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E-raamat: Formal Methods for Industrial Critical Systems: 26th International Conference, FMICS 2021, Paris, France, August 24-26, 2021, Proceedings

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Formal Methods for Industrial Critical Systems: 26th International Conference, FMICS 2021, Paris, France, August 24-26, 2021, ProceedingsSuurem pilt
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This book constitutes the proceedings of the 26th International Workshop on Formal Methods for Industrial Critical Systems, FMICS 2021, which was held during August 24-26, 2021. The conference was planned to take place in Pairs, France. Due to the COVID-19 pandemic it changed to a virtual event.





The 10 full papers and 6 short papers presented in this volume were carefully reviewed and selected from 31 submissions. The papers are organized in topical sections as follows: Verification, Program Safety and Education, (Event-)B Modeling and Validation, Formal Analysis, Tools, Test Generation and Probabilistic Verification.

Verification.- Verification of Co-Simulation Algorithms Subject to Algebraic Loops and Adaptive Steps.- Automated Verification of Temporal Properties of Ladder Programs.- Spatial Model Checking for Smart Stations: Research Challenges.- Program Safety and Education.- Parametric Faults in Safety Critical Programs.- Modular Transformation of Java Exceptions Modulo Errors.- On education and training in formal methods for industrial critical systems .- (Event-)B Modeling and Validation.- Improving SMT Solver Integrations for the Validation of B and Event-B Models.- Standard Conformance-by-Construction with Event-B.- Formal Analysis.- Randomized Reachability Analysis in Uppaal: Fast Error Detection in Timed Systems.- Verifying the Mathematical Library of an UAV Autopilot with Frama-C.- Formal Analysis of the UNISIG Safety Application Intermediate Sub-Layer.- Tools.- ProB2-UI: A Java-based User Interface for ProB.- Intrepid: a Scriptable and Cloud-ready SMT-based Model Checker.- Merit and Blame Assignment with Kind 2.- Test Generation and Probabilistic Verification.- PSY-TaLiRo: A Python Toolbox for Search-Based Test Generation for Cyber-Physical Systems.- Probabilistic Verification for Reliability of a Two-by-Two Network-on-Chip System.

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