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Section 1.1 Theoretical Aspects of Charge Transport in Organic Semiconductors A Molecular Perspective |
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1 | (26) |
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Demetrio A. da Silva Filho |
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1 | (2) |
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A Primer on Electron-Transfer Theory |
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3 | (2) |
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Electron-Vibration Coupling and Reorganization Energy |
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5 | (5) |
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Intramolecular Reorganization Energy |
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5 | (3) |
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Intramolecular Reorganization Energy of Oligoacenes |
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8 | (2) |
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10 | (6) |
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Influence of Intermolecular Separation |
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12 | (1) |
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Influence of Long- or Short-Axis Displacements |
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13 | (3) |
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From Molecular Parameters to Carrier Mobilities |
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16 | (6) |
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Influence of the Electric Field |
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17 | (1) |
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Influence of the Reorganization Energy |
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18 | (1) |
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Influence of Intermolecular Distance |
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18 | (2) |
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Influence of Molecular Translations |
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20 | (1) |
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Introduction of a Gaussian Disorder |
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21 | (1) |
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22 | (5) |
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22 | (5) |
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Section 2.1 Charge Carrier Transport in Single-Crystal Organic Field-Effect Transistors |
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27 | (46) |
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Introduction: The Field Effect in Small-Molecule Organic Semiconductors |
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28 | (2) |
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Fabrication of Single-Crystal OFETs |
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30 | (8) |
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Charge Transport on the Surface of Organic Single Crystals |
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38 | (21) |
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38 | (8) |
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The Multiple Trap-and-Release Model |
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46 | (2) |
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Anisotropy of the Mobility |
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48 | (2) |
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Longitudinal and Hall Conductivity in Rubrene OFETs |
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50 | (4) |
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Comparison with the Holstein--Peierls Model and Transport Measurements in the Bulk of Organic Crystals |
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54 | (1) |
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Tuning the Intermolecular Distance |
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55 | (1) |
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Surface versus Bulk Transport |
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56 | (2) |
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Photoinduced Processes in Single-Crystal OFETs |
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58 | (1) |
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Defects at the Surface of Organic Crystals |
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59 | (6) |
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Bulk and Surface Electronic Defects in Organic Crystals |
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61 | (2) |
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Density of Defects in Single-Crystal OFETs |
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63 | (1) |
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Single-Crystal OFETs as Tools to Study Surface Defects |
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64 | (1) |
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65 | (8) |
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67 | (1) |
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67 | (6) |
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Section 2.2 Charge Transport in Oligomers |
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73 | (30) |
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73 | (2) |
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Operating Mode of the Organic Thin-Film Transistor |
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75 | (2) |
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Charge Transport in Conjugated Oligomers |
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77 | (9) |
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78 | (2) |
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80 | (5) |
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Polarization in Molecular Crystals |
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80 | (2) |
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82 | (1) |
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83 | (2) |
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85 | (1) |
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Trap Limited Transport in Organic Transistors |
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86 | (3) |
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89 | (8) |
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91 | (1) |
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91 | (4) |
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Contact Resistance Extraction |
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91 | (3) |
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Origin of Contact Resistance |
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94 | (1) |
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95 | (2) |
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97 | (6) |
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97 | (2) |
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99 | (4) |
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Section 2.3 Charge Transport Physics of Solution-Processed Organic Field-Effect Transistors |
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103 | (36) |
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103 | (3) |
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Solution-Processable p-Type Organic Semiconductors |
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106 | (5) |
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106 | (4) |
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Solution-Processable Small Molecules |
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110 | (1) |
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Solution-Processable n-Type Organic Semiconductors |
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111 | (1) |
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112 | (3) |
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115 | (9) |
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124 | (3) |
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Defect States and Device Degradation Mechanisms |
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127 | (3) |
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130 | (9) |
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130 | (9) |
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Section 2.4 Contact Effects in Organic Field-Effect Transistors |
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139 | (20) |
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139 | (1) |
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Definition of an Ohmic Contact |
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140 | (1) |
