Muutke küpsiste eelistusi

E-raamat: Microstructural Characterisation Techniques

  • Formaat - EPUB+DRM
  • Hind: 55,56 €*
  • * hind on lõplik, st. muud allahindlused enam ei rakendu
  • Lisa ostukorvi
  • Lisa soovinimekirja
  • See e-raamat on mõeldud ainult isiklikuks kasutamiseks. E-raamatuid ei saa tagastada.

DRM piirangud

  • Kopeerimine (copy/paste):

    ei ole lubatud

  • Printimine:

    ei ole lubatud

  • Kasutamine:

    Digitaalõiguste kaitse (DRM)
    Kirjastus on väljastanud selle e-raamatu krüpteeritud kujul, mis tähendab, et selle lugemiseks peate installeerima spetsiaalse tarkvara. Samuti peate looma endale  Adobe ID Rohkem infot siin. E-raamatut saab lugeda 1 kasutaja ning alla laadida kuni 6'de seadmesse (kõik autoriseeritud sama Adobe ID-ga).

    Vajalik tarkvara
    Mobiilsetes seadmetes (telefon või tahvelarvuti) lugemiseks peate installeerima selle tasuta rakenduse: PocketBook Reader (iOS / Android)

    PC või Mac seadmes lugemiseks peate installima Adobe Digital Editionsi (Seeon tasuta rakendus spetsiaalselt e-raamatute lugemiseks. Seda ei tohi segamini ajada Adober Reader'iga, mis tõenäoliselt on juba teie arvutisse installeeritud )

    Seda e-raamatut ei saa lugeda Amazon Kindle's. 

This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.

Introduction.- Electromagnetic Waves and Electron Waves.- Fourier
Analysis and Fourier Transformation.- Transmission Electron Microscope.-
Electron Diffraction.- Optical Microscopy.- Transmission Electron
Microscopy.- Lens-less Electron Microscopy
Prof. Gunturi Venkata Sitarama Sastry is former Professor, Department of Metallurgical Engineering and also Dean of Academic Affairs, IIT(BHU), Varanasi, India for a three year period. He began extensive use of transmission electron microscopy since his doctoral work on rapidly quenched aluminum alloys at IT-BHU, Varanasi. His research tools have been diverse microstructural characterization techniques with major emphasis on TEM. Most of his publications in high impact international Journals reect this vast expertise in the eld. Several of his students beneted from his courses on metallographic techniques taught at the Department of Metallurgical Engineering, IIT(BHU), Varanasi, India (formerly Institute of Technology, BHU). He also conducted many short-term courses on electron microscopy and associated techniques at various institutions and research laboratories. He headed the National Electron Microscopy Facility established at the Department for over ve years and later worked for the augmentation of new facilities over there. The Electron Microscope Society of India recognized his contributions to the eld by bestowing upon him the Lifetime Achievement Award 2017.