About the Authors/Contributors |
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Chapter 1 Transmission Line Fundamentals |
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1 | (26) |
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1 | (9) |
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Electromagnetics Field Theory |
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1 | (5) |
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Propagation of Plane Waves |
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6 | (4) |
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10 | (8) |
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Wave Equations on Lossless Transmission Lines |
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11 | (3) |
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Impedance, Reflection Coefficient, and Power Flow on a Lossless Transmission Line |
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14 | (2) |
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Traveling and Standing Waves on a Transmission Line |
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16 | (2) |
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Transmission Line Structures |
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18 | (8) |
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19 | (1) |
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20 | (1) |
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21 | (1) |
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22 | (4) |
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26 | (1) |
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Chapter 2 PCB design for Signal Integrity |
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27 | (90) |
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27 | (4) |
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28 | (3) |
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31 | (11) |
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31 | (2) |
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33 | (9) |
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Frequency Domain Analysis |
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42 | (16) |
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42 | (2) |
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44 | (2) |
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Integrated Insertion Loss Noise |
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46 | (3) |
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49 | (2) |
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51 | (3) |
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54 | (1) |
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55 | (3) |
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58 | (37) |
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Impedance Target (Routing Impedance) |
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59 | (2) |
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61 | (1) |
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62 | (3) |
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65 | (3) |
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Crosstalk Mitigation through StackUp |
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68 | (5) |
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73 | (11) |
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Densely Broadside Coupled Dual Stripline |
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84 | (2) |
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86 | (9) |
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95 | (20) |
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96 | (3) |
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99 | (2) |
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101 | (6) |
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107 | (3) |
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110 | (1) |
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111 | (4) |
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115 | (2) |
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Chapter 3 Channel Modeling and Simulation |
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117 | (46) |
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117 | (21) |
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117 | (1) |
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Checking for Model Causality |
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118 | (2) |
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Causal Frequency-Dependent Model |
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120 | (1) |
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121 | (5) |
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126 | (1) |
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127 | (3) |
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130 | (3) |
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133 | (4) |
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Ideal Assumptions: Homogeneous Impedance |
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137 | (1) |
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Ideal Assumptions: Crosstalk Aggressors |
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137 | (1) |
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138 | (3) |
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138 | (1) |
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Spice Voltage Source Model |
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139 | (2) |
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141 | (5) |
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142 | (2) |
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144 | (2) |
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146 | (4) |
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147 | (1) |
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148 | (1) |
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148 | (1) |
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149 | (1) |
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150 | (6) |
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150 | (1) |
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150 | (2) |
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152 | (1) |
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153 | (1) |
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154 | (1) |
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154 | (2) |
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156 | (5) |
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158 | (1) |
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158 | (2) |
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160 | (1) |
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160 | (1) |
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Signal Selection for 3D Package Structures |
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161 | (1) |
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161 | (2) |
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Chapter 4 Link Circuits and Architecture |
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163 | (36) |
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Types of Link Circuit Architectures |
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163 | (2) |
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Embedded Clock Architecture |
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163 | (1) |
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Forwarded Clock Architecture |
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164 | (1) |
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165 | (5) |
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165 | (1) |
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166 | (1) |
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167 | (1) |
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Termination Calibration Circuits |
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168 | (1) |
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Termination Detection Circuits |
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169 | (1) |
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170 | (9) |
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171 | (2) |
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173 | (1) |
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174 | (3) |
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177 | (2) |
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179 | (11) |
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180 | (2) |
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182 | (2) |
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Continuous-Time Linear Equalizer |
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184 | (1) |
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Decision Feedback Equalizer |
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184 | (2) |
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186 | (1) |
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186 | (1) |
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187 | (1) |
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188 | (2) |
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190 | (5) |
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Clock and Data Recovery Loop |
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191 | (1) |
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192 | (3) |
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195 | (1) |
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195 | (1) |
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Design for Test/Manufacture |
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195 | (3) |
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196 | (1) |
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196 | (2) |
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198 | (1) |
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Chapter 5 Measurement and Data Acquisition Techniques |
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199 | (22) |
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Digital Oscilloscope Measurement |
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199 | (5) |
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Real-Time and Equivalent-Time Sampling Scopes |
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199 | (1) |
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200 | (2) |
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Scope Digital Filter Applications |
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202 | (2) |
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204 | (7) |
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De-skew Differential Pairs with TDR |
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205 | (2) |
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Channel Characterization with TDR |
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207 | (2) |
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Return Loss Measurement with TDR |
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209 | (2) |
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Vector Network Analyzer Measurement |
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211 | (8) |
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211 | (2) |
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VNA Error Sources and Calibration |
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213 | (4) |
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Full Two-Port SOLT Calibration Procedure |
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217 | (1) |
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Example of Measurement Using VNA |
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217 | (1) |
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VNA Measurement Procedure |
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218 | (1) |
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219 | (2) |
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Chapter 6 Designing and Validating with Intel Processors |
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221 | (30) |
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Designing Systems with Intel Devices |
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221 | (16) |
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221 | (2) |
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223 | (2) |
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Automatic Equalization Adaptation |
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225 | (2) |
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227 | (5) |
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Solution from Design of Experiments |
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232 | (2) |
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Solution from Typical Models |
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234 | (3) |
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System Validation with Intel Devices |
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237 | (13) |
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237 | (1) |
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Types of I/O Design Validation |
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238 | (1) |
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System Margining Validation Overview |
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239 | (5) |
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DDR System Margining Validation |
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244 | (2) |
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High-Speed Serial I/O Margining Validation |
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246 | (3) |
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Low-Margin Debug Guidance |
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249 | (1) |
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250 | (1) |
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250 | (1) |
Index |
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