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Origins of Contact Resistance |
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140 | (8) |
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Electronic Structure and Potential Barriers at Metal--Organic Interfaces |
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140 | (2) |
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Charge Transport across Metal--Organic Interfaces |
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142 | (3) |
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Influence of Channel Dimensions |
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145 | (1) |
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Influence of Device Architecture |
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146 | (2) |
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Measuring Contact Resistance |
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148 | (6) |
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Extrapolation of Device Resistance to Zero Channel Length |
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148 | (1) |
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Gated Four-Probe Measurements |
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149 | (1) |
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Kelvin Probe Force Microscopy |
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150 | (1) |
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Measured Contact Resistance Values |
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151 | (3) |
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154 | (5) |
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154 | (1) |
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Ambipolar and Light-Emitting OFETs |
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155 | (1) |
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Channel Dimensions: How Small? |
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155 | (4) |
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155 | (4) |
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Section 3.1 Design, Synthesis, and Transistor Performance of Organic Semiconductors |
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159 | (70) |
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160 | (1) |
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p-Channel Organic Semiconductors |
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161 | (30) |
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Acenes and Non-Thiophene-Based Semiconductor |
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162 | (15) |
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162 | (4) |
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Fused and Extended Heteroarenes |
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166 | (7) |
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173 | (1) |
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173 | (2) |
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175 | (2) |
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Thiophene-Based Oligomers |
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177 | (6) |
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183 | (5) |
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Solution Processable Semiconductors: The ``Precursor Method'' |
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188 | (3) |
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Precusor Polymers and Small Molecules |
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189 | (2) |
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191 | (1) |
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N-Channel Organic Semiconductors |
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191 | (11) |
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Fullerenes and Fullerene Derivatives |
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192 | (1) |
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192 | (2) |
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Naphthalene, Diimide Derivatives |
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194 | (1) |
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Perylene Diimide Derivatives |
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195 | (2) |
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197 | (1) |
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Thiophene Based n-Channel Oligomers |
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197 | (3) |
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Trifluoromethylphenyl-Based Oligomers |
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200 | (1) |
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201 | (1) |
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202 | (1) |
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203 | (26) |
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214 | (15) |
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Section 3.2 Dielectric Materials: Selection and Design |
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229 | (24) |
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229 | (2) |
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Fundamentals and Figures of Merit |
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231 | (4) |
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Factors Affecting the Dielectric Constant |
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232 | (1) |
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233 | (1) |
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233 | (1) |
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234 | (1) |
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Importance of Interface between Dielectric and Semiconductor |
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234 | (1) |
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234 | (1) |
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235 | (1) |
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Major Classes of Dielectric Materials |
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235 | (5) |
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235 | (2) |
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237 | (3) |
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Alternative Gate Dielectric Strategies |
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240 | (8) |
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Gate Dielectrics through Anodization of Thin-Metal Films |
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240 | (1) |
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Surface Treatment of Inorganic Materials |
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241 | (1) |
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Self-Assembled Monolayers/Multilayers |
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242 | (3) |
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Nanocomposite and Nanostructured Dielectrics |
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245 | (3) |
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248 | (5) |
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248 | (5) |
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Section 4.1 Grazing Incidence X-Ray Diffraction (GIXD) |
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253 | (24) |
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253 | (5) |
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Two Possible Geometrical Setups |
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255 | (2) |
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257 | (1) |
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257 | (1) |
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Interpretation of the Diffraction Data |
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258 | (6) |
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Calculation of Structure Factor |
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261 | (2) |
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Calculation of Angle between a- and b-Axes |
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263 | (1) |
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264 | (8) |
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Poly(3-hexyl thiophene) (P3HT) |
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264 | (5) |
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269 | (2) |
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271 | (1) |
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272 | (5) |
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273 | (4) |
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Section 4.2 Near-Edge X-Ray Absorption Fine Structure (NEXAFS) Spectroscopy |
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277 | (24) |
