Muutke küpsiste eelistusi

E-raamat: Mems Packaging

Edited by (Iot Technologies Inc, Usa), Edited by (Nat'l Chiao Tung Univ, Taiwan), Edited by (Univ Of Colorado Boulder, Usa)
Teised raamatud teemal:
  • Formaat - EPUB+DRM
  • Hind: 121,68 €*
  • * hind on lõplik, st. muud allahindlused enam ei rakendu
  • Lisa ostukorvi
  • Lisa soovinimekirja
  • See e-raamat on mõeldud ainult isiklikuks kasutamiseks. E-raamatuid ei saa tagastada.
Teised raamatud teemal:

DRM piirangud

  • Kopeerimine (copy/paste):

    ei ole lubatud

  • Printimine:

    ei ole lubatud

  • Kasutamine:

    Digitaalõiguste kaitse (DRM)
    Kirjastus on väljastanud selle e-raamatu krüpteeritud kujul, mis tähendab, et selle lugemiseks peate installeerima spetsiaalse tarkvara. Samuti peate looma endale  Adobe ID Rohkem infot siin. E-raamatut saab lugeda 1 kasutaja ning alla laadida kuni 6'de seadmesse (kõik autoriseeritud sama Adobe ID-ga).

    Vajalik tarkvara
    Mobiilsetes seadmetes (telefon või tahvelarvuti) lugemiseks peate installeerima selle tasuta rakenduse: PocketBook Reader (iOS / Android)

    PC või Mac seadmes lugemiseks peate installima Adobe Digital Editionsi (Seeon tasuta rakendus spetsiaalselt e-raamatute lugemiseks. Seda ei tohi segamini ajada Adober Reader'iga, mis tõenäoliselt on juba teie arvutisse installeeritud )

    Seda e-raamatut ei saa lugeda Amazon Kindle's. 

MEMS sensors and actuators are enabling components for smartphones, AR/VR, and wearable electronics. MEMS packaging is recognized as one of the most critical activities to design and manufacture reliable MEMS. A unique challenge to MEMS packaging is how to protect moving MEMS devices during manufacturing and operation. With the introduction of wafer level capping and encapsulation processes, this barrier is removed successfully. In addition, MEMS devices should be integrated with their electronic chips with the smallest footprint possible. As a result, 3D packaging is applied to connect the devices vertically for the most effective integration. Such 3D packaging also paves the way for further heterogenous integration of MEMS devices, electronics, and other functional devices.This book consists of chapters written by leaders developing products in a MEMS industrial setting and faculty members conducting research in an academic setting. After an introduction chapter, the practical issues are covered: through-silicon vias (TSVs), vertical interconnects, wafer level packaging, motion sensor-to-CMOS bonding, and use of printed circuit board technology to fabricate MEMS. These chapters are written by leaders developing MEMS products. Then, fundamental issues are discussed, topics including encapsulation of MEMS, heterogenous integration, microfluidics, solder bonding, localized sealing, microsprings, and reliability.
Preface v
List of Contributors
vii
Chapter 1 Introduction to MEMS Packaging
1(30)
Y. C. Lee
Ramesh Ramadoss
Nils Hoivik
Chapter 2 Silex's TSV Technology: Overview of Processes and MEMS Applications
31(14)
Tomas Bauer
Thorbjorn Ebefors
Chapter 3 Vertical Interconnects for High-End MEMS
45(8)
Maaike M. Visser Taklo
Sigurd Moe
Chapter 4 Using Wafer-Level Packaging to Improve Sensor Manufacturability and Cost
53(20)
Paul Pickering
Collin Twanow
Dean Spicer
Chapter 5 Nasiri Fabrication Process for Low-Cost Motion Sensors in the Consumer Market
73(12)
Steven Nasiri
Sandra Winkler
Ramesh Ramadoss
Chapter 6 PCB Based MEMS and Microfluidics
85(32)
Ramesh Ramadoss
Antonio Luque
Carmen Aracil
Chapter 7 Single Wafer Encapsulation of MEMS Resonators
117(24)
Janna Rodriguez
Thomas W. Kenny
Chapter 8 Heterogeneous Integration and Wafer-Level Packaging of MEMS
141(30)
Masayoshi Esashi
Shuji Tanaka
Chapter 9 Packaging of Membrane-Based Polymer Microfluidic Systems
171(26)
Yu-Chuan Su
Chapter 10 Wafer-Level Solder Bonding by Using Localized Induction Heating
197(26)
Hsueh-An Yang
Chiung-Wen Lin
Weileun Fang
Chapter 11 Localized Sealing Schemes for MEMS Packaging
223(28)
Y. T. Cheng
Y. C. Su
Liwei Lin
Chapter 12 Microsprings for High-Density Flip-Chip Packaging
251(28)
Eugene M. Chow
Christopher L. Chua
Chapter 13 MEMS Reliability
279(66)
Chien-Ming Huang
Arvind Sai SarathiVasan
Yunhan Huang
Ravi Doraiswami
Michael Osterman
Michael Pecht
Index 345