1 Dimensions, Bits, and Wows in Accelerating Materials Discovery |
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1 | (14) |
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1 | (2) |
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1.2 Creativity and Discovery |
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3 | (2) |
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1.3 Discovering Dimensions |
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5 | (1) |
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6 | (2) |
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1.5 Pursuit of Bayesian Surprise |
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8 | (3) |
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11 | (1) |
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11 | (4) |
2 Is Automated Materials Design and Discovery Possible? |
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15 | (44) |
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2.1 Model Determination in Materials Science |
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16 | (1) |
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16 | (1) |
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16 | (1) |
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2.2 Identification of the Research and Issues |
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17 | (4) |
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2.2.1 Reducing the Degrees of Freedom in Model Determination |
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17 | (2) |
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19 | (2) |
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2.3 Introduction to Uncertainty Quantification |
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21 | (3) |
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21 | (3) |
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2.4 Generalizations and Comparisons |
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24 | (3) |
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2.4.1 Prediction, Extrapolation, Verification and Validation |
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24 | (1) |
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2.4.2 Comparisons with Other UQ Methods |
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25 | (2) |
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2.5 Optimal Uncertainty Quantification |
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27 | (4) |
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28 | (3) |
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2.6 The Optimal UQ Problem |
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31 | (5) |
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2.6.1 From Theory to Computation |
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31 | (5) |
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36 | (4) |
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2.7.1 The Optimal UQ Loop |
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36 | (4) |
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2.8 Model-Form Uncertainty |
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40 | (2) |
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2.8.1 Optimal UQ and Model Error |
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40 | (1) |
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2.8.2 Game-Theoretic Formulation and Model Error |
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41 | (1) |
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2.9 Design and Decision-Making Under Uncertainty |
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42 | (2) |
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2.9.1 Optimal UQ for Vulnerability Identification |
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42 | (1) |
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2.9.2 Data Collection for Design Optimization |
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43 | (1) |
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2.10 A Software Framework for Optimization and UQ in Reduced Search Space |
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44 | (9) |
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2.10.1 Optimization and UQ |
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44 | (1) |
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2.10.2 A Highly-Configurable Optimization Framework |
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45 | (1) |
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2.10.3 Reduction of Search Space |
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46 | (3) |
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2.10.4 New Massively-Parallel Optimization Algorithms |
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49 | (1) |
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2.10.5 Probability and Uncertainty Tooklit |
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50 | (3) |
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53 | (1) |
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2.11.1 Scalability Through Asynchronous Parallel Computing |
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53 | (1) |
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54 | (5) |
3 Importance of Feature Selection in Machine Learning and Adaptive Design for Materials |
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59 | (22) |
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60 | (2) |
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3.2 Computational Details |
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62 | (2) |
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3.2.1 Density Functional Theory |
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62 | (1) |
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63 | (1) |
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63 | (1) |
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64 | (9) |
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73 | (3) |
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76 | (1) |
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77 | (4) |
4 Bayesian Approaches to Uncertainty Quantification and Structure Refinement from X-Ray Diffraction |
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81 | (22) |
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81 | (2) |
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4.2 Classical Methods of Structure Refinement |
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83 | (4) |
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4.2.1 Classical Single Peak Fitting |
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83 | (1) |
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4.2.2 The Rietveld Method |
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84 | (2) |
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4.2.3 Frequentist Inference and Its Limitations |
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86 | (1) |
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87 | (3) |
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4.3.1 Sampling Algorithms |
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89 | (1) |
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4.4 Application of Bayesian Inference to Single Peak Fitting: A Case Study in Ferroelectric Materials |
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90 | (4) |
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92 | (1) |
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4.4.2 Prediction Intervals |
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93 | (1) |
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4.5 Application of Bayesian Inference to Full Pattern Crystallographic Structure Refinement: A Case Study |
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94 | (6) |
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4.5.1 Data Collection and the Rietveld Analysis |
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95 | (1) |
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4.5.2 Importance of Modelling the Variance and Correlation of Residuals |
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96 | (1) |
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4.5.3 Bayesian Analysis of the NIST Silicon Standard |
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97 | (1) |
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4.5.4 Comparison of the Structure Refinement Approaches |
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97 | (2) |
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99 | (1) |
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100 | (1) |
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101 | (2) |
5 Deep Data Analytics in Structural and Functional Imaging of Nanoscale Materials |
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103 | (26) |
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104 | (2) |
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5.2 Case Study 1. Interplay Between Different Structural Order Parameters in Molecular Self-assembly |
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106 | (9) |
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5.2.1 Model System and Problem Overview |
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106 | (1) |