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277 | (7) |
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The Importance of Structure |
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277 | (3) |
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280 | (2) |
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NEXAFS for Organic Electronics |
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282 | (2) |
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Experimental Considerations |
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284 | (3) |
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Data Analysis for Orientation |
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287 | (2) |
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Examples of Applied NEXAFS Spectroscopy |
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289 | (6) |
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289 | (3) |
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292 | (2) |
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NEXAFS of Oriented Liquid Crystalline Polymers |
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294 | (1) |
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NEXAFS for Molecular Electronics |
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295 | (1) |
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Future Horizons for NEXAFS Spectroscopy |
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295 | (6) |
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296 | (5) |
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Section 4.3 Scanning Probe Techniques |
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301 | (40) |
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301 | (2) |
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Atomic Force Microscopy (AFM) |
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303 | (7) |
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304 | (1) |
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Basic Principle of Intermediate Contact Mode (Tapping Mode) |
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305 | (1) |
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306 | (4) |
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Electric Force Microscopy (EFM) |
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310 | (6) |
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311 | (2) |
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313 | (3) |
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Kelvin Probe Force Microscopy (KFM) |
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316 | (3) |
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Conducting Probe AFM (CP-AFM or C-AFM) |
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319 | (22) |
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321 | (20) |
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331 | (10) |
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Section 5.1 Vacuum Evaporated Thin Films |
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341 | (30) |
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341 | (5) |
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Film Growth Technology Considerations |
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342 | (1) |
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Describing Film Growth: Thermodynamics and Kinetics |
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343 | (2) |
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Inorganics versus Organics |
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345 | (1) |
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Thin Film Characterization Techniques |
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346 | (3) |
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Scanning Probe Techniques |
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347 | (1) |
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348 | (1) |
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Electron-Based Techniques |
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348 | (1) |
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Organic Film Growth Kinetics |
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349 | (15) |
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Thermodynamic Driving Force |
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351 | (1) |
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Rate Equations: Microscopic |
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352 | (11) |
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353 | (2) |
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Dynamic Island Size Distribution |
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355 | (3) |
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Beyond the First Layer: Birth--Death Models |
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358 | (5) |
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Rate Equations: Macroscopic |
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363 | (1) |
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364 | (1) |
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364 | (1) |
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Effect of Surface Roughness |
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364 | (1) |
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365 | (6) |
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366 | (5) |
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Section 5.2 Solution Deposition of Polymers |
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371 | (32) |
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371 | (3) |
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Solution Casting and Spin-Coating to Form Self-Assembled Polymers |
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374 | (18) |
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374 | (8) |
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382 | (5) |
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387 | (5) |
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392 | (11) |
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395 | (8) |
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Section 5.3 Solution Deposition of Oligomers |
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403 | (16) |
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403 | (1) |
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404 | (5) |
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409 | (5) |
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Conclusion and Future Prospects |
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414 | (5) |
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414 | (5) |
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Section 5.4 Inkjet Printed Organic Thin Film Transistors |
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419 | (14) |
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419 | (1) |
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Subtractive Methods --- Printing Electrodes |
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420 | (2) |
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Additive Methods --- Printing Semiconductors and Encapsulation Layers |
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422 | (5) |
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Display Backplane Fabrication |
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427 | (6) |
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431 | (2) |
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Section 5.5 Soft Lithography for Fabricating Organic Thin-Film Transistors |
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433 | (74) |
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Typical Device Structures and Conventional Fabrication Techniques |
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433 | (2) |
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Stamps for Soft Lithography |
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435 | (3) |
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Microcontact Printing (μCP) |
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438 | (9) |
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439 | (2) |
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Selective Electroless Plating |
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441 | (2) |
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Selective Chemical or Electrochemical Polymerization |
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443 | (1) |
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444 | (1) |
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Other Microcontact Printing Derivatives |
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445 | (2) |
