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E-raamat: Protocol Conformance Testing Using Unique Input/output Sequences

(Motorola, Usa), (.), (Northeastern Univ, Usa), (.)
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This book deals with conformance testing for verification and validation of protocols for communication/distributed computer systems. The reader is introduced to this topic using the Finite State Machine (FSM) model together with a comprehensive review of past and current work. A detailed treatment of graph approaches for vector generation and fault coverage evaluation is presented using examples with real protocols.Qualitative and quantitative measures are introduced to quantify and compare these approaches, inclusive of the length of the generated test sequence and fault detection capabilities. Different techniques such as the Rural Chinese Postman Tour and compaction by test overlapping, are fully analyzed for achieving the desired figures of merit.Novel analytical frameworks such as the fault model and the test sequence generation, are proposed to facilitate a better understanding of the conformance testing process for the practicing engineer as well as an academic audience.
Preface v
I INTRODUCTION
1(16)
I.A Protocol Specification and Verification
1(2)
I.B State Transition Models
3(5)
I.C Other Models
8(5)
I.D Protocol Implementation
13(1)
I.E Conformance Testing
14(3)
II GRAPH THEORY
17(16)
II.A Graph Representations
17(5)
II.B Euler Tour
22(3)
II.C Maximum Flow
25(3)
II.D Maximum Bipartite Matching
28(5)
III PROTOCOL CONFORMANCE TESTING
33(26)
III.A Introduction
33(2)
III.B Finite State Machines and Protocol Conformance Testing
35(3)
III.C The Characterizing Sequence
38(5)
III.D The Test Subsequence
43(3)
III.E The Test Sequence
46(4)
III.F The Rural Chinese Postman Tour with the U-method
50(9)
IV CONFORMANCE TESTING USING MUIO SEQUENCES
59(30)
IV.A Using Multiple UIO Sequences to Decrease the Cost of the Test Sequence
60(1)
IV.B An Algorithm for Optimal UIO Assignment
61(10)
IV.C Simulation Results of the MUIO Approach
71(1)
IV.D Discussion on the Multiple UIO method
72(1)
IV.E The Weekly Connected Graph Problem
73(6)
IV.F Multiple UIO Tour Length Minimization
79(8)
IV.G Conclusions
87(2)
V GENERATION OF CHARACTERIZING SEQUENCE
89(20)
V.A Distinguishing Sequence and Distinguishing Tree
89(3)
V.B Test Generation Procedure for UIO Sequences
92(5)
V.C Accelerating UIO Generation
97(12)
VI IMPROVEMENT OF FAULT COVERAGE
109(44)
VI.A Estimation of Coverage
109(7)
VI.B Detection in Completely Specified FSMs
116(17)
VI.C Detection in Incompletely Specified FSMs
133(9)
VI.D Simulation Results
142(5)
VI.E Conclusions
147(6)
VII DISCRIMINATING CAPABILITY
153(16)
VII.A Discriminating Capabilities
153(3)
VII.B The Discriminating Test Subsequence
156(7)
VII.C The Test Algorithm
163(4)
VII.D Conclusions
167(2)
VIII DETECTION OF THE EXTRA STATE FAULT
169(12)
VIII.A The Extra-State Fault
169(4)
VIII.B Detection of the Extra-State Fault
173(1)
VIII.C The Test Algorithm
174(1)
VIII.D Multiple Extra-State Faults
175(2)
VIII.E Simulation Results
177(2)
VIII.F Conclusions
179(2)
IX CONFORMANCE TESTING BY ADAPTIVE UIOS
181(38)
IX.A Basic Principles of Adaptive UIO Sequences
181(9)
IX.B Fault Coverage of Adaptive UIO Sequences
190(2)
IX.C Conformance Testing Algorithm
192(9)
IX.D Fault Coverage of Conformance Testing
201(6)
IX.E Simulation Results
207(8)
IX.F Discussion
215(1)
IX.G Conclusions
216(3)
X DETECTABILITY OF TEST SEQUENCES
219(22)
X.A Fault Masking
219(3)
X.B Proposed Approach to Detectability
222(4)
X.C Improvement of Fault Coverage
226(5)
X.D A Detailed Example
231(4)
X.E Redundancy in the Test Sequence
235(3)
X.F Conclusions
238(3)
XI CONCLUSIONS
241(2)
REFERENCES 243
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