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5.2.2 How to Find Positions of All Molecules in the Image? |
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107 | (1) |
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5.2.3 Identifying Molecular Structural Degrees of Freedom via Computer Vision |
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108 | (4) |
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5.2.4 Application to Real Experimental Data: From Imaging to Physics and Chemistry |
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112 | (3) |
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5.3 Case Study 2. Role of Lattice Strain in Formation of Electron Scattering Patterns in Graphene |
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115 | (6) |
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5.3.1 Model System and Problem Overview |
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115 | (1) |
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5.3.2 How to Extract Structural and Electronic Degrees of Freedom Directly from an Image? |
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116 | (1) |
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5.3.3 Direct Data Mining of Structure and Electronic Degrees of Freedom in Graphene |
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117 | (4) |
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5.4 Case Study 3. Correlative Analysis in Multi-mode Imaging of Strongly Correlated Electron Systems |
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121 | (5) |
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5.4.1 Model System and Problem Overview |
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121 | (1) |
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5.4.2 How to Obtain Physically Meaningful Endmembers from Hyperspectral Tunneling Conductance Data? |
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122 | (4) |
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5.5 Overall Conclusion and Outlook |
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126 | (1) |
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127 | (2) |
6 Data Challenges of In Situ X-Ray Tomography for Materials Discovery and Characterization |
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129 | (38) |
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130 | (3) |
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133 | (3) |
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136 | (5) |
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6.4 Experimental and Image Acquisition |
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141 | (4) |
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145 | (1) |
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146 | (2) |
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148 | (3) |
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151 | (1) |
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152 | (1) |
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6.10 Analyze and Advanced Processing |
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153 | (3) |
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156 | (2) |
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158 | (9) |
7 Overview of High-Energy X-Ray Diffraction Microscopy (HEDM) for Mesoscale Material Characterization in Three-Dimensions |
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167 | (36) |
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167 | (4) |
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168 | (1) |
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169 | (2) |
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7.2 Brief Background on Scattering Physics |
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171 | (7) |
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7.2.1 Scattering by an Atom |
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172 | (2) |
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7.2.2 Crystallographic Planes |
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174 | (1) |
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7.2.3 Diffraction by a Small Crystal |
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175 | (2) |
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177 | (1) |
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7.3 High-Energy X-Ray Diffraction Microscopy (HEDM) |
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178 | (3) |
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178 | (1) |
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179 | (2) |
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7.4 Microstructure Representation |
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181 | (2) |
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183 | (11) |
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7.5.1 Tracking Plastic Deformation in Polycrystalline Copper Using Nf-HEDM |
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183 | (3) |
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7.5.2 Combined nf- and ff-HEDM for Tracking Inter- granular Stress in Titanium Alloy |
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186 | (1) |
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7.5.3 Tracking Lattice Rotation Change in Interstitial-Free (IF) Steel Using HEDM |
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187 | (2) |
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7.5.4 Grain-Scale Residual Strain (Stress) Determination in Ti-7Al Using HEDM |
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189 | (1) |
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7.5.5 In-Situ ff-HEDM Characterization of Stress-Induced Phase Transformation in Nickel-Titanium Shape Memory Alloys (SMA) |
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190 | (1) |
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7.5.6 HEDM Application to Nuclear Fuels |
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191 | (1) |
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7.5.7 Utilizing HEDM to Characterize Additively Manufactured 316L Stainless Steel |
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192 | (2) |
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7.6 Conclusions and Perspectives |
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194 | (4) |
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7.6.1 Establishing Processing-Structure- Property- Performance Relationships |
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196 | (2) |
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198 | (5) |
8 Bragg Coherent Diffraction Imaging Techniques at 3rd and 4th Generation Light Sources |
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203 | (14) |
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204 | (7) |
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8.2 BCDI Methods at Light Sources |
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211 | (1) |
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8.3 Big Data Challenges in BCDI |
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212 | (2) |
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214 | (1) |
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214 | (3) |
9 Automatic Tuning and Control for Advanced Light Sources |
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217 | (36) |
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218 | (14) |
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220 | (2) |
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222 | (1) |
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223 | (1) |
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224 | (2) |
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9.1.5 Need for Feedback Control |
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226 | (1) |
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9.1.6 Standart Proportional Integral (PI) Control for RF Cavity |
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227 | (5) |
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9.2 Advanced Control and Tuning Topics |
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232 | (1) |
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9.3 Introduction to Extremum Seeking Control |
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233 | (16) |
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9.3.1 Physical Motivation |
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234 | (2) |
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236 | (2) |
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9.3.3 ES for RF Beam Loading Compensation |
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238 | (2) |
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9.3.4 ES for Magnet Tuning |
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240 | (2) |
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9.3.5 ES for Electron Bunch Longitudinal Phase Space Prediction |
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242 | (4) |
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9.3.6 ES for Phase Space Tuning |
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246 | (3) |
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249 | (1) |
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249 | (4) |
Index |
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253 | |