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Nanotransfer Printing (nTP) |
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447 | (11) |
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Soft-Contact Lamination (ScL) |
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458 | (8) |
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466 | (2) |
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468 | (1) |
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469 | (1) |
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Micromolding in Capillaries (MIMIC) |
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469 | (4) |
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Soft-Contact Optical Lithography |
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473 | (2) |
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Laser Thermal Transfer Printing |
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475 | (1) |
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475 | (14) |
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483 | (6) |
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Section 6.1 Radio Frequency Identification Tags |
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489 | (1) |
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489 | (1) |
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An Overview of RFID Standards and Classifications |
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490 | (1) |
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490 | (1) |
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491 | (1) |
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491 | (1) |
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Radio Frequency Identification Using Silicon: A Review |
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491 | (1) |
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All-Printed RFID Tags: Topology and Architecture Framework |
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492 | (8) |
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493 | (2) |
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Rectifier/Power Supply and Clamp |
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495 | (2) |
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Digital Section and Modulation Stage |
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497 | (3) |
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An Archetypal First Organic RFID Tag |
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500 | (1) |
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Implications of Tag Architecture on Device Considerations |
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501 | (3) |
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Transistor Performance and Structural Implications |
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501 | (2) |
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503 | (1) |
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504 | (3) |
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504 | (3) |
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Section 6.2 Organic Transistor Chemical Sensors |
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507 | (22) |
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507 | (1) |
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Chemical Sensors: An Overview |
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508 | (3) |
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Organic Thin-Film Transistor Sensors |
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511 | (13) |
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511 | (1) |
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Multiparametric OTFT Sensors |
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512 | (3) |
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Interface-Dependent OTFT Responses |
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515 | (1) |
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Gate-Induced Response Repeatibility and Enhancement |
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516 | (5) |
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521 | (1) |
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Scaling Behavior of Sensing Responses |
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522 | (2) |
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524 | (5) |
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526 | (3) |
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Section 6.3 Flexible, Large-Area e-Skins |
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529 | (22) |
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529 | (1) |
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Flexible Pressure Sensors |
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530 | (3) |
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531 | (2) |
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533 | (1) |
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533 | (2) |
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535 | (5) |
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536 | (1) |
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537 | (3) |
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540 | (4) |
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540 | (1) |
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540 | (4) |
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544 | (1) |
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544 | (3) |
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Issues and Future Prospects |
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547 | (1) |
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548 | (3) |
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549 | (2) |
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Section 6.4 Organic Thin-Film Transistors for Flat-Panel Displays |
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551 | (44) |
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552 | (1) |
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552 | (1) |
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Organic Electronics for Displays |
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552 | (1) |
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Important Organic TFT Parameters for Display Applications |
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553 | (11) |
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553 | (2) |
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555 | (1) |
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556 | (2) |
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558 | (1) |
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559 | (1) |
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560 | (1) |
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Bias-Stress Instability and Hysteresis |
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561 | (2) |
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563 | (1) |
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564 | (1) |
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564 | (25) |
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Liquid-Crystal and Electrophoretic Displays |
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564 | (13) |
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564 | (3) |
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Electro-Optic Behavior of Twisted-Nematic Liquid Crystals |
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567 | (2) |
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Electro-Optic Behavior of Electrophoretic Materials |
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569 | (1) |
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Liquid-Crystal and Electrophoretic Display Architecture |
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570 | (7) |
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Active Matrix OLED Displays |
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577 | (12) |
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577 | (1) |
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Electro-Optic Behavior of Organic Light-Emitting Diodes |
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578 | (2) |
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OLED Display Architectures |
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580 | (9) |
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Using Organic TFTs for Integrated Drivers |
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589 | (2) |
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591 | (4) |
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591 | (4) |
Index |
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595 | |