techniques for System-in-Package Functional Verification |
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749 | (14) |
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PART X Packaging for Extreme Environments |
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763 | (2) |
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66 Electronic Packaging Approaches for Low-Temperature Environments |
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765 | (12) |
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67 Electronic Packaging Approaches for High-Temperature Environments |
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777 | (14) |
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68 Failure Analysis of Electronic Packaging |
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791 | (12) |
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69 Silicon Carbide Power Electronics Packaging |
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803 | (17) |
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PART XI Real-World Extreme Environment Applications |
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820 | (1) |
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70 A SiGe Remote Sensor Interface |
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821 | (10) |
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71 A SiGe Remote Electronics Unit |
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831 | (8) |
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72 Distributed Motor Controller for Operation in Extreme Environments |
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839 | (10) |
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73 Radiation-Hard Multichannel Digitizer ASIC for Operation in the Jovian Environment |
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849 | (14) |
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74 Approaches to Commercial Communications Satellite Design |
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863 | (10) |
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75 UHF Micro-Transceiver Development Project |
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873 | (10) |
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76 Down-Hole Instrumentation Package for Energy Well Drilling |
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883 | (4) |
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77 Electronics Requirements for Collider Physics Experiments |
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887 | (8) |
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78 Cryogenic Electronics for High-Energy Physics Experiments |
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895 | (14) |
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79 Radar Systems for Extreme Environments |
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909 | (16) |
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Appendix A Properties of Silicon and Germanium |
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925 | (2) |
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Appendix B Temperature and Energy Scales |
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927 | (4) |
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Appendix C Planetary Temperature Ranges and Radiation Levels |
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931 | (4) |
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Appendix D Ionizing Radiation Test Facilities |
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935 | (8) |
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Appendix E Radiation Testing Protocols and Mil-Spec Standards |
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943 | (6) |
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Appendix F Primer on the Semiconductor Transport Equations and Their Solution |
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949 | (10) |
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Appendix G Primer on MOSFETs |
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959 | (4) |
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Appendix H Primer on Si and SiGe Bipolar Transistors |
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963 | (10) |
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Appendix I Compendium of NASA's COTS Radiation Test Data |
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973 | (4) |
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Appendix J Compendium of NASA's COTS Extreme Temperature Test Data |
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977 | (12) |
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Index |
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