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E-raamat: Scanning Electron Microscope Optics And Spectrometers

(Nus, S'pore)
  • Formaat: 416 pages
  • Ilmumisaeg: 02-Nov-2010
  • Kirjastus: World Scientific Publishing Co Pte Ltd
  • Keel: eng
  • ISBN-13: 9789814469357
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  • Formaat: 416 pages
  • Ilmumisaeg: 02-Nov-2010
  • Kirjastus: World Scientific Publishing Co Pte Ltd
  • Keel: eng
  • ISBN-13: 9789814469357
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This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.
Preface vii
1 Conventional SEM Design
1(70)
1.1 Introduction to the SEM
2(7)
1.2 Basic principles of electron optics
9(10)
1.3 The electron gun
19(5)
1.4 Lens aberrations and primary beam probe size
24(12)
1.5 Deflection systems
36(6)
1.6 Quadrupole stigmators
42(6)
1.7 SEM output signals
48(3)
1.8 The emission hemisphere and BSE collection
51(2)
1.9 The scattered electron energy distribution
53(2)
1.10 The SE collection efficiency
55(4)
1.11 Specimen charging
59(2)
1.12 Elastic BSE imaging
61(3)
1.13 Selected SEM image examples
64(7)
2 Spectrometer Design Principles
71(64)
2.1 Figures of merit
72(4)
2.2 The SAM and the SEM
76(2)
2.3 The retarding field analyzer
78(5)
2.4 Deflection field analyzers
83(52)
2.4.1 The parallel plate analyzer
83(13)
2.4.2 The cylindrical mirror analyzer
96(5)
2.4.3 Electric sector analyzers
101(12)
2.4.4 Magnetic deflector analyzers
113(11)
2.4.5 Wien filters
124(7)
2.4.6 Magnetic collimation and time of flight spectrometers
131(4)
3 In-lens Improvements
135(50)
3.1 Magnetic immersion lenses
135(8)
3.2 Magnetic semi-in-lens designs
143(13)
3.3 Electric retarding field lenses
156(8)
3.4 Mixed field in-lens designs
164(12)
3.5 Selected in-lens image examples
176(9)
4 Sub-nanometer Probe Diameters
185(38)
4.1 Monochromators and immersion objective lenses
185(13)
4.2 Aberration correctors
198(20)
4.3 The helium ion microscope
218(5)
5 Secondary Electron Spectrometers
223(40)
5.1 Early deflection analyzers
223(3)
5.2 Retarding field analyzers
226(11)
5.3 Surface fields and signal-to-noise characteristics
237(7)
5.4 Deflection/multi-channel analyzers
244(19)
6 Full Range Deflector Spectrometer Designs
263(24)
6.1 First-order focusing toroidal analyzers
265(5)
6.2 A second-order focusing toroidal analyzer design
270(11)
6.3 A modified fountain analyzer design
281(6)
7 Full Range Parallel Energy Spectrometer Designs
287(32)
7.1 The time-of-flight spectrometer
290(3)
7.2 A Gaussian field magnetic sector
293(8)
7.3 A round magnetic beam separator
301(18)
8 Spectroscopic SEM Proposals
319(8)
Appendix 1.0 Field Expansions 327(10)
Appendix 1.1 Derivation of the Paraxial Equation 337(12)
Appendix 1.2 Spherical Aberration 349(16)
Appendix 1.3 Chromatic Aberration 365(10)
Appendix 2 Multipole Lenses 375(10)
Bibliography 385(14)
Index 399